A. Mercha
About
In The Last Decade
A. Mercha
188 papers receiving 3.3k citations
Peers
Comparison fields: 5 of 50
- Electrical and Electronic Engineering 3.4k
- Biomedical Engineering 485
- Atomic and Molecular Physics, and Optics 202
- Materials Chemistry 161
- Hardware and Architecture 111
Countries citing papers authored by A. Mercha
This map shows the geographic impact of A. Mercha's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Mercha with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Mercha more than expected).
Fields of papers citing papers by A. Mercha
This network shows the impact of papers produced by A. Mercha. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Mercha. The network helps show where A. Mercha may publish in the future.
Co-authorship network of co-authors of A. Mercha
This figure shows the co-authorship network connecting the top 25 collaborators of A. Mercha. A scholar is included among the top collaborators of A. Mercha based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. Mercha. A. Mercha is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 6 | |
| 3 | 40 | |
| 4 | Variability and technology aware SRAM Product yield maximization | 8 |
| 5 | Source-pull characterization of FinFET noise | 5 |
| 6 | 6 | |
| 7 | 99 | |
| 8 | 29 | |
| 9 | 78 | |
| 10 | 11 | |
| 11 | 1 | |
| 12 | 3 | |
| 13 | 3 | |
| 14 | 27 | |
| 15 | 27 | |
| 16 | 10 | |
| 17 | Degradation of deep submicron partially depleted soi CMOS transistors under MeV proton or gamma irradiation | 1 |
| 18 | Impact of irradiations performed at liquid helium temperatures on the operation of 0.7 /spl mu/m CMOS devices and read-out circuits | 1 |
| 19 | Radiation-induced back channel leakage in 60 MeV-proton-irradiated 0.10 /spl mu/m-CMOS partially depleted SOI MOSFETs | 6 |
| 20 | 28 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.