V. De Heyn
- Electrical and Electronic Engineering top 10%
- Biomedical Engineering
- Aerospace Engineering top 10%
- Atomic and Molecular Physics, and Optics
- Computer Networks and Communications
- Co-authors
- Julien RyckaertGeert Van der PlasClaude DessetBart van PouckePiet WambacqMustafa BadarogluJan CraninckxG. Groeseneken
- Topics
- Semiconductor materials and devices (18 papers)Radio Frequency Integrated Circuit Design (13 papers)Advancements in Semiconductor Devices and Circuit Design (13 papers)
- Journals
- IEEE Journal of Solid-State CircuitsIEEE Transactions on Electron DevicesIEEE Transactions on Circuits and Systems I Regular Papers
- Partner nations
- BelgiumNetherlandsItaly
In The Last Decade
V. De Heyn
31 papers receiving 627 citations
Peers
Comparison fields: 5 of 27
- Electrical and Electronic Engineering 637
- Biomedical Engineering 197
- Aerospace Engineering 126
- Atomic and Molecular Physics, and Optics 59
- Computer Networks and Communications 50
Countries citing papers authored by V. De Heyn
This map shows the geographic impact of V. De Heyn's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. De Heyn with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. De Heyn more than expected).
Fields of papers citing papers by V. De Heyn
This network shows the impact of papers produced by V. De Heyn. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. De Heyn. The network helps show where V. De Heyn may publish in the future.
Co-authorship network of co-authors of V. De Heyn
This figure shows the co-authorship network connecting the top 25 collaborators of V. De Heyn. A scholar is included among the top collaborators of V. De Heyn based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with V. De Heyn. V. De Heyn is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 4 | |
| 3 | 14 | |
| 4 | 1 | |
| 5 | 88 | |
| 6 | 57 | |
| 7 | 2 | |
| 8 | 41 | |
| 9 | 18 | |
| 10 | 3 | |
| 11 | 164 | |
| 12 | 12 | |
| 13 | 6 | |
| 14 | 24 | |
| 15 | 19 | |
| 16 | ESD reliability issues in RF CMOS circuits | 7 |
| 17 | 5 | |
| 18 | Effect of the n + sinker in self-triggering bipolar ESD protection structures | 4 |
| 19 | Contributions to standardization of Transmission Line Pulse testing methodology | 14 |
| 20 | Influence of device geometry on ESD performance for deep submicron CMOS technology | 1 |
About V. De Heyn
V. De Heyn is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering, having authored 31 papers that have together received 669 indexed citations. Recurring topics across this work include Semiconductor materials and devices (18 papers), Radio Frequency Integrated Circuit Design (13 papers) and Advancements in Semiconductor Devices and Circuit Design (13 papers). The work is most often cited by research in Electrical and Electronic Engineering (637 citations), Aerospace Engineering (126 citations) and Biomedical Engineering (197 citations). V. De Heyn has collaborated with scholars based in Belgium, Netherlands and Italy. Frequent co-authors include Julien Ryckaert, Geert Van der Plas, Claude Desset, Bart van Poucke, Piet Wambacq, Mustafa Badaroglu, Jan Craninckx, G. Groeseneken, S. Donnay and B. Gyselinckx. Their work appears in journals such as IEEE Journal of Solid-State Circuits, IEEE Transactions on Electron Devices and IEEE Transactions on Circuits and Systems I Regular Papers.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.