J. Franco
About
In The Last Decade
J. Franco
232 papers receiving 3.9k citations
Peers
Comparison fields: 5 of 46
- Electrical and Electronic Engineering 3.9k
- Materials Chemistry 347
- Atomic and Molecular Physics, and Optics 249
- Condensed Matter Physics 178
- Biomedical Engineering 166
Countries citing papers authored by J. Franco
This map shows the geographic impact of J. Franco's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Franco with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Franco more than expected).
Fields of papers citing papers by J. Franco
This network shows the impact of papers produced by J. Franco. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Franco. The network helps show where J. Franco may publish in the future.
Co-authorship network of co-authors of J. Franco
This figure shows the co-authorship network connecting the top 25 collaborators of J. Franco. A scholar is included among the top collaborators of J. Franco based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Franco. J. Franco is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 3 | |
| 3 | 1 | |
| 4 | 2 | |
| 5 | 18 | |
| 6 | 5 | |
| 7 | 1 | |
| 8 | 1 | |
| 9 | Low Temperature Atomic Hydrogen Treatment for Superior NBTI Reliability—Demonstration and Modeling across SiO 2 IL Thicknesses from 1.8 to 0.6 nm for I/O and Core Logic | 3 |
| 10 | 1 | |
| 11 | 0 | |
| 12 | 13 | |
| 13 | 20 | |
| 14 | 27 | |
| 15 | 20 | |
| 16 | 12 | |
| 17 | 75 | |
| 18 | Scaling of BTI reliability in presence of Time-zero Variability Pathfinding from planar FET to advanced 3-D FinFET nodes | 1 |
| 19 | Degradation of time dependent variability due to interface state generation | 41 |
| 20 | Toward a streamlined projection of small Device BTI lifetime distributions | 6 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.