S. Jenei
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- Radio Frequency Integrated Circuit Design 20
- Semiconductor materials and devices 15
- 3D IC and TSV technologies 8
- Electromagnetic Compatibility and Noise Suppression 8
- Electrostatic Discharge in Electronics 5
- Silicon Carbide Semiconductor Technologies 5
- Advancements in Semiconductor Devices and Circuit Design 3
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- Copper Interconnects and Reliability 4
- Co-authors
- Stefaan DecoutereBart NauwelaersWutthinan JeamsaksiriD. LintenS. DecoutereA. MerchaS. ThijsPiet Wambacq
- Journals
- IEEE Journal of Solid-State Circuits (3 papers)IEEE Electron Device Letters (2 papers)Microelectronics Reliability (1 paper)
- Partner nations
- BelgiumNetherlandsSweden
In The Last Decade
S. Jenei
25 papers receiving 454 citations
Peers
Comparison fields: 5 of 22
- Electrical and Electronic Engineering 468
- Condensed Matter Physics 34
- Biomedical Engineering 94
- Electronic, Optical and Magnetic Materials 28
- Atomic and Molecular Physics, and Optics 25
Countries citing papers authored by S. Jenei
This map shows the geographic impact of S. Jenei's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Jenei with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Jenei more than expected).
Fields of papers citing papers by S. Jenei
This network shows the impact of papers produced by S. Jenei. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Jenei. The network helps show where S. Jenei may publish in the future.
Co-authorship network
The 25 scholars most cited alongside S. Jenei, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2005 | 117 | |
| 2 | 2004 | 4 | |
| 3 | 2004 | 10 | |
| 4 | 2004 | 15 | |
| 5 | 2004 | 4 | |
| 6 | 2004 | 2 | |
| 7 | 2004 | 8 | |
| 8 | 2004 | 4 | |
| 9 | 2003 | 0 | |
| 10 | 2003 | 2 | |
| 11 | 2003 | 7 | |
| 12 | Modelling and extraction of RF performance parameters of CMOS Electrostatic Discharge protection devices | 2002 | 8 |
| 13 | 2002 | 41 | |
| 14 | 2002 | 5 | |
| 15 | 2002 | 15 | |
| 16 | 2002 | 10 | |
| 17 | 2002 | 99 | |
| 18 | 2002 | 9 | |
| 19 | 2001 | 17 | |
| 20 | 1997 | 4 |
About S. Jenei
S. Jenei is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Hardware and Architecture and Atomic and Molecular Physics, and Optics, having authored 28 papers that have together received 479 indexed citations. Recurring topics across this work include Radio Frequency Integrated Circuit Design (20 papers), Semiconductor materials and devices (15 papers), 3D IC and TSV technologies (8 papers), Electromagnetic Compatibility and Noise Suppression (8 papers), Electrostatic Discharge in Electronics (5 papers), Silicon Carbide Semiconductor Technologies (5 papers), Copper Interconnects and Reliability (4 papers) and Advancements in Semiconductor Devices and Circuit Design (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (468 citations), Condensed Matter Physics (34 citations), Biomedical Engineering (94 citations), Electronic, Optical and Magnetic Materials (28 citations) and Atomic and Molecular Physics, and Optics (25 citations). S. Jenei has collaborated with scholars based in Belgium, Netherlands and Sweden. Frequent co-authors include Stefaan Decoutere, Bart Nauwelaers, Wutthinan Jeamsaksiri, D. Linten, S. Decoutere, A. Mercha, S. Thijs, Piet Wambacq, S. Donnay and J. Ramos. Their work appears in journals such as IEEE Journal of Solid-State Circuits, IEEE Electron Device Letters, Microelectronics Reliability, COMPEL The International Journal for Computation and Mathematics in Electrical and Electronic Engineering and Journal de Physique IV (Proceedings).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.