B. Kaczer

13.7k total citations
541 papers, 10.3k citations indexed

About

B. Kaczer is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, B. Kaczer has authored 541 papers receiving a total of 10.3k indexed citations (citations by other indexed papers that have themselves been cited), including 530 papers in Electrical and Electronic Engineering, 75 papers in Materials Chemistry and 30 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in B. Kaczer's work include Semiconductor materials and devices (497 papers), Advancements in Semiconductor Devices and Circuit Design (414 papers) and Integrated Circuits and Semiconductor Failure Analysis (238 papers). B. Kaczer is often cited by papers focused on Semiconductor materials and devices (497 papers), Advancements in Semiconductor Devices and Circuit Design (414 papers) and Integrated Circuits and Semiconductor Failure Analysis (238 papers). B. Kaczer collaborates with scholars based in Belgium, Austria and United Kingdom. B. Kaczer's co-authors include G. Groeseneken, Tibor Grasser, R. Degraeve, J. Franco, Ph. Roussel, H. Reisinger, Wolfgang Goes, P.-J. Wagner, M. Toledano-Luque and Philippe Roussel and has published in prestigious journals such as Advanced Materials, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

B. Kaczer

531 papers receiving 10.0k citations

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author Last Decade Papers Cites
B. Kaczer 10.0k 1.2k 544 423 348 541 10.3k
Asen Asenov 6.0k 0.6× 750 0.6× 929 1.7× 408 1.0× 890 2.6× 418 6.6k
E. Nowak 5.5k 0.6× 922 0.8× 465 0.9× 452 1.1× 658 1.9× 176 5.8k
Vijay Narayanan 5.4k 0.5× 1.6k 1.3× 842 1.5× 696 1.6× 653 1.9× 232 6.3k
Chenming Hu 4.8k 0.5× 624 0.5× 441 0.8× 168 0.4× 797 2.3× 103 5.1k
Azad Naeemi 2.9k 0.3× 2.0k 1.6× 774 1.4× 131 0.3× 418 1.2× 206 3.8k
Paolo Pavan 3.5k 0.3× 682 0.6× 276 0.5× 160 0.4× 267 0.8× 217 3.9k
R. Degraeve 10.9k 1.1× 2.4k 1.9× 593 1.1× 315 0.7× 252 0.7× 441 11.2k
Toshiro Hiramoto 5.0k 0.5× 1.1k 0.9× 1.2k 2.2× 174 0.4× 837 2.4× 416 5.4k
Tetsuo Endoh 3.0k 0.3× 735 0.6× 1.5k 2.8× 360 0.9× 329 0.9× 325 3.9k
Tsu‐Jae King 6.0k 0.6× 1.1k 0.9× 931 1.7× 127 0.3× 1.1k 3.3× 151 6.3k

Countries citing papers authored by B. Kaczer

Since Specialization
Citations

This map shows the geographic impact of B. Kaczer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. Kaczer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. Kaczer more than expected).

Fields of papers citing papers by B. Kaczer

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by B. Kaczer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. Kaczer. The network helps show where B. Kaczer may publish in the future.

Co-authorship network of co-authors of B. Kaczer

This figure shows the co-authorship network connecting the top 25 collaborators of B. Kaczer. A scholar is included among the top collaborators of B. Kaczer based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with B. Kaczer. B. Kaczer is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Diaz-Fortuny, J., et al.. (2024). Demonstration of Chip Overclock Detection by Employing Tamper-Aware Odometer Technology. 4C.1–1. 2 indexed citations
2.
Diaz-Fortuny, J., et al.. (2024). An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage. Micromachines. 15(6). 769–769. 2 indexed citations
3.
Grill, Alexander, J. Diaz-Fortuny, E. Bury, et al.. (2023). A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays. 1–3. 8 indexed citations
4.
Beckers, Arnout, Alexander Grill, B. Kaczer, et al.. (2023). Physics-Based and Closed-Form Model for Cryo-CMOS Subthreshold Swing. IEEE Transactions on Nanotechnology. 22. 590–596. 9 indexed citations
5.
Waldhoer, Dominic, Christian Schleich, Alexander Grill, et al.. (2023). Comphy v3.0—A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices. Microelectronics Reliability. 146. 115004–115004. 18 indexed citations
6.
Slassi, Amine, Andrea Padovani, Francesco Tavanti, et al.. (2023). Device‐to‐Materials Pathway for Electron Traps Detection in Amorphous GeSe‐Based Selectors. Advanced Electronic Materials. 9(4). 13 indexed citations
7.
Buscemi, Fabrizio, Enrico Piccinini, Luca Vandelli, et al.. (2023). A HydroDynamic Model for Trap-Assisted Tunneling Conduction in Ovonic Devices. IEEE Transactions on Electron Devices. 70(4). 1808–1814. 7 indexed citations
8.
Brown, James, Rui Gao, Zhigang Ji, et al.. (2023). A Pragmatic Model to Predict Future Device Aging. IEEE Access. 11. 127725–127736. 1 indexed citations
9.
Diaz-Fortuny, J., et al.. (2022). Towards Complete Recovery of Circuit Degradation by Annealing With On-Chip Heaters. IEEE Electron Device Letters. 44(2). 201–204. 4 indexed citations
10.
Schleich, Christian, et al.. (2022). Single- Versus Multi-Step Trap Assisted Tunneling Currents—Part II: The Role of Polarons. IEEE Transactions on Electron Devices. 69(8). 4486–4493. 13 indexed citations
11.
Grill, Alexander, Dominic Waldhoer, Wolfgang Goes, et al.. (2021). Efficient Modeling of Charge Trapping at Cryogenic Temperatures—Part I: Theory. IEEE Transactions on Electron Devices. 68(12). 6365–6371. 12 indexed citations
12.
Grill, Alexander, Dominic Waldhoer, Wolfgang Goes, et al.. (2021). Efficient Modeling of Charge Trapping at Cryogenic Temperatures—Part II: Experimental. IEEE Transactions on Electron Devices. 68(12). 6372–6378. 8 indexed citations
13.
Stampfer, Bernhard, Marko Simicic, Pieter Weckx, et al.. (2020). Extraction of Statistical Gate Oxide Parameters From Large MOSFET Arrays. IEEE Transactions on Device and Materials Reliability. 20(2). 251–257. 2 indexed citations
14.
15.
16.
Mahapatra, Souvik, Kevin J. Chen, B. Kaczer, et al.. (2019). Special Issue on Reliability. IEEE Transactions on Electron Devices. 66(11). 4497–4503.
17.
Waltl, Michael, G. Rzepa, Alexander Grill, et al.. (2017). Superior NBTI in High-k SiGe Transistors–Part II: Theory. IEEE Transactions on Electron Devices. 64(5). 2099–2105. 13 indexed citations
18.
Duan, Meng, J. F. Zhang, Zhigang Ji, et al.. (2017). Key Issues and Solutions for Characterizing Hot Carrier Aging of Nanometer Scale nMOSFETs. IEEE Transactions on Electron Devices. 64(6). 2478–2484. 19 indexed citations
19.
Gao, Rui, Zhigang Ji, J. F. Zhang, et al.. (2017). NBTI-Generated Defects in Nanoscaled Devices: Fast Characterization Methodology and Modeling. IEEE Transactions on Electron Devices. 64(10). 4011–4017. 20 indexed citations
20.
Grasser, Tibor, K. Rott, H. Reisinger, et al.. (2014). A unified perspective of RTN and BTI. 4A.5.1–4A.5.7. 75 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by Asen Asenov Breakdown of academic impact, for papers by E. Nowak Breakdown of academic impact, for papers by Vijay Narayanan Breakdown of academic impact, for papers by Chenming Hu Breakdown of academic impact, for papers by Azad Naeemi Breakdown of academic impact, for papers by Paolo Pavan Breakdown of academic impact, for papers by R. Degraeve Breakdown of academic impact, for papers by Toshiro Hiramoto Breakdown of academic impact, for papers by Tetsuo Endoh Breakdown of academic impact, for papers by Tsu‐Jae King
Rankless by CCL
2026