Eddy Simoen

13.2k total citations
971 papers, 9.6k citations indexed

About

Eddy Simoen is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, Eddy Simoen has authored 971 papers receiving a total of 9.6k indexed citations (citations by other indexed papers that have themselves been cited), including 939 papers in Electrical and Electronic Engineering, 191 papers in Atomic and Molecular Physics, and Optics and 71 papers in Biomedical Engineering. Recurrent topics in Eddy Simoen's work include Semiconductor materials and devices (754 papers), Advancements in Semiconductor Devices and Circuit Design (665 papers) and Integrated Circuits and Semiconductor Failure Analysis (341 papers). Eddy Simoen is often cited by papers focused on Semiconductor materials and devices (754 papers), Advancements in Semiconductor Devices and Circuit Design (665 papers) and Integrated Circuits and Semiconductor Failure Analysis (341 papers). Eddy Simoen collaborates with scholars based in Belgium, Brazil and Japan. Eddy Simoen's co-authors include Cor Claeys, C. Claeys, Jan Vanhellemont, B. Dierickx, João Antônio Martino, Nadine Collaert, A. Mercha, P. Clauws, Brice De Jaeger and G. Groeseneken and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Physical Review B.

In The Last Decade

Eddy Simoen

913 papers receiving 9.2k citations

Peers

Countries citing papers authored by Eddy Simoen

Since Specialization

Citations

This map shows the geographic impact of Eddy Simoen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Eddy Simoen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Eddy Simoen more than expected).

Fields of papers citing papers by Eddy Simoen

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Eddy Simoen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Eddy Simoen. The network helps show where Eddy Simoen may publish in the future.

Co-authorship network of co-authors of Eddy Simoen

This figure shows the co-authorship network connecting the top 25 collaborators of Eddy Simoen. A scholar is included among the top collaborators of Eddy Simoen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Eddy Simoen. Eddy Simoen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Investigation into the impact of source-drain series resistance on electrical parameters of AlGaN/GaN high electron mobility transistors 2025 ·Solid-State Electronics ·(unknown), (unknown), Eddy Simoen, (unknown)	0
2	Effect of multiple conductions on basic parameters in linear and saturation regions for a MIS-HEMT from 450 K down to 200 K 2024 ·Journal of Integrated Circuits and Systems ·(unknown), João Antônio Martino, Eddy Simoen, Uthayasankaran Peralagu, Nadine Collaert, Paula Ghedini Der Agopian	0
3	(Invited) In-Depth DC and Low Frequency Noise Characterization of Nanosheet FETs at Room and Cryogenic Temperatures 2023 ·ECS Transactions ·B. Cretu, (unknown), A. Veloso, Eddy Simoen	1
4	MISHEMT intrinsic voltage gain under multiple channel output characteristics 2023 ·Semiconductor Science and Technology ·(unknown), (unknown), João Antônio Martino, Eddy Simoen, Uthayasankaran Peralagu, Nadine Collaert, Paula Ghedini Der Agopian	1
5	Mitigating Dark Current for High-Performance Near-Infrared Organic Photodiodes via Charge Blocking and Defect Passivation 2021 ·ACS Applied Materials & Interfaces ·Weitao Yang, Weiming Qiu, Epimitheas Georgitzikis, Eddy Simoen, (unknown), Jiwon Lee, Itai Lieberman, David Cheyns, Paweł E. Malinowski, Jan Genoe, Hongzheng Chen, Paul Heremans	78
6	Alleviation of Negative-Bias Temperature Instability in Si p-FinFETs With ALD W Gate-Filling Metal by Annealing Process Optimization 2021 ·IEEE Journal of the Electron Devices Society ·(unknown), Qianqian Liu, Hong Yang, Zhigang Ji, Hao Xu, Guilei Wang, Eddy Simoen, Haojie Jiang, Ying Luo, Zhenzhen Kong, (unknown), Jun Luo, Huaxiang Yin, Chao Zhao, Wenwu Wang	1
7	Current mirror designed with GAA nanosheet MOSFETs from room temperature to 200 °C 2021 ·Semiconductor Science and Technology ·(unknown), João Antônio Martino, Eddy Simoen, A. Veloso, Paula Ghedini Der Agopian	1
8	An Investigation of Field Reduction Effect on NBTI Parameter Characterization and Lifetime Prediction Using a Constant Field Stress Method 2020 ·IEEE Transactions on Device and Materials Reliability ·(unknown), (unknown), Zhigang Ji, Hong Yang, Hao Xu, Qianqian Liu, Eddy Simoen, Xiaolei Wang, Xueli Ma, Yongliang Li, Huaxiang Yin, Anyan Du, Chao Zhao, Wenwu Wang	3
9	Investigation of Defect Characteristics and Carrier Transport Mechanisms in GaN Layers With Different Carbon Doping Concentration 2020 ·IEEE Transactions on Electron Devices ·Hongyue Wang, Po-Chun Hsu, Ming Zhao, Eddy Simoen, A. Sibaja-Hernandez, Jinyan Wang	10
10	Insights Into the Effect of TiN Thickness Scaling on DC and AC NBTI Characteristics in Replacement Metal Gate pMOSFETs 2020 ·IEEE Transactions on Device and Materials Reliability ·(unknown), Qianqian Liu, Hong Yang, Zhigang Ji, Hao Xu, Bo Tang, Eddy Simoen, Haojie Jiang, Ying Luo, Xiaolei Wang, Xueli Ma, Yongliang Li, Jun Luo, Huaxiang Yin, Chao Zhao, Wenwu Wang	3
11	Characterization of defect states in Mg-doped GaN-on-Si p ⁺ n diodes using deep-level transient Fourier spectroscopy 2020 ·Semiconductor Science and Technology ·(unknown), Albert Minj, Laurence Méchin, Hongwei Liang, Karen Geens, Ming Zhao, Eddy Simoen, Bruno Guillet	0
12	Deep levels in metal–oxide–semiconductor capacitors fabricated on n-type In _0.53 Ga _0.47 As lattice matched to InP substrates 2019 ·Semiconductor Science and Technology ·Eddy Simoen, Po-Chun Hsu, A. Alian, Salim El Kazzi, (unknown)	2
13	Comparison between proton irradiated triple gate SOI TFETS and finfets from a TID point of view 2019 ·Semiconductor Science and Technology ·Paula Ghedini Der Agopian, (unknown), João Antônio Martino, R. Rooyackers, Eddy Simoen, Cor Claeys, Nadine Collaert	3
14	The impact of extended defects on the generation and recombination lifetime in n type In _.53 Ga _.47 As 2019 ·Journal of Physics D Applied Physics ·Po-Chun Hsu, Eddy Simoen, Clément Merckling, Geert Eneman, Yves Mols, (unknown), A. Alian, Nadine Collaert, Marc Heyns	2
15	Investigation of Preexisting and Generated Defects in Nonfilamentary a-Si/TiO₂ RRAM and Their Impacts on RTN Amplitude Distribution 2018 ·IEEE Transactions on Electron Devices ·(unknown), Zheng Chai, Wei Dong Zhang, J. F. Zhang, Zhigang Ji, B. Benbakhti, B. Govoreanu, Eddy Simoen, Ludovic Goux, Attilio Belmonte, R. Degraeve, Gouri Sankar Kar, M. Jurczak	9
16	Pulsed photo-ionization spectroscopy in carbon doped MOCVD GaN epi-layers on Si 2018 ·Semiconductor Science and Technology ·E. Gaubas, (unknown), J. Mickevičius, Julius Pavlov, (unknown), (unknown), Eddy Simoen, Ming Zhao	5
17	Study of recombination characteristics in MOCVD grown GaN epi-layers on Si 2017 ·Semiconductor Science and Technology ·E. Gaubas, (unknown), (unknown), T. Malinauskas, (unknown), S. Miasojedovas, J. Mickevičius, Julius Pavlov, (unknown), Eddy Simoen, Ming Zhao	6
18	Defect Aspects of Ge-on-Si Materials and Devices 2009 ·ECS Transactions ·Cor Claeys, Geert Eneman, Gang Wang, Laurent Souriau, Roger Loo, Eddy Simoen	3
19	Electrostatic discharge effects in Fully Depleted SOI MOSFETs with ultra-thin gate oxide and different strain-inducing techniques 2008 ·Research Padua Archive (University of Padua) ·Alessio Griffoni, Augusto Tazzoli, Simone Gerardin, Eddy Simoen, Cor Claeys, Gaudenzio Meneghesso	2
20	Degradation of deep submicron partially depleted soi CMOS transistors under MeV proton or gamma irradiation 2003 ·Eddy Simoen, Johannes Raff, A. Mercha, K. De Meyer, Cor Claeys, M. Kokkoris, E. Kossionides, (unknown), Ali Mohammadzadeh	1

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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