Rogier Baert

1.3k citations

39 papers · 779 indexed · h-index 14

Hardware and Architecture top 5%
Electrical and Electronic Engineering top 5%
- Semiconductor materials and devices 25
- Advancements in Semiconductor Devices and Circuit Design 13
- Low-power high-performance VLSI design 10
- Integrated Circuits and Semiconductor Failure Analysis 7
- Advancements in Photolithography Techniques 6
- 3D IC and TSV technologies 5
- VLSI and FPGA Design Techniques 4
Electronic, Optical and Magnetic Materials
- Copper Interconnects and Reliability 9
Computer Networks and Communications top 10%
Atomic and Molecular Physics, and Optics

Co-authors: Diederik Verkest Julien Ryckaert Doyoung Jang P. Schuddinck Dmitry Yakimets Ivan Ciofi D. Mocuta Pieter Weckx
Cited by: Hardware and Architecture Electrical and Electronic Engineering Electronic, Optical and Magnetic Materials
Journals: IEEE Transactions on Electron Devices (4 papers)IEEE Design and Test (1 paper)IEEE Micro (1 paper)
Partner nations: Belgium United States Germany

In The Last Decade

Rogier Baert

37 papers receiving 736 citations

Peers

Countries citing papers authored by Rogier Baert

Since Specialization

Citations

This map shows the geographic impact of Rogier Baert's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Rogier Baert with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Rogier Baert more than expected).

Fields of papers citing papers by Rogier Baert

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Rogier Baert. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Rogier Baert. The network helps show where Rogier Baert may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Rogier Baert, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Rogier Baert Line = papers co-authored together Rogier Baert links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology IEEE Design and Test ·W Boessenecker,Min‐Chun Hu,Rogier Baert,Bilal Chehab,Sam Ikehara,理中古賀,Jos Huisken,Kees Goossens,Erik Jan Marinissen	2023	0
2	3D-optimized SRAM Macro Design and Application to Memory-on-Logic 3D-IC at Advanced Nodes Dépôt institutionnel de l'Université libre de Bruxelles (Université Libre de Bruxelles) ·Δημήτριος Ματραλής,Pieter Weckx,Shairfe Muhammad Salahuddin,Shibel Al Subah,J. Knap,Geert Van der Plas,Michele Stucchi,Rogier Baert,Peter Debacker,H. Hiejima,Julien Ryckaert,Dragomir Milojevic,Eric Beyne	2020	25
3	Interconnect Design-Technology Co-Optimization for Sub-3nm Technology Nodes Rogier Baert,Ivan Ciofi,K. Bar-Yaacov,Odysseas Zografos,まや府川,Bilal Chehab,Doyoung Jang,A. Spessot,Julien Ryckaert,Zsolt Tökei	2020	3
4	Device-, Circuit- & Block-level evaluation of CFET in a 4 track library P. Schuddinck,Odysseas Zografos,Pieter Weckx,Prachand Man Pradhan,Santonu Sarkar,Yasser Sherazi,Rogier Baert,Doyoung Jang,Dmitry Yakimets,Anshul Gupta,Bertrand Parvais,Julien Ryckaert,Diederik Verkest,A. Mocuta	2019	53
5	Enabling Sub-5nm CMOS Technology Scaling Thinner and Taller! Julien Ryckaert,Иванов Сергеи Вячеславович,Pieter Weckx,Doyoung Jang,P. Schuddinck,Bilal Chehab,K. Bar-Yaacov,Santonu Sarkar,Cut Sarah Faradilla,Rogier Baert,Diederik Verkest	2019	65
6	System-Level Impact of Interconnect Line-Edge Roughness Rogier Baert,Ivan Ciofi,Ph. Roussel,E. Choi,Peter Debacker,Zs. Tôkei	2018	2
7	Efficient place and route enablement of 5-tracks standard-cells through EUV compatible N5 ruleset Dépôt institutionnel de l'Université libre de Bruxelles (Université Libre de Bruxelles) ·U.G.V.S.S. Kumara,Mladen Bereković,Peter Debacker,余颖,Dragomir Milojevic,Rogier Baert,Julien Ryckaert,誠工藤,Diederik Verkest,Praveen Raghavan,E. Choi	2018	1
8	Modeling of Via Resistance for Advanced Technology Nodes IEEE Transactions on Electron Devices ·Ivan Ciofi,Philippe Roussel,Castrillón Restrepo,Victor Moroz,Carmen Garrido,Rogier Baert,Kristof Croes,Judith Marian Evans,K. Vandersmissen,Weimin Gao,Philippe Matagne,Mustafa Badaroglu,Christopher J. Wilson,D. Mocuta,Zsolt Tökei	2017	50
9	Device circuit and technology co-optimisation for FinFET based 6T SRAM cells beyond N7 Lirias (KU Leuven) ·Mohit Gupta,Pieter Weckx,Stefan Cosemans,P. Schuddinck,Rogier Baert,Dmitry Yakimets,Doyoung Jang,Yasser Sherazi,Praveen Raghavan,A. Spessot,A. Mocuta,Wim Dehaene	2017	6
10	Extreme scaling enabled by 5 tracks cells: Holistic design-device co-optimization for FinFETs and lateral nanowires M. Garcia Bardon,Yasser Sherazi,P. Schuddinck,Doyoung Jang,Dmitry Yakimets,Peter Debacker,Rogier Baert,Hans Mertens,Mustafa Badaroglu,A. Mocuta,Naoto Horiguchi,D. Mocuta,Prasanth Raghavan,Julien Ryckaert,A. Spessot,Diederik Verkest,An Steegen	2016	53
11	Impact of Wire Geometry on Interconnect <italic>RC</italic> and Circuit Delay IEEE Transactions on Electron Devices ·Ivan Ciofi,Judith Marian Evans,Philippe Roussel,Rogier Baert,Godinho Silva,Kristof Croes,Mustafa Badaroglu,Christopher J. Wilson,Praveen Raghavan,A. Mercha,Diederik Verkest,G. Groeseneken,D. Mocuta,Aaron Thean	2016	94
12	Impact of DSA process variability on circuit performance Lirias (KU Leuven) ·Irma C. Corales,В.К. Захаров,Paulina Rincon Delgadillo,Michele Stucchi,Rogier Baert,Roel Gronheid,Julien Ryckaert,Geert Vandenberghe,Wim Dehaene	2016	1
13	Impact of interconnect multiple-patterning variability on SRAMs Design, Automation, and Test in Europe ·Irma C. Corales,Michele Stucchi,Praveen Raghavan,Julien Ryckaert,Zsolt Tökei,Diederik Verkest,Rogier Baert,Antoine Ginésy,Wim Dehaene	2015	3
14	System-Level Variation Analysis for Interconnection Networks at Sub-10-nm Technology Nodes Using Multiple Patterning Techniques IEEE Transactions on Electron Devices ·Chenyun Pan,Rogier Baert,Ivan Ciofi,Zsolt Tökei,Azad Naeemi	2015	7
15	Variability of quadruple-patterning interconnect processes Rogier Baert,Ivan Ciofi,Christopher J. Wilson,Shuichi Matsunari,J. Bömmels,Zsolt Tökei,Julien Ryckaert,Praveen Raghavan,A. Mercha,Diederik Verkest	2015	6
16	Circuit and process co-design with vertical gate-all-around nanowire FET technology to extend CMOS scaling for 5nm and beyond technologies VUBIR (Vrije Universiteit Brussel) ·Trong Huynh-Bao,Dmitry Yakimets,Julien Ryckaert,Ivan Ciofi,Rogier Baert,A. Veloso,Juergen Boemmels,Nadine Collaert,Ph. Roussel,S. Demuynck,Prasanth Raghavan,A. Mercha,Zs. Tôkei,Diederik Verkest,A. V-Y. Thean,Piet Wambacq	2014	33
17	Runtime scheduling for video decoding on heterogeneous architectures Shu-Ching Chang,Rogier Baert,J. Hoja G. Lentka,Maja D’Hondt,Ning Li,Roel Wuyts	2011	2
18	Exploring parallelizations of applications for MPSoC platforms using MPA Design, Automation, and Test in Europe ·Rogier Baert,Erik Brockmeyer,Sven Wuytack,Thomas J. Ashby	2009	12
19	MPA: Parallelizing an Application onto a Multicore Platform Made Easy IEEE Micro ·J.-Y. Mignolet,Rogier Baert,Thomas J. Ashby,Prabhat Avasare,MT Waters,Sue Chew	2009	24
20	Exploring parallelizations of applications for MPSoC platforms using MPA Rogier Baert,Erik Brockmeyer,Sven Wuytack,Thomas J. Ashby	2009	10

About Rogier Baert

Rogier Baert is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Computer Networks and Communications and Signal Processing, having authored 39 papers that have together received 779 indexed citations. Recurring topics across this work include Semiconductor materials and devices (25 papers), Advancements in Semiconductor Devices and Circuit Design (13 papers), Low-power high-performance VLSI design (10 papers), Copper Interconnects and Reliability (9 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Advancements in Photolithography Techniques (6 papers), 3D IC and TSV technologies (5 papers) and VLSI and FPGA Design Techniques (4 papers). The work is most often cited by research in Hardware and Architecture (116 citations), Electrical and Electronic Engineering (662 citations), Electronic, Optical and Magnetic Materials (133 citations), Computer Networks and Communications (79 citations) and Atomic and Molecular Physics, and Optics (67 citations). Rogier Baert has collaborated with scholars based in Belgium, United States and Germany. Frequent co-authors include Diederik Verkest, Julien Ryckaert, Doyoung Jang, P. Schuddinck, Dmitry Yakimets, Ivan Ciofi, D. Mocuta, Pieter Weckx, Bilal Chehab and Christopher J. Wilson. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Design and Test, IEEE Micro, International Journal of Digital Multimedia Broadcasting and VUBIR (Vrije Universiteit Brussel).

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