T. Y. Hoffmann

671 citations
32 papers · 339 · h-index 10

Impact in

    • Semiconductor materials and devices
    • Advancements in Semiconductor Devices and Circuit Design
    • Integrated Circuits and Semiconductor Failure Analysis
    • Ferroelectric and Negative Capacitance Devices
    • Silicon and Solar Cell Technologies
    • Low-power high-performance VLSI design
    • Advanced Memory and Neural Computing
    • Semiconductor materials and interfaces

Papers in

    • Semiconductor materials and devices 26
    • Advancements in Semiconductor Devices and Circuit Design 20
    • Integrated Circuits and Semiconductor Failure Analysis 13
    • Ferroelectric and Negative Capacitance Devices 6
    • Silicon and Solar Cell Technologies 5
    • Low-power high-performance VLSI design 3
    • Thin-Film Transistor Technologies 2
    • Copper Interconnects and Reliability 3

T. Y. Hoffmann

31 papers receiving 330 citations

Peers

T. Y. Hoffmann
Comparison fields: 5 of 22
  • Electrical and Electronic Engineering 318
  • Atomic and Molecular Physics, and Optics 47
  • Hardware and Architecture 6
  • Developmental Neuroscience 3
  • Biomedical Engineering 30
Replace R. Schreutelkamp with:
R. Schreutelkamp Belgium
B.-Y. Nguyen France
R. Gafiteanu United States
Sungjae Lee United States
P.A. McFarland United States
L. Vandroux France
S. Krishnan United States
M. Paoli France
Y.D. Chan United States
Md. Ahasan Habib Bangladesh
T. Y. Hoffmann relative to R. Schreutelkamp Belgium R. Schreutelkamp's profile →
Citations per field
00.5×
R. Schreutelkamp · 1×
Citations per year

Countries citing papers authored by T. Y. Hoffmann

Since Specialization
Citations

This map shows the geographic impact of T. Y. Hoffmann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. Y. Hoffmann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. Y. Hoffmann more than expected).

Fields of papers citing papers by T. Y. Hoffmann

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by T. Y. Hoffmann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. Y. Hoffmann. The network helps show where T. Y. Hoffmann may publish in the future.

Co-authors

The 25 scholars most cited alongside T. Y. Hoffmann, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with T. Y. Hoffmann Line = papers co-authored together T. Y. Hoffmann links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 32 papers — load more, or switch the sort, to bring in the rest.

#Work
1
From mean values to distributions of BTI lifetime of deeply scaled FETs through atomistic understanding of the degradation
201171
2 200942
3 201029
4 201024
5 200623
6 200718
7 201914
8 201013
9 201112
10 201110
11
Variability and technology aware SRAM Product yield maximization
20118
12 20088
13 20107
14 20127
15 20087
16 20116
17 20116
18 20105
19 20105
20 20114

About T. Y. Hoffmann

T. Y. Hoffmann is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Biomedical Engineering, Materials Chemistry and Surgery, having authored 32 papers that have together received 339 indexed citations. Recurring topics across this work include Semiconductor materials and devices (26 papers), Advancements in Semiconductor Devices and Circuit Design (20 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers), Ferroelectric and Negative Capacitance Devices (6 papers), Silicon and Solar Cell Technologies (5 papers), Low-power high-performance VLSI design (3 papers), Copper Interconnects and Reliability (3 papers) and Thin-Film Transistor Technologies (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (318 citations), Atomic and Molecular Physics, and Optics (47 citations), Hardware and Architecture (6 citations), Developmental Neuroscience (3 citations) and Biomedical Engineering (30 citations). T. Y. Hoffmann has collaborated with scholars based in Belgium, United States and Japan. Frequent co-authors include B. Kaczer, G. Groeseneken, J. Franco, Ph. Roussel, Tibor Grasser, M. Toledano-Luque, T. Kauerauf, S. Biesemans, K. De Meyer and R. Degraeve. Their work appears in journals such as IEEE Electron Device Letters, Solid-State Electronics, Polymers, IEEE Transactions on Very Large Scale Integration (VLSI) Systems and Electrochemical and Solid-State Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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