K. Mistry

6.3k total citations
56 papers, 2.3k citations indexed

About

K. Mistry is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, K. Mistry has authored 56 papers receiving a total of 2.3k indexed citations (citations by other indexed papers that have themselves been cited), including 54 papers in Electrical and Electronic Engineering, 6 papers in Biomedical Engineering and 3 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in K. Mistry's work include Advancements in Semiconductor Devices and Circuit Design (53 papers), Semiconductor materials and devices (52 papers) and Integrated Circuits and Semiconductor Failure Analysis (20 papers). K. Mistry is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (53 papers), Semiconductor materials and devices (52 papers) and Integrated Circuits and Semiconductor Failure Analysis (20 papers). K. Mistry collaborates with scholars based in United States, Belgium and France. K. Mistry's co-authors include B.S. Doyle, T. Ghani, M. Bohr, Scott E. Thompson, Barry M. Doyle, S. Tyagi, C. Auth, M Armstrong, A. Murthy and R. Chau and has published in prestigious journals such as Applied Physics Letters, IEEE Journal of Solid-State Circuits and IEEE Transactions on Electron Devices.

In The Last Decade

K. Mistry

54 papers receiving 2.1k citations

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author Last Decade Papers Cites
K. Mistry 2.2k 324 191 185 177 56 2.3k
O. Faynot 2.6k 1.2× 505 1.6× 177 0.9× 120 0.6× 204 1.2× 163 2.7k
A. Asenov 2.4k 1.1× 259 0.8× 333 1.7× 168 0.9× 123 0.7× 156 2.5k
Tomohisa Mizuno 2.1k 1.0× 608 1.9× 263 1.4× 66 0.4× 278 1.6× 126 2.2k
C.H. Diaz 2.1k 1.0× 332 1.0× 235 1.2× 83 0.4× 192 1.1× 109 2.2k
A. Mocuta 2.1k 1.0× 341 1.1× 244 1.3× 83 0.4× 214 1.2× 117 2.2k
M.D. Giles 1.5k 0.7× 312 1.0× 387 2.0× 86 0.5× 425 2.4× 68 1.8k
Digh Hisamoto 3.0k 1.4× 575 1.8× 297 1.6× 75 0.4× 366 2.1× 85 3.1k
A. Mercha 3.4k 1.6× 485 1.5× 202 1.1× 111 0.6× 161 0.9× 195 3.5k
A. Spessot 1.5k 0.7× 223 0.7× 153 0.8× 118 0.6× 159 0.9× 113 1.6k
G. Shahidi 1.9k 0.9× 294 0.9× 199 1.0× 111 0.6× 139 0.8× 104 2.0k

Countries citing papers authored by K. Mistry

Since Specialization
Citations

This map shows the geographic impact of K. Mistry's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Mistry with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Mistry more than expected).

Fields of papers citing papers by K. Mistry

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by K. Mistry. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Mistry. The network helps show where K. Mistry may publish in the future.

Co-authorship network of co-authors of K. Mistry

This figure shows the co-authorship network connecting the top 25 collaborators of K. Mistry. A scholar is included among the top collaborators of K. Mistry based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with K. Mistry. K. Mistry is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Mistry, K. & Georgios Dafoulas. (2025). IoT wearables in child health: A comprehensive scoping review and exploration of ubiquitous computing. Internet of Things. 31. 101556–101556. 3 indexed citations
2.
Dafoulas, Georgios, et al.. (2023). Hybrid Educational Environments – Using IoT to detect emotion changes during student interactions. Interaction design & architecture(s). 39–52.
3.
Pae, Sangwoo, T. Ghani, M. Hattendorf, et al.. (2009). Characterization of SILC and its end-of-life reliability assessment on 45NM high-K and metal-gate technology. 12. 499–504. 10 indexed citations
4.
5.
Thompson, Scott E., R. Chau, T. Ghani, et al.. (2005). In Search of “Forever,” Continued Transistor Scaling One New Material at a Time. IEEE Transactions on Semiconductor Manufacturing. 18(1). 26–36. 117 indexed citations
6.
Ghani, T., M Armstrong, C. Auth, et al.. (2004). A 90nm high volume manufacturing logic technology featuring novel 45nm gate length strained silicon CMOS transistors. 11.6.1–11.6.3. 378 indexed citations
7.
Rios, R., et al.. (2003). A three-transistor threshold voltage model for halo processes. 113–116. 34 indexed citations
8.
Sherony, M., et al.. (2002). Comparison of plasma-induced charging damage in bulk and SOI MOSFETs. 20–21. 1 indexed citations
9.
Mistry, K., et al.. (2002). Wafer Level Reliability application to manufacturing of high performance microprocessor. 77–81. 1 indexed citations
10.
Mistry, K., et al.. (2002). A 2.0 V, 0.35 μm partially depleted SOI-CMOS technology. 583–586. 12 indexed citations
11.
Keshavarzi, A., Shuo Ma, S. Narendra, et al.. (2001). Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICs. 207–212. 131 indexed citations
12.
Sleight, J.W. & K. Mistry. (1999). DC and transient characterization of a compact Schottky body contact technology for SOI transistors. IEEE Transactions on Electron Devices. 46(7). 1451–1456. 5 indexed citations
13.
Doyle, B.S., K. Mistry, & Cheng‐Liang Huang. (1995). Analysis of gate oxide thickness hot carrier effects in surface channel P-MOSFET's. IEEE Transactions on Electron Devices. 42(1). 116–122. 9 indexed citations
14.
Mistry, K., et al.. (1993). Circuit design guidelines for n-channel MOSFET hot carrier robustness. IEEE Transactions on Electron Devices. 40(7). 1284–1295. 37 indexed citations
15.
Doyle, B.S. & K. Mistry. (1993). The characterization of hot carrier damage in p-channel transistors. IEEE Transactions on Electron Devices. 40(1). 152–156. 22 indexed citations
16.
Mistry, K. & Barry M. Doyle. (1993). AC versus DC hot-carrier degradation in n-channel MOSFETs. IEEE Transactions on Electron Devices. 40(1). 96–104. 58 indexed citations
17.
18.
Mistry, K. & Barry M. Doyle. (1991). A model for AC hot-carrier degradation in n-channel MOSFETs. IEEE Electron Device Letters. 12(9). 492–494. 21 indexed citations
19.
Doyle, B.S. & K. Mistry. (1991). A lifetime prediction method for oxide electron trap damage created during hot-electron stressing of n-MOS transistors. IEEE Electron Device Letters. 12(4). 178–180. 11 indexed citations
20.
Doyle, B.S., K. Mistry, & G.J. Dunn. (1991). Reoxidized nitrided oxides (RNO) for latent ESD-resistant MOSFET dielectrics. IEEE Electron Device Letters. 12(4). 184–186. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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