S. Thijs

1.8k total citations
100 papers, 1.0k citations indexed

About

S. Thijs is a scholar working on Electrical and Electronic Engineering, Automotive Engineering and Materials Chemistry. According to data from OpenAlex, S. Thijs has authored 100 papers receiving a total of 1.0k indexed citations (citations by other indexed papers that have themselves been cited), including 97 papers in Electrical and Electronic Engineering, 4 papers in Automotive Engineering and 3 papers in Materials Chemistry. Recurrent topics in S. Thijs's work include Electrostatic Discharge in Electronics (79 papers), Semiconductor materials and devices (55 papers) and Advancements in Semiconductor Devices and Circuit Design (27 papers). S. Thijs is often cited by papers focused on Electrostatic Discharge in Electronics (79 papers), Semiconductor materials and devices (55 papers) and Advancements in Semiconductor Devices and Circuit Design (27 papers). S. Thijs collaborates with scholars based in Belgium, United States and France. S. Thijs's co-authors include D. Linten, G. Groeseneken, Piet Wambacq, Mirko Scholz, M. Natarajan, A. Mercha, S. Decoutere, Wutthinan Jeamsaksiri, Dimitri Linten and S. Jenei and has published in prestigious journals such as Macromolecules, IEEE Journal of Solid-State Circuits and IEEE Transactions on Electron Devices.

In The Last Decade

S. Thijs

95 papers receiving 994 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
S. Thijs Belgium 16 994 108 54 27 25 100 1.0k
Chang‐Lee Chen United States 9 428 0.4× 88 0.8× 73 1.4× 26 1.0× 15 0.6× 14 483
Johannes Sturm Austria 11 443 0.4× 101 0.9× 69 1.3× 10 0.4× 10 0.4× 60 495
Y. Watanabe Japan 13 557 0.6× 78 0.7× 25 0.5× 20 0.7× 9 0.4× 54 606
K. Hieda Japan 15 620 0.6× 142 1.3× 60 1.1× 10 0.4× 12 0.5× 60 681
Chun Wing Yeung United States 10 661 0.7× 92 0.9× 294 5.4× 8 0.3× 13 0.5× 13 772
Hongxia Guo China 13 610 0.6× 33 0.3× 166 3.1× 30 1.1× 72 2.9× 121 709
C. Guérin France 14 878 0.9× 42 0.4× 188 3.5× 9 0.3× 29 1.2× 33 926
Chris Bencher United States 10 361 0.4× 173 1.6× 168 3.1× 10 0.4× 42 1.7× 22 442
K. Tokashiki Japan 10 328 0.3× 40 0.4× 137 2.5× 8 0.3× 20 0.8× 31 370
Rupendra Kumar Sharma Czechia 14 539 0.5× 78 0.7× 57 1.1× 11 0.4× 89 3.6× 42 578

Countries citing papers authored by S. Thijs

Since Specialization
Citations

This map shows the geographic impact of S. Thijs's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Thijs with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Thijs more than expected).

Fields of papers citing papers by S. Thijs

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Thijs. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Thijs. The network helps show where S. Thijs may publish in the future.

Co-authorship network of co-authors of S. Thijs

This figure shows the co-authorship network connecting the top 25 collaborators of S. Thijs. A scholar is included among the top collaborators of S. Thijs based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. Thijs. S. Thijs is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Park, Jihoon, Vladimir Pejović, Epimitheas Georgitzikis, et al.. (2023). Investigation of the Global Shutter Operation of the Quantum-Dot Short-Wave Infrared Image Sensor. IEEE Transactions on Electron Devices. 70(6). 3155–3159. 2 indexed citations
3.
Thijs, S., et al.. (2023). Band Relevance Study of SWIR Hyperspectral Imaging for Material Recycling and Reuse. 1–5. 1 indexed citations
4.
Malinowski, Paweł E., Natarajan Chandrasekaran, Nikolaos G. Papadopoulos, et al.. (2023). B 5.3 - Augmented Vision Enabled by Imagers Based on PbS Quantum Dots. Lectures. 121–122. 1 indexed citations
5.
Malinowski, Paweł E., Jiwon Lee, Epimitheas Georgitzikis, et al.. (2022). Disruptive infrared image sensors enabled by quantum dots. Journal of the Society for Information Display. 31(4). 149–157. 2 indexed citations
6.
Chen, Shih‐Hung, Geert Hellings, S. Thijs, et al.. (2013). Exploring ESD challenges in sub-20-nm bulk FinFET CMOS technology nodes. Electrical Overstress/Electrostatic Discharge Symposium. 1–8. 8 indexed citations
7.
Chen, Shih‐Hung, S. Thijs, Dimitri Linten, et al.. (2012). ESD protection devices placed inside keep-out zone (KOZ) of through Silicon Via (TSV) in 3D stacked integrated circuits. Electrical Overstress/Electrostatic Discharge Symposium. 1–8. 12 indexed citations
8.
Scholz, Mirko, Andrei Shibkov, D. Linten, et al.. (2012). Mixed-mode simulations for power-on ESD analysis. VUBIR (Vrije Universiteit Brussel). 1–9. 5 indexed citations
9.
Hellings, Geert, Dimitri Linten, S. Thijs, et al.. (2012). ESD characterization of high mobility SiGe Quantum Well and Ge devices for future CMOS scaling. Electrical Overstress/Electrostatic Discharge Symposium. 1–6. 5 indexed citations
10.
Thijs, S., Alessio Griffoni, Dimitri Linten, et al.. (2011). On gated diodes for ESD protection in bulk FinFET CMOS technology. Electrical Overstress/Electrostatic Discharge Symposium. 1–8. 15 indexed citations
11.
Thijs, S., Mirko Scholz, Jeroen De Coster, et al.. (2011). A SCR-based ESD protection for MEMS — Merits and challenges. Electrical Overstress/Electrostatic Discharge Symposium. 1–10.
12.
Thijs, S., et al.. (2011). CDM protection for millimeter-wave circuits. Electrical Overstress/Electrostatic Discharge Symposium. 1–7. 3 indexed citations
13.
Limaye, Paresh, A. Mercha, Herman Oprins, et al.. (2010). Design issues and cosiderations for low-cost 3D TSV IC technology. Lirias (KU Leuven). 148–149. 6 indexed citations
14.
Linten, D., S. Thijs, Alessio Griffoni, et al.. (2010). HBM parameter extraction and Transient Safe Operating Area. Electrical Overstress/Electrostatic Discharge Symposium. 1–8. 2 indexed citations
15.
Coster, Jeroen De, P. Czarnecki, Dimitri Linten, et al.. (2010). Behavior of RF MEMS switches under ESD stress. Electrical Overstress/Electrostatic Discharge Symposium. 1–8. 5 indexed citations
16.
Thijs, S., Mirko Scholz, D. Linten, et al.. (2010). SCCF — System to component level correlation factor. Electrical Overstress/Electrostatic Discharge Symposium. 1–10. 12 indexed citations
17.
Coster, Jeroen De, D. Linten, Mirko Scholz, et al.. (2008). ESD reliability issues in microelectromechanical systems (MEMS): A case study on micromirrors. Electrical Overstress/Electrostatic Discharge Symposium. 249–257. 6 indexed citations
18.
19.
Thijs, S., M. Natarajan, Dimitri Linten, et al.. (2004). Implementation of Inductor Based ESD Protection for 5.5 GHz LNA in 90 nm RF CMOS - Concepts, Constraints and Solutions. VUBIR (Vrije Universiteit Brussel). 2 indexed citations
20.
Vassilev, V., S. Thijs, Paul Leroux, et al.. (2003). Co-design methodology to provide high ESD protection levels in the advanced RF circuits. Electrical Overstress/Electrostatic Discharge Symposium. 1–9. 8 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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