Geert Hellings
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- Semiconductor materials and devices 155
- Advancements in Semiconductor Devices and Circuit Design 131
- Integrated Circuits and Semiconductor Failure Analysis 59
- Electrostatic Discharge in Electronics 40
- Ferroelectric and Negative Capacitance Devices 24
- 3D IC and TSV technologies 14
- Silicon and Solar Cell Technologies 12
- Hardware and Architecture top 10%
- Biomedical Engineering top 10%
- Nanowire Synthesis and Applications 21
- Surfaces, Coatings and Films top 10%
- Co-authors
- Geert EnemanK. De MeyerJérôme MitardMarc MeurisBrice De JaegerD. LintenEddy SimoenDimitri Linten
- Journals
- IEEE Transactions on Electron Devices (17 papers)IEEE Electron Device Letters (6 papers)Microelectronics Reliability (5 papers)
- Partner nations
- BelgiumUnited StatesAustria
In The Last Decade
Geert Hellings
188 papers receiving 1.9k citations
Peers
Comparison fields: 5 of 54
- Electrical and Electronic Engineering 1.8k
- Hardware and Architecture 61
- Biomedical Engineering 394
- Atomic and Molecular Physics, and Optics 272
- Surfaces, Coatings and Films 43
Countries citing papers authored by Geert Hellings
This map shows the geographic impact of Geert Hellings's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Geert Hellings with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Geert Hellings more than expected).
Fields of papers citing papers by Geert Hellings
This network shows the impact of papers produced by Geert Hellings. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Geert Hellings. The network helps show where Geert Hellings may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Geert Hellings, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 3 | |
| 2 | 2024 | 0 | |
| 3 | 2024 | 2 | |
| 4 | 2024 | 5 | |
| 5 | 2023 | 9 | |
| 6 | 2023 | 2 | |
| 7 | 2023 | 8 | |
| 8 | 2022 | 18 | |
| 9 | 2021 | 16 | |
| 10 | 2020 | 8 | |
| 11 | 2020 | 10 | |
| 12 | 2019 | 9 | |
| 13 | Heated implantation with amorphous Carbon CMOS mask for scaled FinFETs | 2013 | 6 |
| 14 | Impact of the on-chip and off-chip ESD protection network on transient-induced latch-up in CMOS IC | 2013 | 5 |
| 15 | ESD performance of high mobility SiGe quantum well bulk finFET diodes and PMOS devices | 2013 | 4 |
| 16 | Exploring ESD challenges in sub-20-nm bulk FinFET CMOS technology nodes | 2013 | 8 |
| 17 | Miscorrelation between IEC61000-4-2 type of HMM tester and 50 Ω HMM tester | 2012 | 2 |
| 18 | ESD protection devices placed inside keep-out zone (KOZ) of through Silicon Via (TSV) in 3D stacked integrated circuits | 2012 | 12 |
| 19 | Scalability of quantum well devices for digital logic applications | 2009 | 2 |
| 20 | Impact of EOT scaling down to 0.85nm on 70nm Ge-pFETs technology with STI | 2006 | 35 |
About Geert Hellings
Geert Hellings is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Atomic and Molecular Physics, and Optics, having authored 204 papers that have together received 2.0k indexed citations. Recurring topics across this work include Semiconductor materials and devices (155 papers), Advancements in Semiconductor Devices and Circuit Design (131 papers), Integrated Circuits and Semiconductor Failure Analysis (59 papers), Electrostatic Discharge in Electronics (40 papers), Ferroelectric and Negative Capacitance Devices (24 papers), Nanowire Synthesis and Applications (21 papers), 3D IC and TSV technologies (14 papers) and Silicon and Solar Cell Technologies (12 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.8k citations), Hardware and Architecture (61 citations) and Biomedical Engineering (394 citations). Geert Hellings has collaborated with scholars based in Belgium, United States and Austria. Frequent co-authors include Geert Eneman, K. De Meyer, Jérôme Mitard, Marc Meuris, Brice De Jaeger, D. Linten, Eddy Simoen, Dimitri Linten, B. Kaczer and G. Groeseneken. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Electron Device Letters, Microelectronics Reliability, Solid-State Electronics and IEEE Transactions on Device and Materials Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.