C. Kerner
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- Semiconductor materials and devices 28
- Advancements in Semiconductor Devices and Circuit Design 24
- Integrated Circuits and Semiconductor Failure Analysis 14
- Silicon and Solar Cell Technologies 6
- Ferroelectric and Negative Capacitance Devices 5
- Silicon Carbide Semiconductor Technologies 3
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- Semiconductor materials and interfaces 3
- Magnetic properties of thin films 2
- Co-authors
- S. BiesemansThomas HoffmannT. ChiarellaP. AbsilC. OrtollandA. MerchaA. De KeersgieterLiesbeth Witters
- Cited by
- Electrical and Electronic EngineeringAtomic and Molecular Physics, and OpticsStructural Biology
- Journals
- IEEE Electron Device Letters (4 papers)Solid-State Electronics (2 papers)Microelectronic Engineering (1 paper)
- Partner nations
- BelgiumUnited StatesJapan
In The Last Decade
C. Kerner
32 papers receiving 346 citations
Peers
Comparison fields: 5 of 22
- Electrical and Electronic Engineering 347
- Atomic and Molecular Physics, and Optics 63
- Structural Biology 2
- Hardware and Architecture 7
- Biomedical Engineering 40
Countries citing papers authored by C. Kerner
This map shows the geographic impact of C. Kerner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Kerner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Kerner more than expected).
Fields of papers citing papers by C. Kerner
This network shows the impact of papers produced by C. Kerner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Kerner. The network helps show where C. Kerner may publish in the future.
Co-authorship network
The 25 scholars most cited alongside C. Kerner, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2011 | 1 | |
| 2 | 2010 | 99 | |
| 3 | 2009 | 29 | |
| 4 | 2009 | 11 | |
| 5 | 2009 | 20 | |
| 6 | 2009 | 23 | |
| 7 | 2009 | 4 | |
| 8 | 2009 | 5 | |
| 9 | Laser-annealed junctions with advanced CMOS gate stacks for 32nm node: perspectives on device performance and manufacturability | 2008 | 4 |
| 10 | 2008 | 1 | |
| 11 | 2008 | 8 | |
| 12 | 2007 | 1 | |
| 13 | 2007 | 7 | |
| 14 | Optimized ultra-low thermal budget process flow for advanced High-K / Metal gate first CMOS using laser-annealing technology | 2006 | 1 |
| 15 | 2006 | 1 | |
| 16 | 2006 | 4 | |
| 17 | 2006 | 0 | |
| 18 | 2006 | 1 | |
| 19 | 2006 | 16 | |
| 20 | 2005 | 2 |
About C. Kerner
C. Kerner is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Condensed Matter Physics, Biomedical Engineering and Materials Chemistry, having authored 33 papers that have together received 360 indexed citations. Recurring topics across this work include Semiconductor materials and devices (28 papers), Advancements in Semiconductor Devices and Circuit Design (24 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers), Silicon and Solar Cell Technologies (6 papers), Ferroelectric and Negative Capacitance Devices (5 papers), Semiconductor materials and interfaces (3 papers), Silicon Carbide Semiconductor Technologies (3 papers) and Magnetic properties of thin films (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (347 citations), Atomic and Molecular Physics, and Optics (63 citations), Structural Biology (2 citations), Hardware and Architecture (7 citations) and Biomedical Engineering (40 citations). C. Kerner has collaborated with scholars based in Belgium, United States and Japan. Frequent co-authors include S. Biesemans, Thomas Hoffmann, T. Chiarella, P. Absil, C. Ortolland, A. Mercha, A. De Keersgieter, Liesbeth Witters, A. Lauwers and Bertrand Parvais. Their work appears in journals such as IEEE Electron Device Letters, Solid-State Electronics, Microelectronic Engineering, Applied Physics Letters and Microelectronics Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.