D. Linten

3.3k total citations
173 papers, 2.5k citations indexed

About

D. Linten is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, D. Linten has authored 173 papers receiving a total of 2.5k indexed citations (citations by other indexed papers that have themselves been cited), including 171 papers in Electrical and Electronic Engineering, 8 papers in Atomic and Molecular Physics, and Optics and 7 papers in Biomedical Engineering. Recurrent topics in D. Linten's work include Semiconductor materials and devices (136 papers), Advancements in Semiconductor Devices and Circuit Design (87 papers) and Integrated Circuits and Semiconductor Failure Analysis (69 papers). D. Linten is often cited by papers focused on Semiconductor materials and devices (136 papers), Advancements in Semiconductor Devices and Circuit Design (87 papers) and Integrated Circuits and Semiconductor Failure Analysis (69 papers). D. Linten collaborates with scholars based in Belgium, United States and Austria. D. Linten's co-authors include G. Groeseneken, B. Kaczer, S. Thijs, Piet Wambacq, J. Franco, Mirko Scholz, Jonathan Borremans, Tibor Grasser, E. Bury and Geert Hellings and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Journal of Solid-State Circuits.

In The Last Decade

D. Linten

168 papers receiving 2.4k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
D. Linten Belgium 25 2.4k 260 180 107 103 173 2.5k
Ahmedullah Aziz United States 21 1.7k 0.7× 567 2.2× 96 0.5× 63 0.6× 180 1.7× 99 1.9k
Wen‐Kuan Yeh Taiwan 17 1.1k 0.5× 238 0.9× 125 0.7× 32 0.3× 56 0.5× 93 1.2k
P.K. Ko United States 27 3.2k 1.3× 183 0.7× 429 2.4× 160 1.5× 188 1.8× 89 3.3k
A. Mocuta Belgium 24 2.1k 0.9× 214 0.8× 341 1.9× 83 0.8× 244 2.4× 117 2.2k
Daewon Ha South Korea 19 1.6k 0.7× 414 1.6× 184 1.0× 48 0.4× 121 1.2× 86 1.7k
Joseph Shor Israel 19 1.1k 0.5× 395 1.5× 488 2.7× 218 2.0× 114 1.1× 61 1.3k
G. Shahidi United States 22 1.9k 0.8× 139 0.5× 294 1.6× 111 1.0× 199 1.9× 104 2.0k
A. Asenov United Kingdom 25 2.4k 1.0× 123 0.5× 259 1.4× 168 1.6× 333 3.2× 156 2.5k
Ph. Roussel Belgium 33 3.6k 1.5× 570 2.2× 176 1.0× 139 1.3× 223 2.2× 150 3.8k
R. Rodrı́guez Spain 24 2.1k 0.9× 150 0.6× 60 0.3× 132 1.2× 91 0.9× 165 2.1k

Countries citing papers authored by D. Linten

Since Specialization
Citations

This map shows the geographic impact of D. Linten's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Linten with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Linten more than expected).

Fields of papers citing papers by D. Linten

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. Linten. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Linten. The network helps show where D. Linten may publish in the future.

Co-authorship network of co-authors of D. Linten

This figure shows the co-authorship network connecting the top 25 collaborators of D. Linten. A scholar is included among the top collaborators of D. Linten based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D. Linten. D. Linten is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Franco, J., Jean‐François de Marneffe, A. Vandooren, et al.. (2021). Low Temperature Atomic Hydrogen Treatment for Superior NBTI Reliability—Demonstration and Modeling across SiO 2 IL Thicknesses from 1.8 to 0.6 nm for I/O and Core Logic. Symposium on VLSI Technology. 1–2. 3 indexed citations
2.
O’Sullivan, Barry, V. Putcha, V. V. Afanas’ev, et al.. (2020). Defect profiling in FEFET Si:HfO2 layers. Applied Physics Letters. 117(20). 25 indexed citations
3.
Fleetwood, Daniel M., Rong Jiang, Pan Wang, et al.. (2019). Low-frequency noise and defects in copper and ruthenium resistors. Applied Physics Letters. 114(20). 9 indexed citations
4.
Higashi, Y., Luca Piazza, Masato Suzuki, et al.. (2019). Impact of Charge trapping on Imprint and its Recovery in HfO 2 based FeFET. IEEE Conference Proceedings. 2019. 1–15. 12 indexed citations
5.
Wang, Pengfei, En Xia Zhang, Wenjun Liao, et al.. (2018). X-Ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices. IEEE Transactions on Nuclear Science. 65(8). 1519–1524. 13 indexed citations
6.
Franco, J., Subhadeep Mukhopadhyay, Pieter Weckx, et al.. (2016). Statistical model of the NBTI-induced threshold voltage, subthreshold swing, and transconductance degradations in advanced p-FinFETs. HAL (Le Centre pour la Communication Scientifique Directe). 15.3.1–15.3.4. 12 indexed citations
7.
Weckx, Pieter, B. Kaczer, Prasanth Raghavan, et al.. (2015). Characterization and simulation methodology for time-dependent variability in advanced technologies. 1–8. 9 indexed citations
8.
Degraeve, R., A. Fantini, Nagarajan Raghavan, et al.. (2015). Causes and consequences of the stochastic aspect of filamentary RRAM. Microelectronic Engineering. 147. 171–175. 110 indexed citations
9.
Bi, Jinshun, Zhengzhi Han, En Xia Zhang, et al.. (2013). The Impact of X-Ray and Proton Irradiation on ${\rm HfO}_2/{\rm Hf}$-Based Bipolar Resistive Memories. IEEE Transactions on Nuclear Science. 60(6). 4540–4546. 73 indexed citations
10.
Scholz, Mirko, Geert Hellings, D. Linten, et al.. (2012). Miscorrelation between IEC61000-4-2 type of HMM tester and 50 Ω HMM tester. Electrical Overstress/Electrostatic Discharge Symposium. 1–9. 2 indexed citations
11.
Scholz, Mirko, Andrei Shibkov, D. Linten, et al.. (2012). Mixed-mode simulations for power-on ESD analysis. VUBIR (Vrije Universiteit Brussel). 1–9. 5 indexed citations
12.
Limaye, Paresh, A. Mercha, Herman Oprins, et al.. (2010). Design issues and cosiderations for low-cost 3D TSV IC technology. Lirias (KU Leuven). 148–149. 6 indexed citations
13.
Linten, D., S. Thijs, Alessio Griffoni, et al.. (2010). HBM parameter extraction and Transient Safe Operating Area. Electrical Overstress/Electrostatic Discharge Symposium. 1–8. 2 indexed citations
14.
Thijs, S., Mirko Scholz, D. Linten, et al.. (2010). SCCF — System to component level correlation factor. Electrical Overstress/Electrostatic Discharge Symposium. 1–10. 12 indexed citations
15.
Coster, Jeroen De, D. Linten, Mirko Scholz, et al.. (2008). ESD reliability issues in microelectromechanical systems (MEMS): A case study on micromirrors. Electrical Overstress/Electrostatic Discharge Symposium. 249–257. 6 indexed citations
16.
Scholz, Mirko, et al.. (2007). Faster ESD device characterization with wafer-level HBM. 93–96. 7 indexed citations
17.
18.
Thijs, S., D. Linten, M. Natarajan, et al.. (2006). RF ESD protection strategies - the design and performance trade-off challenges. 484–491. 8 indexed citations
19.
Linten, D., S. Thijs, M. Natarajan, et al.. (2004). A 5 GHz fully integrated ESD-protected low-noise amplifier in 90 nm RF CMOS. 4. 291–294. 10 indexed citations
20.
Soens, Charlotte, Piet Wambacq, Gerd Vandersteen, et al.. (2003). RF performance degradation due to coupling of digital switching noise in lightly doped substrates. 127–132. 10 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by Ahmedullah Aziz Breakdown of academic impact, for papers by Wen‐Kuan Yeh Breakdown of academic impact, for papers by P.K. Ko Breakdown of academic impact, for papers by A. Mocuta Breakdown of academic impact, for papers by Daewon Ha Breakdown of academic impact, for papers by Joseph Shor Breakdown of academic impact, for papers by G. Shahidi Breakdown of academic impact, for papers by A. Asenov Breakdown of academic impact, for papers by Ph. Roussel Breakdown of academic impact, for papers by R. Rodrı́guez
Rankless by CCL
2026