Farid Sebaai

1.4k total citations
41 papers, 411 citations indexed

About

Farid Sebaai is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Farid Sebaai has authored 41 papers receiving a total of 411 indexed citations (citations by other indexed papers that have themselves been cited), including 39 papers in Electrical and Electronic Engineering, 11 papers in Biomedical Engineering and 3 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Farid Sebaai's work include Semiconductor materials and devices (31 papers), Advancements in Semiconductor Devices and Circuit Design (22 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). Farid Sebaai is often cited by papers focused on Semiconductor materials and devices (31 papers), Advancements in Semiconductor Devices and Circuit Design (22 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). Farid Sebaai collaborates with scholars based in Belgium, Japan and United States. Farid Sebaai's co-authors include A. Arreghini, Nadine Collaert, A. Subirats, Jan Van Houdt, Goedele Potoms, Luca Piazza, Patrick Ong, Karine Florent, S. R. C. McMitchell and M. Popovici and has published in prestigious journals such as IEEE Transactions on Electron Devices, Japanese Journal of Applied Physics and IEEE Electron Device Letters.

In The Last Decade

Farid Sebaai

36 papers receiving 395 citations

Peers

Countries citing papers authored by Farid Sebaai

Since Specialization

Citations

This map shows the geographic impact of Farid Sebaai's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Farid Sebaai with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Farid Sebaai more than expected).

Fields of papers citing papers by Farid Sebaai

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Farid Sebaai. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Farid Sebaai. The network helps show where Farid Sebaai may publish in the future.

Co-authorship network of co-authors of Farid Sebaai

This figure shows the co-authorship network connecting the top 25 collaborators of Farid Sebaai. A scholar is included among the top collaborators of Farid Sebaai based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Farid Sebaai. Farid Sebaai is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Extreme silicon thinning for back side power delivery network: Si thinning stopping on scaled SiGe etch stop layer 2024 ·Microelectronic Engineering ·Farid Sebaai, Roger Loo, (unknown), Eric Beyne, (unknown), (unknown), Efrain Altamirano Sánchez	0
2	Backside Power Delivery With Relaxed Overlay for Backside Patterning Using Extreme Wafer Thinning and Molybdenum-Filled Slit Nano Through Silicon Vias 2024 ·IEEE Transactions on Electron Devices ·Peng Zhao, Liesbeth Witters, Anne Jourdain, Michele Stucchi, N. Jourdan, Jan Willem Maes, (unknown), (unknown), (unknown), Farid Sebaai, K. Vandersmissen, N. Heylen, (unknown), (unknown), (unknown), Filip Schleicher, Joeri De Vos, Gerald Beyer, Andy Miller, Eric Beyne	2
3	SiGe Selective Etching to Enable Bottom and Middle Dielectric Isolations for Advanced Gate-All-Around FET Architecture 2023 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·(unknown), (unknown), (unknown), (unknown), Wen Liu, Jason Chen, (unknown), (unknown), Farid Sebaai, (unknown), (unknown), Efrain Altamirano Sánchez	2
4	First Demonstration of Ruthenium and Molybdenum Word lines Integrated into 40nm Pitch 3D-NAND Memory Devices 2021 ·Symposium on VLSI Technology ·(unknown), L. Breuil, (unknown), Filip Schleicher, Farid Sebaai, Yusuke Oniki, (unknown), A. Arreghini, Laura Nyns, Jean-Philippe Soulié, (unknown), G. Van den bosch, M. Rosmeulen	4
5	CMOS integration of high-k/metal gate transistors in diffusion and gate replacement (D&GR) scheme for dynamic random access memory peripheral circuits 2018 ·Japanese Journal of Applied Physics ·E. Dentoni Litta, R. Ritzenthaler, T. Schram, A. Spessot, Barry O’Sullivan, Vladimir Machkaoutsan, P. Fazan, (unknown), G. Mannaert, (unknown), Farid Sebaai, (unknown), Monique Ercken, S. Demuynck, Naoto Horiguchi	4
6	DTCO and TCAD for a 12 Layer-EUV Ultra-Scaled Surrounding Gate Transistor 6T-SRAM 2018 ·Philippe Matagne, Hiroaki Nakamura, (unknown), Yoshiaki Kikuchi, Trong Huynh-Bao, Zheng Tao, (unknown), K. Devriendt, Lars‐Åke Ragnarsson, Juergen Boemmels, A. Mallik, (unknown), Farid Sebaai, (unknown), N. Jourdan, Clément Porret, D. Mocuta, (unknown), F. Masuoka	3
7	SiGe vs. Si Selective Wet Etching for Si Gate-all-Around 2018 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·(unknown), Jens Rip, (unknown), Kurt Wostyn, Farid Sebaai, (unknown), Yi‐Chia Lee, (unknown), Hans Mertens, Andriy Hikavyy, Frank Holsteyns, Naoto Horiguchi	11
8	Selective Wet Etching in Fabricating SiGe and Ge Nanowires for Gate-all-Around MOSFETs 2018 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·(unknown), Yi‐Chia Lee, (unknown), (unknown), (unknown), Kurt Wostyn, Farid Sebaai, Frank Holsteyns	10
9	Cleaning of High Aspect Ratio STI Structures for Advanced Logic Devices by Implementation of a Surface Modification Drying Technique 2018 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·Farid Sebaai, Guy Vereecke, XiuMei Xu, S. Baudot, Fumihiro Amemiya, (unknown), Frank Holsteyns	4
10	Spin-on Metal Oxides and Their Applications for Next Generation Lithography 2016 ·Journal of Photopolymer Science and Technology ·(unknown), (unknown), (unknown), Douglas S. McKenzie, (unknown), (unknown), (unknown), Munirathna Padmanaban, (unknown), (unknown), G. Mannaert, T. Hopf, Danilo De Simone, (unknown), (unknown), Farid Sebaai, Efrain Altamirano Sánchez	6
11	Wet Selective SiGe Etch to Enable Ge Nanowire Formation 2016 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·Farid Sebaai, Liesbeth Witters, Frank Holsteyns, Kurt Wostyn, Jens Rip, (unknown), Ruben Lieten, S. Bilodeau, Emanuel I. Cooper	10
12	(Invited) Selective Etch of Si and SiGe for Gate All-Around Device Architecture 2015 ·ECS Transactions ·Kurt Wostyn, Farid Sebaai, Jens Rip, Hans Mertens, Liesbeth Witters, Roger Loo, Andriy Hikavyy, Alexey Milenin, Naoto Horiguchi, Nadine Collaert, Aaron Thean, Paul Mertens, Stefan De Gendt, Frank Holsteyns	19
13	Replacement fin processing for III–V on Si: From FinFets to nanowires 2015 ·Solid-State Electronics ·Niamh Waldron, Clément Merckling, Lieve Teugels, Patrick Ong, Farid Sebaai, Kathy Barla, Nadine Collaert, (unknown)	19
14	On the Fabrication of Backside Illuminated Image Sensors: Bonding Oxide, Edge Trimming and CMP Rework Routes 2015 ·ECS Transactions ·(unknown), Lan Peng, Farid Sebaai, (unknown), (unknown), J. Van Olmen, Deniz Sabuncuoglu Tezcan, (unknown)	9
15	Dissolution of Germanium in Sulfuric Acid Based Solutions 2015 ·ECS Transactions ·(unknown), Yuichi Ogawa, (unknown), (unknown), Kurt Wostyn, Farid Sebaai, Frank Holsteyns, Paul Mertens	5
16	Effect of Dissolved Oxygen for Advanced Wet Processing 2014 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·(unknown), (unknown), Hiroaki Takahashi, (unknown), Farid Sebaai, Frank Holsteyns, Paul Mertens, Masanobu Sato, (unknown), (unknown)	0
17	On the Fabrication of Backside Illuminated Image Sensors: Bonding Oxide, Edge Trimming and CMP Rework Routes 2014 ·ECS Meeting Abstracts ·(unknown), Lan Peng, Farid Sebaai, (unknown), (unknown), J. Van Olmen, Deniz Sabuncuoglu Tezcan, (unknown)	0
18	Wet Etching Behavior of Poly-Si in TMAH Solution 2012 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·Hiroaki Takahashi, (unknown), (unknown), Farid Sebaai, Kenichiro Arai, Masanobu Sato, (unknown)	5
19	Dummy Oxide Removal in High-K Last Process Integration how to Avoid Silicon Corrosion Issue 2012 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·Farid Sebaai, A. Veloso, Hiroaki Takahashi, Antoine Pacco, Martine Claes, Marc Schaekers, Stefan De Gendt, Paul Mertens, Herbert Struyf	1
20	Implementing cubic-phase HfO<inf>2</inf> with κ-value ∼ 30 in low-V<inf>T</inf> replacement gate pMOS devices for improved EOT-Scaling and reliability 2012 ·Lars‐Åke Ragnarsson, Christoph Adelmann, Yuichi Higuchi, Karl Opsomer, A. Veloso, Soon Aik Chew, E. Röhr, E. Vecchio, (unknown), K. Devriendt, Farid Sebaai, T. Kauerauf, Małgorzata Pawlak, T. Schram, Sven Van Elshocht, Naoto Horiguchi, Aaron Thean	9

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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