Jens Rip

610 citations

43 papers · 480 indexed · h-index 13

Impact in

Radiation top 5%
- X-ray Spectroscopy and Fluorescence Analysis
Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques

Papers in ⓘ

Surfaces, Coatings and Films 11
- Electron and X-Ray Spectroscopy Techniques 10
Radiation 8
- X-ray Spectroscopy and Fluorescence Analysis 7

Co-authors: Stefan De Gendt (20 shared papers)David Hellin (9 shared papers)Chris Vinckier (7 shared papers)Annelies Delabie (5 shared papers)Roger Loo (8 shared papers)Paul Mertens (8 shared papers)Sonja Sioncke (6 shared papers)Frank Holsteyns (10 shared papers)
Journals: Spectrochimica Acta Part B Atomic Spectroscopy (2 papers)ECS Journal of Solid State Science and Technology (2 papers)Journal of Analytical Atomic Spectrometry (2 papers)Micro and Nano Engineering (1 paper)Journal of Inorganic Biochemistry (1 paper)
Partner nations: Belgium Germany Netherlands

In The Last Decade

Jens Rip

41 papers receiving 461 citations

Peers

Countries citing papers authored by Jens Rip

Since Specialization

Citations

This map shows the geographic impact of Jens Rip's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jens Rip with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jens Rip more than expected).

Fields of papers citing papers by Jens Rip

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jens Rip. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jens Rip. The network helps show where Jens Rip may publish in the future.

Co-authors

The 25 scholars most cited alongside Jens Rip, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Jens Rip Line = papers co-authored together Jens Rip links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 43 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Reaction mechanisms for atomic layer deposition of aluminum oxide on semiconductor substrates Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·Annelies Delabie, Sonja Sioncke, Jens Rip, Sven Van Elshocht, Geoffrey Pourtois, Matthias Mueller, Burkhard Beckhoff, Kristine Pierloot	2011	55
2	Saturation effects in TXRF on micro-droplet residue samples Journal of Analytical Atomic Spectrometry ·David Hellin, Wim Fyen, Jens Rip, Tinne Delande, Paul Mertens, Stefan De Gendt, Chris Vinckier	2004	42
3	Thin epitaxial Si films as a passivation method for Ge(100): Influence of deposition temperature on Ge surface segregation and the high-k/Ge interface quality Materials Science in Semiconductor Processing ·Frederik Leys, Renaud Bonzom, B. Kaczer, Tom Janssens, Wilfried Vandervorst, Brice De Jaeger, Jan Van Steenbergen, Koen Martens, David Hellin, Jens Rip, Gabriela Dilliway, Annelies Delabie, Paul Zimmerman, Michel Houssa, Antoon Theuwis, Roger Loo, Marc Meuris, Matty Caymax, Marc Heyns	2006	41
4	Validation of vapor phase decomposition–droplet collection–total reflection X-ray fluorescence spectrometry for metallic contamination analysis of silicon wafers Spectrochimica Acta Part B Atomic Spectroscopy ·David Hellin, Jens Rip, Sophia Arnauts, Stefan De Gendt, P. Mertens, Chris Vinckier	2004	25
5	Smooth and high quality epitaxial strained Ge grown on SiGe strain relaxed buffers with 70–85% Ge Journal of Crystal Growth ·Roger Loo, Laurent Souriau, Patrick Ong, Karine Kenis, Jens Rip, P. Storck, Thomas Buschhardt, Martin Vorderwestner	2011	25
6	Metals in the active site of native protein phosphatase-1 Journal of Inorganic Biochemistry ·Ewald Heroes, Jens Rip, Monique Beullens, Luc Van Meervelt, Stefan De Gendt, Mathieu Bollen	2015	24
7	Chemical Vapor Deposition of Azidoalkylsilane Monolayer Films Langmuir ·Rita Vos, Cédric Rolin, Jens Rip, Thierry Conard, Tim Steylaerts, Maria Vidal Cabanilles, Karen Levrie, Karolien Jans, Tim Stakenborg	2017	21
8	Si passivation for Ge pMOSFETs: Impact of Si cap growth conditions Solid-State Electronics ·Benjamin Vincent, Roger Loo, W. Vandervorst, J. Delmotte, Bastien Douhard, Ventsislav K. Valev, Maarten Vanbel, Thierry Verbiest, Jens Rip, Bert Brijs, Thierry Conard, Chris Claypool, Shotaro Takeuchi, Shigeaki Zaima, Jérôme Mitard, Brice De Jaeger, J. Dekoster, Matty Caymax	2011	20
9	(Invited) Selective Etch of Si and SiGe for Gate All-Around Device Architecture ECS Transactions ·Kurt Wostyn, Farid Sebaai, Jens Rip, Hans Mertens, Liesbeth Witters, Roger Loo, Andriy Hikavyy, Alexey Milenin, Naoto Horiguchi, Nadine Collaert, Aaron Thean, Paul Mertens, Stefan De Gendt, Frank Holsteyns	2015	19
10	Remediation for TXRF saturation effects on microdroplet residues from preconcentration methods on semiconductor wafers Journal of Analytical Atomic Spectrometry ·David Hellin, Jens Rip, V. Geens, Tinne Delande, Thierry Conard, Stefan De Gendt, C. Vinckier	2005	19
11	Nanoscale Etching of In_0.53Ga_0.47As in H₂O₂/HCl Solutions for Advanced CMOS Processing ECS Journal of Solid State Science and Technology ·Dennis H. van Dorp, Sophia Arnauts, Daniel Cuypers, Jens Rip, Frank Holsteyns, Stefan De Gendt, J. J. Kelly	2014	16
12	S-passivation of the Ge gate stack: Tuning the gate stack properties by changing the atomic layer deposition oxidant precursor Journal of Applied Physics ·Sonja Sioncke, Hang-Chun Lin, Laura Nyns, Guy Brammertz, Annelies Delabie, Thierry Conard, Alexis Franquet, Jens Rip, Herbert Struyf, Stefan De Gendt, Matthias Müller, Burkhard Beckhoff, Matty Caymax	2011	16
13	Epitaxy solutions for Ge MOS technology Thin Solid Films ·Frederik Leys, Renaud Bonzom, Roger Loo, Olivier Richard, Brice De Jaeger, Jan Van Steenbergen, Kristof Dessein, Thierry Conard, Jens Rip, H. Bender, W. Vandervorst, Marc Meuris, Matty Caymax	2005	16
14	Assessing stability of metal tellurides as alternative photomask materials for extreme ultraviolet lithography Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ·Vu Luong, Vicky Philipsen, Karl Opsomer, Jens Rip, Eric Hendrickx, Marc Heyns, Christophe Detavernier, Christian Laubis, Frank Scholze	2019	12
15	Mask absorber development to enable next-generation EUVL Ghent University Academic Bibliography (Ghent University) ·Vicky Philipsen, Vu Luong, Karl Opsomer, Laurent Souriau, Jens Rip, Christophe Detavernier, Andreas Erdmann, Peter Evanschitzky, Christian Laubis, Philipp Hönicke, Victor Soltwisch, Eric Hendrickx	2019	12
16	SiGe vs. Si Selective Wet Etching for Si Gate-all-Around Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·Kana Komori, Jens Rip, Yukifumi Yoshida, Kurt Wostyn, Farid Sebaai, Wen Dar Liu, Yi‐Chia Lee, Ryo Sekiguchi, Hans Mertens, Andriy Hikavyy, Frank Holsteyns, Naoto Horiguchi	2018	11
17	Etching of III-V Materials Determined by ICP-MS with Sub-Nanometer Precision ECS Journal of Solid State Science and Technology ·Jens Rip, Daniel Cuypers, Sophia Arnauts, Frank Holsteyns, Dennis H. van Dorp, Stefan De Gendt	2013	11
18	Wet Selective SiGe Etch to Enable Ge Nanowire Formation Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·Farid Sebaai, Liesbeth Witters, Frank Holsteyns, Kurt Wostyn, Jens Rip, Yukifumi Yoshida, Ruben Lieten, S. Bilodeau, Emanuel I. Cooper	2016	10
19	50 nm Gate Length FinFET Biosensor & the Outlook for Single-Molecule Detection Lirias (KU Leuven) ·Sybren Santermans, D. Barge, Geert Hellings, Carlos Augusto Bergfeld Mori, K.J. Migacz, Jens Rip, Valentina Spampinato, Rita Vos, Bert Du Bois, A. Chaudhuri, João Antônio Martino, Marc Heyns, S. Severi, W. Van Roy, Koen Martens	2020	8
20	Mechanisms for the Trimethylaluminum Reaction in Aluminum Oxide Atomic Layer Deposition on Sulfur Passivated Germanium The Journal of Physical Chemistry C ·Annelies Delabie, Sonja Sioncke, Jens Rip, Sven Van Elshocht, Matty Caymax, Geoffrey Pourtois, Kristine Pierloot	2011	8

About Jens Rip

Jens Rip is a scholar working on Surfaces, Coatings and Films, Radiation, Electrical and Electronic Engineering, General Materials Science and Materials Chemistry, having authored 43 papers that have together received 480 indexed citations. Recurring topics across this work include Semiconductor materials and devices (24 papers), Electron and X-Ray Spectroscopy Techniques (10 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers), X-ray Spectroscopy and Fluorescence Analysis (7 papers), Nanowire Synthesis and Applications (6 papers), Silicon Nanostructures and Photoluminescence (5 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Semiconductor materials and interfaces (5 papers). The work is most often cited by research in Radiation (101 citations), Surfaces, Coatings and Films (71 citations), Electrical and Electronic Engineering (350 citations), Biomedical Engineering (138 citations) and Materials Chemistry (130 citations). Jens Rip has collaborated with scholars based in Belgium, Germany and Netherlands. Frequent co-authors include Stefan De Gendt, David Hellin, Chris Vinckier, Annelies Delabie, Roger Loo, Paul Mertens, Sonja Sioncke, Frank Holsteyns, Sophia Arnauts and Thierry Conard. Their work appears in journals such as Spectrochimica Acta Part B Atomic Spectroscopy, ECS Journal of Solid State Science and Technology, Journal of Analytical Atomic Spectrometry, Micro and Nano Engineering and Journal of Inorganic Biochemistry.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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