Jens Rip

610 total citations
43 papers, 480 citations indexed

About

Jens Rip is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Surfaces, Coatings and Films. According to data from OpenAlex, Jens Rip has authored 43 papers receiving a total of 480 indexed citations (citations by other indexed papers that have themselves been cited), including 35 papers in Electrical and Electronic Engineering, 13 papers in Materials Chemistry and 11 papers in Surfaces, Coatings and Films. Recurrent topics in Jens Rip's work include Semiconductor materials and devices (24 papers), Electron and X-Ray Spectroscopy Techniques (10 papers) and Advancements in Semiconductor Devices and Circuit Design (10 papers). Jens Rip is often cited by papers focused on Semiconductor materials and devices (24 papers), Electron and X-Ray Spectroscopy Techniques (10 papers) and Advancements in Semiconductor Devices and Circuit Design (10 papers). Jens Rip collaborates with scholars based in Belgium, Germany and Netherlands. Jens Rip's co-authors include Stefan De Gendt, David Hellin, Chris Vinckier, Annelies Delabie, Roger Loo, Sonja Sioncke, Paul Mertens, Sophia Arnauts, Thierry Conard and Frank Holsteyns and has published in prestigious journals such as Journal of Applied Physics, Langmuir and The Journal of Physical Chemistry C.

In The Last Decade

Jens Rip

41 papers receiving 461 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Jens Rip Belgium	13	350	138	130	101	71	43	480
A. G. Nassiopoulos Greece	14	329 0.9×	280 2.0×	291 2.2×	58 0.6×	107 1.5×	37	572
Norikuni Yabumoto Japan	12	341 1.0×	74 0.5×	147 1.1×	9 0.1×	23 0.3×	31	423
M. L. Thomas United States	9	283 0.8×	86 0.6×	87 0.7×	15 0.1×	55 0.8×	16	370
M.M. El-Gomati United Kingdom	10	224 0.6×	61 0.4×	79 0.6×	24 0.2×	183 2.6×	45	360
D. Lipinsky Germany	14	102 0.3×	54 0.4×	100 0.8×	31 0.3×	32 0.5×	33	429
Mika Pflüger Germany	10	83 0.2×	62 0.4×	121 0.9×	43 0.4×	55 0.8×	19	236
Alvarado Tarun Japan	12	185 0.5×	297 2.2×	122 0.9×	8 0.1×	14 0.2×	30	443
Shigeyuki Morishita Japan	12	96 0.3×	50 0.4×	94 0.7×	97 1.0×	172 2.4×	32	388
Tingyun Wang China	16	446 1.3×	120 0.9×	175 1.3×	57 0.6×	2 0.0×	55	638
Riccardo Mazzocco United Kingdom	7	144 0.4×	50 0.4×	127 1.0×	90 0.9×	12 0.2×	8	259

Countries citing papers authored by Jens Rip

Since Specialization

Citations

This map shows the geographic impact of Jens Rip's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jens Rip with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jens Rip more than expected).

Fields of papers citing papers by Jens Rip

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jens Rip. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jens Rip. The network helps show where Jens Rip may publish in the future.

Co-authorship network of co-authors of Jens Rip

This figure shows the co-authorship network connecting the top 25 collaborators of Jens Rip. A scholar is included among the top collaborators of Jens Rip based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jens Rip. Jens Rip is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Rip, Jens, et al.. (2024). Wet Cu passivation for high throughput fluxless Thermal Compression Bonding of Cu-Sn μbumps for Die-to-Wafer stacking. 1859–1862.

Pacco, Antoine, et al.. (2022). Wet Chemical Recess Etching of Ge₂Sb₂Te₅ for 3D PCRAM Memory Applications. ECS Transactions. 108(4). 175–183. 1 indexed citations

Pacco, Antoine, Zheng Tao, Jens Rip, et al.. (2019). Scaled-Down c-Si and c-SiGe Wagon-Wheels for the Visualization of the Anisotropy and Selectivity of Wet-Chemical Etchants. Nanoscale Research Letters. 14(1). 285–285. 3 indexed citations

Rip, Jens, Kurt Wostyn, Farid Sebaai, et al.. (2018). SiGe vs. Si Selective Wet Etching for Si Gate-all-Around. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 282. 107–112. 11 indexed citations

Sebaai, Farid, Liesbeth Witters, Frank Holsteyns, et al.. (2016). Wet Selective SiGe Etch to Enable Ge Nanowire Formation. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 255. 3–7. 10 indexed citations

Heroes, Ewald, Jens Rip, Monique Beullens, et al.. (2015). Metals in the active site of native protein phosphatase-1. Journal of Inorganic Biochemistry. 149. 1–5. 24 indexed citations

Wostyn, Kurt, Farid Sebaai, Jens Rip, et al.. (2015). (Invited) Selective Etch of Si and SiGe for Gate All-Around Device Architecture. ECS Transactions. 69(8). 147–152. 19 indexed citations

Wostyn, Kurt, Farid Sebaai, Jens Rip, et al.. (2015). Selective etch of Si and SiGe for gate-all-around device architecture. 147–152. 5 indexed citations

Dorp, Dennis H. van, et al.. (2014). Nanoscale Etching and Reoxidation of InAs. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 219. 56–58. 3 indexed citations

10.

Dorp, Dennis H. van, Sophia Arnauts, Jens Rip, et al.. (2014). Nanoscale Etching of In_0.53Ga_0.47As in H₂O₂/HCl Solutions for Advanced CMOS Processing. ECS Journal of Solid State Science and Technology. 3(6). P179–P184. 16 indexed citations

11.

Rip, Jens, et al.. (2012). Methodology for Measuring Trace Metal Surface Contamination on Pv Silicon Substrates. Energy Procedia. 27. 154–159. 5 indexed citations

12.

Delabie, Annelies, Sonja Sioncke, Jens Rip, et al.. (2011). (Invited) Aluminium Oxide Atomic Layer Deposition on Semiconductor Substrates. ECS Transactions. 41(3). 149–160. 1 indexed citations

13.

Vos, Rita, et al.. (2010). Biocompatibility assessment of advanced wafer-level based chip encapsulation. Ghent University Academic Bibliography (Ghent University). 1–4. 7 indexed citations

14.

Rip, Jens, et al.. (2010). Cesium retention during sputtering with low energy Cs ⁺ and oxygen flooding. Surface and Interface Analysis. 43(1-2). 225–227. 7 indexed citations

15.

Hellin, David, et al.. (2007). Investigation of Metallic Contamination Analysis Using Vapor Phase Decomposition – Droplet Collection – Total Reflection X-Ray Fluorescence (VPD-DC-TXRF) for Pt-Group Elements on Silicon Wafers. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 134. 273–276. 2 indexed citations

16.

Hellin, David, Jens Rip, Daniël Nelis, et al.. (2006). How Trace Analytical Techniques Contribute to the Research and Development of Ge and III/V Semiconductor Devices. ECS Transactions. 3(7). 173–181. 4 indexed citations

17.

Hellin, David, Stefan De Gendt, Jens Rip, & Chris Vinckier. (2005). Total reflection X-ray fluorescence spectrometry for the introduction of novel materials in clean-room production environments. IEEE Transactions on Device and Materials Reliability. 5(4). 639–651. 7 indexed citations

18.

Hellin, David, Ivo Teerlinck, Jan Van Steenbergen, et al.. (2005). Vapor phase decomposition–droplet collection–total reflection X-ray fluorescence spectrometry for metallic contamination analysis on Ge wafers. Spectrochimica Acta Part B Atomic Spectroscopy. 60(2). 209–213. 7 indexed citations

19.

Hellin, David, et al.. (2005). Remediation for TXRF saturation effects on microdroplet residues from preconcentration methods on semiconductor wafers. Journal of Analytical Atomic Spectrometry. 20(7). 652–652. 19 indexed citations

20.

Hellin, David, Jens Rip, Sophia Arnauts, et al.. (2004). Validation of vapor phase decomposition–droplet collection–total reflection X-ray fluorescence spectrometry for metallic contamination analysis of silicon wafers. Spectrochimica Acta Part B Atomic Spectroscopy. 59(8). 1149–1157. 25 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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