N. Heylen

1.7k citations
59 papers · 917 · h-index 16

Impact in

Papers in

N. Heylen

56 papers receiving 883 citations

Peers

N. Heylen
Comparison fields: 5 of 40
  • Electronic, Optical and Magnetic Materials 333
  • Electrical and Electronic Engineering 823
  • Automotive Engineering 53
  • Polymers and Plastics 53
  • Atomic and Molecular Physics, and Optics 112
Replace Takayuki Ohba with:
Takayuki Ohba Japan
S. Lhostis France
Akitsu Shigetou Japan
L.P. Buchwalter United States
Tai‐Hong Chen Taiwan
Hsuan‐Ling Kao Taiwan
Nobutoshi Fujii Japan
Jae‐Hoon Lee South Korea
M. Fayolle France
Yue Gu China
N. Heylen relative to Takayuki Ohba Japan Takayuki Ohba's profile →
Citations per field
00.5×3.3×
Takayuki Ohba · 1×
Citations per year

Countries citing papers authored by N. Heylen

Since Specialization
Citations

This map shows the geographic impact of N. Heylen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. Heylen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. Heylen more than expected).

Fields of papers citing papers by N. Heylen

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by N. Heylen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. Heylen. The network helps show where N. Heylen may publish in the future.

Co-authors

The 25 scholars most cited alongside N. Heylen, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with N. Heylen Line = papers co-authored together N. Heylen links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 59 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2017108
2 202075
3 201372
4 200871
5 201649
6 201646
7 200546
8 201844
9 201143
10 201431
11 201228
12 201328
13 201525
14 201623
15 201619
16 199919
17 201214
18 201013
19 201512
20 200012

About N. Heylen

N. Heylen is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Biomedical Engineering, Mechanics of Materials and Materials Chemistry, having authored 59 papers that have together received 917 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (32 papers), Semiconductor materials and devices (29 papers), 3D IC and TSV technologies (19 papers), Electronic Packaging and Soldering Technologies (18 papers), Advanced Surface Polishing Techniques (10 papers), Metal and Thin Film Mechanics (8 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers) and Electrodeposition and Electroless Coatings (5 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (333 citations), Electrical and Electronic Engineering (823 citations), Automotive Engineering (53 citations), Polymers and Plastics (53 citations) and Atomic and Molecular Physics, and Optics (112 citations). N. Heylen has collaborated with scholars based in Belgium, United States and Japan. Frequent co-authors include Gerald Beyer, Eric Beyne, Andy Miller, Soon-Wook Kim, Zsolt Tökei, Dimitrios Velenis, Karen Maex, Lan Peng, Mikhaı̈l R. Baklanov and Attilio Belmonte. Their work appears in journals such as Japanese Journal of Applied Physics, Journal of The Electrochemical Society, Microelectronic Engineering, Applied Physics Letters and IEEE Transactions on Electron Devices.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact