Lieve Teugels

1.4k total citations
36 papers, 473 citations indexed

About

Lieve Teugels is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Materials Chemistry. According to data from OpenAlex, Lieve Teugels has authored 36 papers receiving a total of 473 indexed citations (citations by other indexed papers that have themselves been cited), including 24 papers in Electrical and Electronic Engineering, 14 papers in Biomedical Engineering and 11 papers in Materials Chemistry. Recurrent topics in Lieve Teugels's work include Semiconductor materials and devices (19 papers), Advanced Surface Polishing Techniques (10 papers) and Advancements in Semiconductor Devices and Circuit Design (8 papers). Lieve Teugels is often cited by papers focused on Semiconductor materials and devices (19 papers), Advanced Surface Polishing Techniques (10 papers) and Advancements in Semiconductor Devices and Circuit Design (8 papers). Lieve Teugels collaborates with scholars based in Belgium, United States and Germany. Lieve Teugels's co-authors include S. V. Babu, H. P. Amanapu, Patrick Ong, Herbert Struyf, Marleen H. van der Veen, S. J. Sibener, Niamh Waldron, Farid Sebaai, Nadine Collaert and Clément Merckling and has published in prestigious journals such as Applied Physics Letters, The Journal of Physical Chemistry C and Physical Chemistry Chemical Physics.

In The Last Decade

Lieve Teugels

36 papers receiving 453 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Lieve Teugels Belgium 13 338 238 155 85 71 36 473
Harutoshi Hagino Japan 12 271 0.8× 82 0.3× 751 4.8× 64 0.8× 38 0.5× 18 794
Bozhao Wu China 13 216 0.6× 84 0.4× 372 2.4× 68 0.8× 18 0.3× 31 467
Lew Rabenberg United States 10 143 0.4× 103 0.4× 234 1.5× 100 1.2× 35 0.5× 15 372
Si Kyung Choi South Korea 10 254 0.8× 58 0.2× 218 1.4× 45 0.5× 62 0.9× 19 433
Andrea Scaccabarozzi Italy 12 209 0.6× 150 0.6× 152 1.0× 142 1.7× 20 0.3× 22 338
Mariaconcetta Canino Italy 11 311 0.9× 118 0.5× 242 1.6× 61 0.7× 20 0.3× 57 397
В. В. Наумов Russia 10 245 0.7× 64 0.3× 134 0.9× 95 1.1× 33 0.5× 92 339
Chanan Euaruksakul Thailand 12 176 0.5× 139 0.6× 224 1.4× 74 0.9× 16 0.2× 35 389
J. Leib United States 9 124 0.4× 67 0.3× 268 1.7× 62 0.7× 138 1.9× 17 414
А. А. Шерченков Russia 14 262 0.8× 83 0.3× 439 2.8× 32 0.4× 68 1.0× 75 469

Countries citing papers authored by Lieve Teugels

Since Specialization
Citations

This map shows the geographic impact of Lieve Teugels's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Lieve Teugels with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Lieve Teugels more than expected).

Fields of papers citing papers by Lieve Teugels

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Lieve Teugels. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Lieve Teugels. The network helps show where Lieve Teugels may publish in the future.

Co-authorship network of co-authors of Lieve Teugels

This figure shows the co-authorship network connecting the top 25 collaborators of Lieve Teugels. A scholar is included among the top collaborators of Lieve Teugels based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Lieve Teugels. Lieve Teugels is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Teugels, Lieve, S. R. C. McMitchell, Thierry Conard, et al.. (2023). Microwave Properties of Ba-Substituted Pb(Zr0.52Ti0.48)O3 after Chemical Mechanical Polishing. ECS Journal of Solid State Science and Technology. 12(9). 94006–94006. 2 indexed citations
2.
Teugels, Lieve, et al.. (2021). Effects of H 2 O 2 and pH on the Chemical Mechanical Planarization of Molybdenum. ECS Journal of Solid State Science and Technology. 10(9). 94001–94001. 13 indexed citations
3.
Suhard, Samuel, Koen Kennes, Pieter Bex, et al.. (2021). Demonstration of a collective hybrid die-to-wafer integration using glass carrier. 2064–2070. 14 indexed citations
4.
Huylenbroeck, Stefaan Van, Joeri De Vos, Lieve Teugels, et al.. (2021). Multi-tier $\mathrm{N}=4$ Binary Stacking, combining Face-to-Face and Back-to-Back Hybrid Wafer-to-Wafer Bonding Technology. 1057–1062. 7 indexed citations
5.
Smets, Quentin, Michiel J. van Setten, Jérôme Mitard, et al.. (2020). 300mm IGZO nFETs with low-T Ru contacts for localized doping and increased BEOL compatibility. 3 indexed citations
6.
Schaekers, Marc, Marleen H. van der Veen, Lieve Teugels, et al.. (2020). Ru as an alternative material for advanced contacts. 157–159. 5 indexed citations
7.
Nuytten, Thomas, et al.. (2020). Critical dimension metrology using Raman spectroscopy. Applied Physics Letters. 117(4). 3 indexed citations
8.
Choi, Inchan, et al.. (2019). Post-CMP Cleaning of InGaAs Surface for the Removal of Nanoparticle Contaminants for Sub-10nm Device Applications. ECS Journal of Solid State Science and Technology. 8(5). P3028–P3034. 18 indexed citations
9.
Radisic, D., M. Demand, S. Demuynck, et al.. (2019). Plasma etch selectivity study and material screening for self-aligned gate contact (SAGC). 25–25. 2 indexed citations
10.
Teugels, Lieve, et al.. (2017). Chemical Mechanical Polishing of Chemical Vapor Deposited Co Films with Minimal Corrosion in the Cu/Co/Mn/SiCOH Patterned Structures. ECS Journal of Solid State Science and Technology. 6(5). P276–P283. 42 indexed citations
11.
Teugels, Lieve, et al.. (2017). Chemical Mechanical Polishing and Planarization of Mn-Based Barrier/Ru Liner Films in Cu Interconnects for Advanced Metallization Nodes. ECS Journal of Solid State Science and Technology. 6(5). P259–P264. 10 indexed citations
12.
Waldron, Niamh, Clément Merckling, Lieve Teugels, et al.. (2015). Replacement fin processing for III–V on Si: From FinFets to nanowires. Solid-State Electronics. 115. 81–91. 19 indexed citations
13.
Demuynck, S., E. Kunnen, Janko Versluijs, et al.. (2014). Contact module at dense gate pitch technology challenges. 307–310. 4 indexed citations
14.
Amanapu, H. P., et al.. (2014). Investigation of Guanidine Carbonate-Based Slurries for Chemical Mechanical Polishing of Ru/TiN Barrier Films with Minimal Corrosion. ECS Journal of Solid State Science and Technology. 3(7). P227–P234. 14 indexed citations
16.
Türk, Michael, et al.. (2013). Investigation of Percarbonate Based Slurry Chemistry for Controlling Galvanic Corrosion during CMP of Ruthenium. ECS Journal of Solid State Science and Technology. 2(5). P205–P213. 44 indexed citations
17.
Teugels, Lieve. (2009). Scanning tunneling microscopy studies of supramolecular assemblies of porphyrins and C60 fullerenes. 1 indexed citations
18.
Teugels, Lieve. (2008). Biblical Interpretation in Judaism and Christianity. Journal for the Study of Judaism. 39(3). 407–408. 1 indexed citations
19.
Carl, Shaun A., et al.. (2003). Experimental determination of the temperature dependence of the absolute rate coefficients of the HCCO + NO2and HCCO + H2reactions. Physical Chemistry Chemical Physics. 5(24). 5424–5430. 18 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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