Stefan De Gendt

12.8k citations
634 papers · 10.2k indexed · h-index 47
Topics
Semiconductor materials and devices (363 papers)Advancements in Semiconductor Devices and Circuit Design (166 papers)Integrated Circuits and Semiconductor Failure Analysis (114 papers)

In The Last Decade

Stefan De Gendt

604 papers receiving 9.9k citations

Peers

Stefan De Gendt
Comparison fields: 5 of 122
  • Electrical and Electronic Engineering 7.5k
  • Materials Chemistry 4.8k
  • Biomedical Engineering 1.7k
  • Electronic, Optical and Magnetic Materials 1.4k
  • Atomic and Molecular Physics, and Optics 1.0k
Replace Marc Heyns with:
Marc Heyns Belgium
Raymond R. Unocic United States
Zonghoon Lee South Korea
Yuzi Liu United States
Feng Xu China
R.E.I. Schropp Netherlands
Shoou‐Jinn Chang Taiwan
Chorng Haur Sow Singapore
Nunzio Motta Australia
Carlo Carraro United States
Stefan De Gendt relative to Marc Heyns Belgium Marc Heyns's profile →
Citations per field
00.5×1.5×
Marc Heyns · 1×
Citations per year

Countries citing papers authored by Stefan De Gendt

Since Specialization
Citations

This map shows the geographic impact of Stefan De Gendt's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Stefan De Gendt with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Stefan De Gendt more than expected).

Fields of papers citing papers by Stefan De Gendt

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Stefan De Gendt. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Stefan De Gendt. The network helps show where Stefan De Gendt may publish in the future.

Co-authorship network of co-authors of Stefan De Gendt

This figure shows the co-authorship network connecting the top 25 collaborators of Stefan De Gendt. A scholar is included among the top collaborators of Stefan De Gendt based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Stefan De Gendt. Stefan De Gendt is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
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Mechanism of k-value Reduction of PECVD Low-k Films Treated with He/H2 Ash Plasma
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A 35nm diameter vertical silicon nanowire short-gate tunnelFET
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About Stefan De Gendt

Stefan De Gendt is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials, having authored 634 papers that have together received 10.2k indexed citations. Recurring topics across this work include Semiconductor materials and devices (363 papers), Advancements in Semiconductor Devices and Circuit Design (166 papers) and Integrated Circuits and Semiconductor Failure Analysis (114 papers). The work is most often cited by research in Electrical and Electronic Engineering (7.5k citations), Materials Chemistry (4.8k citations) and Electronic, Optical and Magnetic Materials (1.4k citations). Stefan De Gendt has collaborated with scholars based in Belgium, United States and Netherlands. Frequent co-authors include Marc Heyns, G. Groeseneken, Thierry Conard, Michel Houssa, Sven Van Elshocht, Matty Caymax, Philippe M. Vereecken, Cedric Huyghebaert, Iuliana Radu and L. Pantisano. Their work appears in journals such as Nature Communications, Nano Letters and ACS Nano.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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