Guy Vereecke

1.6k total citations
107 papers, 1.2k citations indexed

About

Guy Vereecke is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Biomedical Engineering. According to data from OpenAlex, Guy Vereecke has authored 107 papers receiving a total of 1.2k indexed citations (citations by other indexed papers that have themselves been cited), including 69 papers in Electrical and Electronic Engineering, 37 papers in Electronic, Optical and Magnetic Materials and 29 papers in Biomedical Engineering. Recurrent topics in Guy Vereecke's work include Semiconductor materials and devices (47 papers), Copper Interconnects and Reliability (36 papers) and Advanced Surface Polishing Techniques (13 papers). Guy Vereecke is often cited by papers focused on Semiconductor materials and devices (47 papers), Copper Interconnects and Reliability (36 papers) and Advanced Surface Polishing Techniques (13 papers). Guy Vereecke collaborates with scholars based in Belgium, United States and Germany. Guy Vereecke's co-authors include J. Lemaı̂tre, Marc Heyns, E. Röhr, Paul Mertens, Frank Holsteyns, Quoc Toan Le, Marcel Lux, Rita Vos, XiuMei Xu and Lu‐Tao Weng and has published in prestigious journals such as ACS Nano, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Guy Vereecke

97 papers receiving 1.2k citations

Peers

Countries citing papers authored by Guy Vereecke

Since Specialization

Citations

This map shows the geographic impact of Guy Vereecke's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Guy Vereecke with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Guy Vereecke more than expected).

Fields of papers citing papers by Guy Vereecke

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Guy Vereecke. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Guy Vereecke. The network helps show where Guy Vereecke may publish in the future.

Co-authorship network of co-authors of Guy Vereecke

This figure shows the co-authorship network connecting the top 25 collaborators of Guy Vereecke. A scholar is included among the top collaborators of Guy Vereecke based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Guy Vereecke. Guy Vereecke is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Rationally Designed Solid Sorbent Electrolyte Exhibits Dual CO ₂ / H ₂ O Sorption and Enables Full Gas Phase CO ₂ Reduction 2025 ·Small Methods ·(unknown), (unknown), Guy Vereecke, (unknown), (unknown), Philippe M. Vereecken	1
2	Investigation of Selective Wet Etching of SiGe Substrates for High-Performance Device Manufacturing 2023 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·Dong Gyu Kim, Guy Vereecke, (unknown), Kurt Wostyn, Tae‐Gon Kim, (unknown), Efrain Altamirano Sánchez	1
3	Impact of La–OH bonds on the retention of Co/LaSiO CBRAM 2020 ·Applied Physics Letters ·J. Radhakrishnan, Attilio Belmonte, Laura Nyns, Wouter Devulder, Guy Vereecke, Gabriele Luca Donadio, Pankaj Kumbhare, Romain Delhougne, Michel Houssa, Gouri Sankar Kar, L. Goux	4
4	In-situ ATR-FTIR for dynamic analysis of superhydrophobic breakdown on nanostructured silicon surfaces 2018 ·Scientific Reports ·Nandi Vrancken, Jiaqi Li, Stefanie Sergeant, Guy Vereecke, (unknown), Frank Holsteyns, Chang Chen, Herman Terryn, Stefan De Gendt, XiuMei Xu	24
5	RMG Patterning by Digital Wet Etching of Polycrystalline Metal Films 2018 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·Yusuke Oniki, Guy Vereecke, E. Dentoni Litta, Lars‐Åke Ragnarsson, Harold Dekkers, T. Schram, Frank Holsteyns, Naoto Horiguchi	0
6	Superhydrophobic Breakdown of Nanostructured Surfaces Characterized in Situ Using ATR–FTIR 2017 ·Langmuir ·Nandi Vrancken, Stefanie Sergeant, Guy Vereecke, (unknown), Frank Holsteyns, Herman Terryn, Stefan De Gendt, XiuMei Xu	28
7	Capturing Wetting States in Nanopatterned Silicon 2013 ·ACS Nano ·XiuMei Xu, Guy Vereecke, Chang Chen, Geoffrey Pourtois, Silvia Armini, Niels Verellen, (unknown), Dongwook Kim, Eunsongyi Lee, (unknown), Pol Van Dorpe, Herbert Struyf, Frank Holsteyns, V. V. Moshchalkov, Joseph O. Indekeu, Stefan De Gendt	53
8	UV-induced modification of fluorocarbon for improvement of subsequent wet removal 2013 ·Microelectronic Engineering ·Quoc Toan Le, (unknown), Huan Yue, I. M. Brown, (unknown), Guy Vereecke, Herbert Struyf, Stefan De Gendt	2
9	An environment friendly wet strip process for 193nm lithography patterning in BEOL applications 2012 ·Microelectronic Engineering ·Guy Vereecke, (unknown), Quoc Toan Le, (unknown), Marcel Lux, Herbert Struyf, Robert Carleer, Peter Adriaensens	2
10	Wetting Challenges in Cleaning of High Aspect Ratio Nano-Structures 2012 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·XiuMei Xu, Guy Vereecke, (unknown), (unknown), Silvia Armini, (unknown), Herbert Struyf	9
11	Stabilization of ambient sensitive atomic layer deposited lanthanum aluminates by annealing and in situ capping 2011 ·Applied Physics Letters ·Johan Swerts, (unknown), Guy Vereecke, An Hardy, (unknown), Christoph Adelmann, Marlies K. Van Bael, Sven Van Elshocht	13
12	Dielectric Reliability of 50 nm Half Pitch Structures in Aurora^® LK 2009 ·Japanese Journal of Applied Physics ·(unknown), (unknown), C. Huffman, Maxime Darnon, Herbert Struyf, (unknown), (unknown), Guy Vereecke, Patrick Verdonck, (unknown), (unknown), (unknown), (unknown), (unknown), Gerald Beyer	6
13	Alternative Photoresist Removal Process to Minimize Damage of Low-k Material Induced by Ash Plasma 2008 ·Japanese Journal of Applied Physics ·Quoc Toan Le, (unknown), Nicolò Chiodarelli, (unknown), Marcel Lux, Martine Claes, Guy Vereecke	10
14	Dielectric Reliability of 50 nm 1/2 Pitch Structures in Aurora<sup>®</sup> LK 2008 ·S. Demuynck, (unknown), C. Huffman, Maxime Darnon, Herbert Struyf, Janko Versluijs, Martine Claes, Guy Vereecke, P. Verdonck, (unknown), N. Heylen, (unknown), David De Roest, (unknown), Gerald Beyer	1
15	The Removal of Silica Particles from Micron Wide Trenches by Megasonic Cleaning 2007 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·Kurt Wostyn, (unknown), Guy Vereecke, Paul Mertens	0
16	Performance of a Linear Single Wafer IPA Vapour Based Drying System 2005 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·Wim Fyen, Sophia Arnauts, Frank Holsteyns, (unknown), Guy Vereecke, Jan Van Steenbergen, Paul Mertens	2
17	Investigating the role of gas cavitation in megasonic nanoparticle removal 2004 ·International Symposium on Microarchitecture ·Guy Vereecke, (unknown), Frank Holsteyns, (unknown), Rita Vos, Paul Mertens, (unknown), Thomas Bauer	3
18	Evaluation of megasonic cleaning systems for particle removal efficiency and damaging 2004 ·Guy Vereecke, Frank Holsteyns, (unknown), Marcel Lux, Sophia Arnauts, (unknown), Rita Vos, P. Mertens, Marc Heyns	2
19	Influence of Frequency on the Removal Efficiency of Nano-Particles in a Megasonic Spray Cleaning Tool 2003 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·Marius Schmidt, Guy Vereecke, Rita Vos, Frank Holsteyns, (unknown), Paul Mertens	4
20	Analysis of trace metals in thin silicon nitride films by total-reflection X-ray fluorescence 2001 ·Spectrochimica Acta Part B Atomic Spectroscopy ·Guy Vereecke, Sophia Arnauts, (unknown), Karine Kenis, Bart Onsia, (unknown), Marc Schaekers, (unknown), Marc Heyns	2

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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