Ph. Roussel

4.8k total citations · 1 hit paper
150 papers, 3.8k citations indexed

About

Ph. Roussel is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Materials Chemistry. According to data from OpenAlex, Ph. Roussel has authored 150 papers receiving a total of 3.8k indexed citations (citations by other indexed papers that have themselves been cited), including 136 papers in Electrical and Electronic Engineering, 22 papers in Electronic, Optical and Magnetic Materials and 18 papers in Materials Chemistry. Recurrent topics in Ph. Roussel's work include Semiconductor materials and devices (122 papers), Advancements in Semiconductor Devices and Circuit Design (83 papers) and Integrated Circuits and Semiconductor Failure Analysis (55 papers). Ph. Roussel is often cited by papers focused on Semiconductor materials and devices (122 papers), Advancements in Semiconductor Devices and Circuit Design (83 papers) and Integrated Circuits and Semiconductor Failure Analysis (55 papers). Ph. Roussel collaborates with scholars based in Belgium, Austria and France. Ph. Roussel's co-authors include G. Groeseneken, R. Degraeve, B. Kaczer, Tibor Grasser, J. Franco, H.E. Maes, J.-L. Ogier, R. Bellens, M. Toledano-Luque and Michel Depas and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Scientific Reports.

In The Last Decade

Ph. Roussel

150 papers receiving 3.7k citations

Hit Papers

New insights in the relat... 1998 2026 2007 2016 1998 100 200 300 400 500
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. New insights in the relation between electron trap generation and the statistical properties of oxide breakdown
    1998 513 citations R. Degraeve, G. Groeseneken et al. IEEE Transactions on Electron Devices profile →

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author Last Decade Papers Cites
Ph. Roussel 3.6k 570 279 223 176 150 3.8k
Ernest Y. Wu 2.4k 0.7× 453 0.8× 358 1.3× 155 0.7× 71 0.4× 138 2.7k
Souvik Mahapatra 5.4k 1.5× 631 1.1× 97 0.3× 298 1.3× 108 0.6× 266 5.5k
P.W. Wyatt 1.6k 0.4× 596 1.0× 113 0.4× 356 1.6× 386 2.2× 93 2.0k
Zhiyi Yu 1.6k 0.5× 1.5k 2.6× 439 1.6× 314 1.4× 274 1.6× 121 2.3k
Chenming Hu 4.8k 1.3× 624 1.1× 140 0.5× 441 2.0× 797 4.5× 103 5.1k
Chenming Hu 3.3k 0.9× 551 1.0× 150 0.5× 330 1.5× 288 1.6× 65 3.4k
Y. Hayashi 1.8k 0.5× 620 1.1× 528 1.9× 148 0.7× 339 1.9× 219 2.1k
M. Bohr 3.6k 1.0× 478 0.8× 279 1.0× 344 1.5× 569 3.2× 51 4.0k
Jia‐Min Shieh 2.1k 0.6× 1.2k 2.1× 434 1.6× 388 1.7× 577 3.3× 197 2.6k
C.L. Keast 1.5k 0.4× 503 0.9× 83 0.3× 302 1.4× 387 2.2× 69 1.8k

Countries citing papers authored by Ph. Roussel

Since Specialization
Citations

This map shows the geographic impact of Ph. Roussel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ph. Roussel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ph. Roussel more than expected).

Fields of papers citing papers by Ph. Roussel

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ph. Roussel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ph. Roussel. The network helps show where Ph. Roussel may publish in the future.

Co-authorship network of co-authors of Ph. Roussel

This figure shows the co-authorship network connecting the top 25 collaborators of Ph. Roussel. A scholar is included among the top collaborators of Ph. Roussel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ph. Roussel. Ph. Roussel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Pedreira, Olalla Varela, Ph. Roussel, Adli A. Saleh, et al.. (2024). De-Coupling Thermo-Migration from Electromigration Using a Dedicated Test Structure. 1–5. 1 indexed citations
2.
Kaczer, B., et al.. (2024). Possible Origins, Identification, and Screening of Silent Data Corruption in Data Centers. Lirias (KU Leuven). 1–7. 1 indexed citations
3.
Roussel, Ph., et al.. (2019). Positive non-linear capacitance: the origin of the steep subthreshold-slope in ferroelectric FETs. Scientific Reports. 9(1). 14957–14957. 13 indexed citations
4.
Franco, J., Subhadeep Mukhopadhyay, Pieter Weckx, et al.. (2016). Statistical model of the NBTI-induced threshold voltage, subthreshold swing, and transconductance degradations in advanced p-FinFETs. HAL (Le Centre pour la Communication Scientifique Directe). 15.3.1–15.3.4. 12 indexed citations
5.
Tôkei, Zs., Ivan Ciofi, Ph. Roussel, et al.. (2016). On-chip interconnect trends, challenges and solutions: How to keep RC and reliability under control. 1–2. 17 indexed citations
6.
Weckx, Pieter, B. Kaczer, Prasanth Raghavan, et al.. (2015). Characterization and simulation methodology for time-dependent variability in advanced technologies. 1–8. 9 indexed citations
7.
Toledano-Luque, M., B. Kaczer, J. Franco, et al.. (2013). Degradation of time dependent variability due to interface state generation. Symposium on VLSI Technology. 41 indexed citations
8.
Degraeve, R., A. Fantini, Nagarajan Raghavan, et al.. (2013). Modeling RRAM set/reset statistics resulting in guidelines for optimized operation. Symposium on VLSI Technology. 17 indexed citations
9.
Degraeve, R., L. Goux, Ph. Roussel, et al.. (2011). Deterministic and stochastic component in RESET transient of HfSiO/FUSI gate RRAM stack. Symposium on VLSI Technology. 28–29. 1 indexed citations
10.
Kaczer, B., Tibor Grasser, Ph. Roussel, et al.. (2010). Origin of NBTI variability in deeply scaled pFETs. 26–32. 250 indexed citations
11.
Degraeve, R., Ph. Roussel, L. Goux, et al.. (2010). Generic learning of TDDB applied to RRAM for improved understanding of conduction and switching mechanism through multiple filaments. 28.4.1–28.4.4. 48 indexed citations
12.
Mata-Miranda, Mónica Maribel, et al.. (2009). Variability aware modeling of SoCs: From device variations to manufactured system yield. 547–553. 15 indexed citations
13.
Degraeve, R., B. Kaczer, Ph. Roussel, & G. Groeseneken. (2005). On the trap generation rate in ultrathin SiON under Constant Voltage Stress. Microelectronic Engineering. 80. 440–443. 10 indexed citations
14.
Kauerauf, T., R. Degraeve, M. B. Zahid, et al.. (2005). Abrupt breakdown in dielectric/metal gate stacks: a potential reliability limitation?. IEEE Electron Device Letters. 26(10). 773–775. 28 indexed citations
15.
Kerber, A., E. Cartier, R. Degraeve, et al.. (2003). Charge trapping and dielectric reliability of SiO/sub 2/-Al/sub 2/O/sub 3/ gate stacks with TiN electrodes. IEEE Transactions on Electron Devices. 50(5). 1261–1269. 60 indexed citations
16.
Roussel, Ph., Vladimir Lysenko, B. Remaki, et al.. (1999). Thick oxidised porous silicon layers for the design of a biomedical thermal conductivity microsensor. Sensors and Actuators A Physical. 74(1-3). 100–103. 33 indexed citations
17.
Blauwe, J. De, R. Degraeve, R. Bellens, et al.. (1996). Study of DC Stress Induced Leakage Current (SILC) and its Dependence on Oxide Nitridation. European Solid-State Device Research Conference. 361–364. 9 indexed citations
18.
Ogier, J.-L., R. Degraeve, Ph. Roussel, G. Groeseneken, & H.E. Maes. (1995). Analysis of the Early-Failure Rate Prediction of Time-Dependent-Dielectric Breakdown in Thin Oxides. European Solid-State Device Research Conference. 299–302. 5 indexed citations
19.
Witvrouw, Ann, et al.. (1994). Stress Relaxation in Al-Si-Cu Thin Films and Lines. MRS Proceedings. 356. 7 indexed citations
20.
Roussel, Ph., et al.. (1988). Pipetting errors in viral titrations: a useful approach. Journal of Virological Methods. 22(2-3). 183–190. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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