R. Bellens

2.2k citations
40 papers · 1.6k indexed · 1 hit paper · h-index 13
Topics
Semiconductor materials and devices (37 papers)Advancements in Semiconductor Devices and Circuit Design (33 papers)Integrated Circuits and Semiconductor Failure Analysis (17 papers)
Partner nations
BelgiumFranceSwitzerland

In The Last Decade

R. Bellens

39 papers receiving 1.5k citations

Hit Papers

New insights in the relation between electron trap genera...19982026200720161998100200300400500

Peers

R. Bellens
Comparison fields: 5 of 45
  • Electrical and Electronic Engineering 1.6k
  • Materials Chemistry 243
  • Electronic, Optical and Magnetic Materials 117
  • Atomic and Molecular Physics, and Optics 75
  • Condensed Matter Physics 41
Replace B.P. Linder with:
B.P. Linder United States
Michel Depas Belgium
J.-L. Ogier France
Ih-Chin Chen United States
Chenming Hu United States
Ping-Keung Ko United States
K.K. Young United States
T. Kauerauf Belgium
Joo Tae Moon South Korea
Yuzuru Ohji Japan
R. Bellens relative to B.P. Linder United States B.P. Linder's profile →
Citations per field
00.5×1.5×
B.P. Linder · 1×
Citations per year

Countries citing papers authored by R. Bellens

Since Specialization
Citations

This map shows the geographic impact of R. Bellens's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Bellens with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Bellens more than expected).

Fields of papers citing papers by R. Bellens

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. Bellens. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Bellens. The network helps show where R. Bellens may publish in the future.

Co-authorship network of co-authors of R. Bellens

This figure shows the co-authorship network connecting the top 25 collaborators of R. Bellens. A scholar is included among the top collaborators of R. Bellens based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. Bellens. R. Bellens is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 1
2 1
3 1
4
Study of DC Stress Induced Leakage Current (SILC) and its Dependence on Oxide Nitridation
9
5 6
6 2
7
Charge Pumping of Single Interface Traps in Submicron MOSFET's
2
8 35
9 22
10
Comparative study of hot-carrier degradation in p + and n + poly p-MOSFET's of a 0.5 μm CMOS technology
2
11 7
12 3
13 0
14 75
15 11
16 2
17 8
18 10
19 326
20
Characterization and analysis of hot-carrier degradation in p-channel transistors using constant current stress experiments
3

About R. Bellens

R. Bellens is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Materials Chemistry, having authored 40 papers that have together received 1.6k indexed citations. Recurring topics across this work include Semiconductor materials and devices (37 papers), Advancements in Semiconductor Devices and Circuit Design (33 papers) and Integrated Circuits and Semiconductor Failure Analysis (17 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.6k citations), Electronic, Optical and Magnetic Materials (117 citations) and Materials Chemistry (243 citations). R. Bellens has collaborated with scholars based in Belgium, France and Switzerland. Frequent co-authors include G. Groeseneken, H.E. Maes, Paul Heremans, R. Degraeve, Michel Depas, Ph. Roussel, J.-L. Ogier, G. Van den bosch, W. Weber and Ingrid De Wolf. Their work appears in journals such as Applied Surface Science, IEEE Transactions on Electron Devices and IEEE Electron Device Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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