Marc Heyns
About
In The Last Decade
Marc Heyns
601 papers receiving 12.0k citations
Peers
Comparison fields: 5 of 108
- Electrical and Electronic Engineering 10.3k
- Materials Chemistry 4.9k
- Atomic and Molecular Physics, and Optics 2.7k
- Biomedical Engineering 2.2k
- Electronic, Optical and Magnetic Materials 913
Countries citing papers authored by Marc Heyns
This map shows the geographic impact of Marc Heyns's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Marc Heyns with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Marc Heyns more than expected).
Fields of papers citing papers by Marc Heyns
This network shows the impact of papers produced by Marc Heyns. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Marc Heyns. The network helps show where Marc Heyns may publish in the future.
Co-authorship network of co-authors of Marc Heyns
This figure shows the co-authorship network connecting the top 25 collaborators of Marc Heyns. A scholar is included among the top collaborators of Marc Heyns based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Marc Heyns. Marc Heyns is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 2 | |
| 3 | 65 | |
| 4 | 16 | |
| 5 | 69 | |
| 6 | 27 | |
| 7 | 25 | |
| 8 | 2 | |
| 9 | 11 | |
| 10 | 8 | |
| 11 | 22 | |
| 12 | 54 | |
| 13 | A 35nm diameter vertical silicon nanowire short-gate tunnelFET | 1 |
| 14 | Scalability of quantum well devices for digital logic applications | 2 |
| 15 | The impact of sub monolayers of HfO2 on the device performance of high-K based transistors | 9 |
| 16 | Advanced wet and dry cleaning coming together for next generation | 22 |
| 17 | A novel environmentally-friendly corrosion-free post-stripping rinsing procedure after solvent strip | 1 |
| 18 | Soft Breakdown of Ultra-Thin Gate Oxide Layers | 1 |
| 19 | Degradation and wearout of thin dielectric layers during charge injection | 1 |
| 20 | 1 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.