Chenming Hu
About
In The Last Decade
Chenming Hu
96 papers receiving 4.7k citations
Hit Papers
Peers
Comparison fields: 5 of 79
- Electrical and Electronic Engineering 4.8k
- Biomedical Engineering 797
- Materials Chemistry 624
- Atomic and Molecular Physics, and Optics 441
- Hardware and Architecture 168
Countries citing papers authored by Chenming Hu
This map shows the geographic impact of Chenming Hu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Chenming Hu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Chenming Hu more than expected).
Fields of papers citing papers by Chenming Hu
This network shows the impact of papers produced by Chenming Hu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Chenming Hu. The network helps show where Chenming Hu may publish in the future.
Co-authorship network of co-authors of Chenming Hu
This figure shows the co-authorship network connecting the top 25 collaborators of Chenming Hu. A scholar is included among the top collaborators of Chenming Hu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Chenming Hu. Chenming Hu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 4 | |
| 2 | 2 | |
| 3 | 6 | |
| 4 | 4 | |
| 5 | 3 | |
| 6 | 4 | |
| 7 | 33 | |
| 8 | 29 | |
| 9 | FinFET scaling to 10 nm gate length breakdown → | 462 |
| 10 | 10 | |
| 11 | 113 | |
| 12 | Engineering BSIM for the Nano-Technology Era and Beyond | 3 |
| 13 | 118 | |
| 14 | Charge-Trap Memory Device Fabricated by Oxidation of | 3 |
| 15 | 120 | |
| 16 | 61 | |
| 17 | Characterization of hot-carrier effects in thin-film fully-depleted SOI MOSFETs | 5 |
| 18 | 7 | |
| 19 | NEW METHOD OF MEASURING DIFFUSION LENGTH AND SURFACE RECOMBINATION VELOCITY. | 1 |
| 20 | OPEN CIRCUIT VOLTAGE OF HIGH INTENSITY SILICON SOLAR CELLS. | 1 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.