Souvik Mahapatra

7.8k citations

266 papers · 5.5k · 2 hit papers · h-index 34

Impact in

Electrical and Electronic Engineering top 0.5%
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- Advanced Memory and Neural Computing
- Silicon Carbide Semiconductor Technologies
- Low-power high-performance VLSI design
Hardware and Architecture top 2%

Papers in

Electrical and Electronic Engineering 258
- Semiconductor materials and devices 226
- Advancements in Semiconductor Devices and Circuit Design 190
- Integrated Circuits and Semiconductor Failure Analysis 68
- Ferroelectric and Negative Capacitance Devices 62
- Advanced Memory and Neural Computing 24
- Silicon Carbide Semiconductor Technologies 21
- Microwave Engineering and Waveguides 12
Materials Chemistry 26

Co-authors: Md Ashraful Alam (8 shared papers)Muhammad A. Alam (24 shared papers)Dhanoop Varghese (12 shared papers)Narendra Parihar (38 shared papers)Nilesh Goel (20 shared papers)Ahmad E. Islam (16 shared papers)Subhadeep Mukhopadhyay (18 shared papers)Dipankar Saha (9 shared papers)
Journals: IEEE Transactions on Electron Devices (64 papers)IEEE Electron Device Letters (17 papers)Microelectronics Reliability (9 papers)Solid-State Electronics (7 papers)IEEE Transactions on Device and Materials Reliability (5 papers)
Partner nations: India United States Japan

In The Last Decade

Souvik Mahapatra

246 papers receiving 5.3k citations

Souvik Mahapatra's Hit Papers

align trajectories log scale

Critical Role of Interlayer in Hf_0.5Zr_0.5O₂ Ferroelectric FET Nonvolatile Memory Performance 2018 · 359 citations

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if any of the following hold:

it has ≥500 total citations;
it reaches ≥1.5× the top-1% citation threshold for papers in the same subfield and year (the threshold is the minimum needed to enter the top 1%, not the average within it);
it reaches the top citation threshold in at least one of its specific research topics.

2018 IEEE Transactions on Electron Devices
2004 Microelectronics Reliability

Peers

Countries citing papers authored by Souvik Mahapatra

Since Specialization

Citations

This map shows the geographic impact of Souvik Mahapatra's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Souvik Mahapatra with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Souvik Mahapatra more than expected).

Fields of papers citing papers by Souvik Mahapatra

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Souvik Mahapatra. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Souvik Mahapatra. The network helps show where Souvik Mahapatra may publish in the future.

Co-authors

The 25 scholars most cited alongside Souvik Mahapatra, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Souvik Mahapatra Line = papers co-authored together Souvik Mahapatra links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 266 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	A comprehensive model of PMOS NBTI degradation Microelectronics Reliability ·Md Ashraful Alam, Souvik Mahapatra Hit paper breakdown →	2004	581
2	Critical Role of Interlayer in Hf_0.5Zr_0.5O₂ Ferroelectric FET Nonvolatile Memory Performance IEEE Transactions on Electron Devices ·Kai Ni, Pankaj Sharma, Jianchi Zhang, Matthew Jerry, Jeffery A. Smith, Kandabara Tapily, Robert D. Clark, Souvik Mahapatra, Suman Datta Hit paper breakdown →	2018	359
3	A Comparative Study of Different Physics-Based NBTI Models IEEE Transactions on Electron Devices ·Souvik Mahapatra, Nilesh Goel, Sujay B. Desai, Shashank Gupta, B. Jose, Subhadeep Mukhopadhyay, K. Joshi, Ankit Jain, Ahmad E. Islam, Muhammad A. Alam	2013	223
4	A comprehensive model for PMOS NBTI degradation: Recent progress Microelectronics Reliability ·Muhammad A. Alam, Haldun Küflüoğlu, Dhanoop Varghese, Souvik Mahapatra	2006	216
5	Recent Issues in Negative-Bias Temperature Instability: Initial Degradation, Field Dependence of Interface Trap Generation, Hole Trapping Effects, and Relaxation IEEE Transactions on Electron Devices ·Ahmad E. Islam, Haldun Küflüoğlu, Dhanoop Varghese, Souvik Mahapatra, Md Ashraful Alam	2007	213
6	Investigation and Modeling of Interface and Bulk Trap Generation During Negative Bias Temperature Instability of p-MOSFETs IEEE Transactions on Electron Devices ·Souvik Mahapatra, P. BharathKumar, Muhammad A. Alam	2004	173
7	On the generation and recovery of interface traps in MOSFETs subjected to NBTI, FN, and HCI stress IEEE Transactions on Electron Devices ·Souvik Mahapatra, Dipankar Saha, Dhanoop Varghese, Pawan Kumar	2006	162
8	On the Physical Mechanism of NBTI in Silicon Oxynitride p-MOSFETs: Can Differences in Insulator Processing Conditions Resolve the Interface Trap Generation versus Hole Trapping Controversy? Souvik Mahapatra, Khaled Ahmed, Dhanoop Varghese, Ahmad E. Islam, Gaurav Gupta, L. Madhav, Dipankar Saha, Muhammad A. Alam	2007	106
9	On the dispersive versus arrhenius temperature activation of nbti time evolution in plasma nitrided gate oxides: measurements, theory, and implications DSpace (IIT Bombay) ·Dhanoop Varghese, Dipankar Saha, Souvik Mahapatra, Khaled Ahmed, F. Nouri, M. Alam	2006	93
10	BTI Analysis Tool—Modeling of NBTI DC, AC Stress and Recovery Time Kinetics, Nitrogen Impact, and EOL Estimation IEEE Transactions on Electron Devices ·Narendra Parihar, Nilesh Goel, Subhadeep Mukhopadhyay, Souvik Mahapatra	2017	86
11	A critical re-evaluation of the usefulness of R-D framework in predicting NBTI stress and recovery Souvik Mahapatra, Ahmad E. Islam, S. Deora, V. D. Maheta, K. Joshi, Ankit Jain, Muhammad A. Alam	2011	85
12	A consistent physical framework for N and P BTI in HKMG MOSFETs K. Joshi, Subhadeep Mukhopadhyay, Nilesh Goel, Souvik Mahapatra	2012	84
13	Controversial issues in negative bias temperature instability Microelectronics Reliability ·J. H. Stathis, Souvik Mahapatra, Tibor Grasser	2018	71
14	Mechanism of negative bias temperature instability in CMOS devices degradation, recovery and impact of nitrogen DSpace (IIT Bombay) ·Souvik Mahapatra, Muhammad A. Alam, Pawan Kumar, T.R. Dalei, Dipankar Saha	2005	56
15	Isolation of NBTI Stress Generated Interface Trap and Hole-Trapping Components in PNO p-MOSFETs IEEE Transactions on Electron Devices ·Souvik Mahapatra, V. D. Maheta, Ahmad E. Islam, Muhammad A. Alam	2009	54
16	A Simulation Study of NBTI Impact on 14-nm Node FinFET Technology for Logic Applications: Device Degradation to Circuit-Level Interaction IEEE Transactions on Electron Devices ·Subrat Mishra, Hussam Amrouch, Jerin Joe, Chetan Kumar Dabhi, Karansingh Thakor, Yogesh Singh Chauhan, Jörg Henkel, Souvik Mahapatra	2018	52
17	Ultrafast Measurements and Physical Modeling of NBTI Stress and Recovery in RMG FinFETs Under Diverse DC–AC Experimental Conditions IEEE Transactions on Electron Devices ·Narendra Parihar, Uma Sharma, Richard G. Southwick, Miaomiao Wang, J. H. Stathis, Souvik Mahapatra	2017	51
18	A review of NBTI mechanisms and models Microelectronics Reliability ·Souvik Mahapatra, Narendra Parihar	2018	51
19	A Modeling Framework for NBTI Degradation Under Dynamic Voltage and Frequency Scaling IEEE Transactions on Electron Devices ·Narendra Parihar, Nilesh Goel, Ankush Chaudhary, Souvik Mahapatra	2016	47
20	A predictive reliability model for PMOS bias temperature degradation DSpace (IIT Bombay) ·Souvik Mahapatra, Md Ashraful Alam	2003	47

About Souvik Mahapatra

Souvik Mahapatra is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Computer Networks and Communications, Atomic and Molecular Physics, and Optics and Electronic, Optical and Magnetic Materials, having authored 266 papers that have together received 5.5k indexed citations. Recurring topics across this work include Semiconductor materials and devices (226 papers), Advancements in Semiconductor Devices and Circuit Design (190 papers), Integrated Circuits and Semiconductor Failure Analysis (68 papers), Ferroelectric and Negative Capacitance Devices (62 papers), Advanced Memory and Neural Computing (24 papers), Silicon Carbide Semiconductor Technologies (21 papers), Advanced Data Storage Technologies (18 papers) and Microwave Engineering and Waveguides (12 papers). The work is most often cited by research in Electrical and Electronic Engineering (5.4k citations), Hardware and Architecture (250 citations), Materials Chemistry (631 citations), Atomic and Molecular Physics, and Optics (298 citations) and Computer Networks and Communications (148 citations). Souvik Mahapatra has collaborated with scholars based in India, United States and Japan. Frequent co-authors include Md Ashraful Alam, Muhammad A. Alam, Dhanoop Varghese, Narendra Parihar, Nilesh Goel, Ahmad E. Islam, Subhadeep Mukhopadhyay, Dipankar Saha, Haldun Küflüoğlu and Uma Sharma. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Electron Device Letters, Microelectronics Reliability, Solid-State Electronics and IEEE Transactions on Device and Materials Reliability.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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