Marko Simicic

542 total citations
36 papers, 403 citations indexed

About

Marko Simicic is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Marko Simicic has authored 36 papers receiving a total of 403 indexed citations (citations by other indexed papers that have themselves been cited), including 36 papers in Electrical and Electronic Engineering, 2 papers in Hardware and Architecture and 1 paper in Atomic and Molecular Physics, and Optics. Recurrent topics in Marko Simicic's work include Integrated Circuits and Semiconductor Failure Analysis (25 papers), Semiconductor materials and devices (25 papers) and Advancements in Semiconductor Devices and Circuit Design (22 papers). Marko Simicic is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (25 papers), Semiconductor materials and devices (25 papers) and Advancements in Semiconductor Devices and Circuit Design (22 papers). Marko Simicic collaborates with scholars based in Belgium, Austria and United States. Marko Simicic's co-authors include Pieter Weckx, B. Kaczer, D. Linten, J. Franco, Tibor Grasser, Ph. Roussel, G. Rzepa, Michael Waltl, Geert Hellings and A. Subirats and has published in prestigious journals such as Solid-State Electronics, IEEE Transactions on Very Large Scale Integration (VLSI) Systems and Microelectronics Reliability.

In The Last Decade

Marko Simicic

33 papers receiving 399 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Marko Simicic Belgium 9 382 62 26 17 16 36 403
Zixuan Sun China 12 325 0.9× 55 0.9× 21 0.8× 18 1.1× 23 1.4× 50 362
Gi-Yong Yang South Korea 7 329 0.9× 29 0.5× 43 1.7× 32 1.9× 20 1.3× 19 350
A. Subirats Belgium 13 576 1.5× 164 2.6× 8 0.3× 15 0.9× 15 0.9× 33 589
Osbert Cheng Taiwan 12 486 1.3× 51 0.8× 14 0.5× 13 0.8× 16 1.0× 87 497
Vincent Huard France 10 464 1.2× 24 0.4× 35 1.3× 12 0.7× 8 0.5× 24 477
Aniket Gupta India 11 296 0.8× 69 1.1× 8 0.3× 14 0.8× 31 1.9× 26 310
Matthew San Jose United States 7 236 0.6× 58 0.9× 15 0.6× 5 0.3× 16 1.0× 9 244
Carlos Navarro Spain 12 469 1.2× 58 0.9× 8 0.3× 35 2.1× 59 3.7× 67 491
Gihun Choe United States 12 323 0.8× 141 2.3× 10 0.4× 10 0.6× 25 1.6× 32 342
Bernhard Stampfer Austria 12 327 0.9× 149 2.4× 9 0.3× 16 0.9× 30 1.9× 31 376

Countries citing papers authored by Marko Simicic

Since Specialization
Citations

This map shows the geographic impact of Marko Simicic's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Marko Simicic with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Marko Simicic more than expected).

Fields of papers citing papers by Marko Simicic

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Marko Simicic. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Marko Simicic. The network helps show where Marko Simicic may publish in the future.

Co-authorship network of co-authors of Marko Simicic

This figure shows the co-authorship network connecting the top 25 collaborators of Marko Simicic. A scholar is included among the top collaborators of Marko Simicic based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Marko Simicic. Marko Simicic is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Barić, Adrijan, et al.. (2025). I/O Circuit and Sub-5V ESD Protection for Advanced Bonding Interfaces. 1–6. 1 indexed citations
3.
Lin, Shih‐Hsiang, et al.. (2024). Toward 0 V ESD Protection in 2.5D/3D Advanced Bonding Technology. 1–2. 2 indexed citations
4.
Lin, Shih‐Hsiang, Marko Simicic, Shih‐Hung Chen, et al.. (2023). ESD mitigation for 3D IC hybrid bonding. VUBIR (Vrije Universiteit Brussel). 1–9. 1 indexed citations
5.
Simicic, Marko, et al.. (2023). ESD process assessment of 2.5D and 3D bonding technologies. 1–7. 1 indexed citations
6.
Simicic, Marko, et al.. (2021). Wafer-Level LICCDM Device Testing. 1–8. 1 indexed citations
7.
Stampfer, Bernhard, Marko Simicic, Pieter Weckx, et al.. (2020). Extraction of Statistical Gate Oxide Parameters From Large MOSFET Arrays. IEEE Transactions on Device and Materials Reliability. 20(2). 251–257. 2 indexed citations
8.
Simicic, Marko, et al.. (2020). Optimization of Wafer-Level Low-Impedance Contact CDM Testers. 1 indexed citations
9.
Beek, S. Van, Marko Simicic, J. Franco, Shih‐Hung Chen, & Dimitri Linten. (2020). Ultrafast RVS as an Efficient Method to Measure Oxide Breakdown in the EOS and ESD Time Domain. 1 indexed citations
10.
Simicic, Marko, et al.. (2019). Low-Impedance Contact CDM – Evaluation and Modeling. 1–9. 1 indexed citations
11.
Linten, D., Geert Hellings, Marko Simicic, et al.. (2019). CDM-Time Domain Turn-on Transient of ESD Diodes in Bulk FinFET and GAA NW Technologies. 1–7. 1 indexed citations
12.
Simicic, Marko, Geert Hellings, Shih‐Hung Chen, Kris Myny, & Dimitri Linten. (2018). ESD study on a-IGZO TFT device architectures. Zenodo (CERN European Organization for Nuclear Research). 1–7. 8 indexed citations
13.
Rzepa, G., J. Franco, Barry O’Sullivan, et al.. (2018). Comphy — A compact-physics framework for unified modeling of BTI. Microelectronics Reliability. 85. 49–65. 158 indexed citations
14.
Weckx, Pieter, Marko Simicic, Kazumasa Nomoto, et al.. (2017). Defect-based compact modeling for RTN and BTI variability. CR–7.1. 18 indexed citations
15.
Bury, E., B. Kaczer, J. Franco, et al.. (2017). Statistical assessment of the full V<inf>G</inf>/V<inf>D</inf> degradation space using dedicated device arrays. 2D–5.1. 13 indexed citations
16.
Simicic, Marko, A. Subirats, Pieter Weckx, et al.. (2016). Comparative experimental analysis of time-dependent variability using a transistor test array. Lirias (KU Leuven). XT–10. 8 indexed citations
17.
Kaczer, B., J. Franco, Pieter Weckx, et al.. (2016). The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits. Solid-State Electronics. 125. 52–62. 18 indexed citations
18.
Weckx, Pieter, B. Kaczer, Prasanth Raghavan, et al.. (2015). Characterization and simulation methodology for time-dependent variability in advanced technologies. 1–8. 9 indexed citations
19.
Putcha, V., Marko Simicic, Pieter Weckx, et al.. (2015). Smart-array for pipelined BTI characterization. 95–98. 8 indexed citations
20.
Hussin, Razaidi, J. Franco, Danielle Vanhaeren, et al.. (2015). Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow. 32. 238–241. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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