Marko Simicic

542 citations

36 papers · 403 indexed · h-index 9

Impact in

Electrical and Electronic Engineering top 10%
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- Advanced Memory and Neural Computing
- Silicon Carbide Semiconductor Technologies
- Electrostatic Discharge in Electronics
Hardware and Architecture

Papers in ⓘ

Electrical and Electronic Engineering 36
- Semiconductor materials and devices 25
- Integrated Circuits and Semiconductor Failure Analysis 25
- Advancements in Semiconductor Devices and Circuit Design 22
- Electrostatic Discharge in Electronics 14
- 3D IC and TSV technologies 6
- Thin-Film Transistor Technologies 4
- Photonic and Optical Devices 2
- Ferroelectric and Negative Capacitance Devices 1
Hardware and Architecture 2

Co-authors: Pieter Weckx (19 shared papers)B. Kaczer (17 shared papers)D. Linten (12 shared papers)J. Franco (13 shared papers)Tibor Grasser (7 shared papers)Michael Waltl (5 shared papers)Ph. Roussel (5 shared papers)G. Rzepa (4 shared papers)
Journals: Microelectronics Reliability (3 papers)IEEE Transactions on Very Large Scale Integration (VLSI) Systems (1 paper)Solid-State Electronics (1 paper)IEEE Transactions on Device and Materials Reliability (1 paper)VUBIR (Vrije Universiteit Brussel) (2 papers)
Partner nations: Belgium Austria United States

In The Last Decade

Marko Simicic

33 papers receiving 399 citations

Peers

Countries citing papers authored by Marko Simicic

Since Specialization

Citations

This map shows the geographic impact of Marko Simicic's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Marko Simicic with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Marko Simicic more than expected).

Fields of papers citing papers by Marko Simicic

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Marko Simicic. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Marko Simicic. The network helps show where Marko Simicic may publish in the future.

Co-authors

The 25 scholars most cited alongside Marko Simicic, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Marko Simicic Line = papers co-authored together Marko Simicic links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 36 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Comphy — A compact-physics framework for unified modeling of BTI Microelectronics Reliability ·G. Rzepa, J. Franco, Barry O’Sullivan, A. Subirats, Marko Simicic, Geert Hellings, Pieter Weckx, Markus Jech, Theresia Knobloch, Michael Waltl, Ph. Roussel, D. Linten, B. Kaczer, Tibor Grasser	2018	158
2	A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability Microelectronics Reliability ·Ben Kaczer, J. Franco, Pieter Weckx, Ph. Roussel, V. Putcha, E. Bury, Marko Simicic, Adrian Chasin, D. Linten, Bertrand Parvais, Francky Catthoor, G. Rzepa, Michael Waltl, Tibor Grasser	2018	52
3	Self-heating-aware CMOS reliability characterization using degradation maps E. Bury, Adrian Chasin, B. Kaczer, Kai-Hsin Chuang, J. Franco, Marko Simicic, Pieter Weckx, D. Linten	2018	21
4	Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations IEEE Transactions on Very Large Scale Integration (VLSI) Systems ·Marko Simicic, Pieter Weckx, Bertrand Parvais, Philippe Roussel, B. Kaczer, Georges Gielen	2018	20
5	Defect-based compact modeling for RTN and BTI variability Pieter Weckx, Marko Simicic, Kazumasa Nomoto, Mizuki Ono, Bertrand Parvais, B. Kaczer, Prasanth Raghavan, D. Linten, Kazuyuki Sawada, H. Ammo, Shuji Yamakawa, A. Spessot, Diederik Verkest, A. Mocuta	2017	18
6	The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits Solid-State Electronics ·B. Kaczer, J. Franco, Pieter Weckx, Ph. Roussel, Marko Simicic, V. Putcha, E. Bury, M. Cho, R. Degraeve, D. Linten, G. Groeseneken, Peter Debacker, Bertrand Parvais, Prasanth Raghavan, Francky Catthoor, G. Rzepa, Michael Waltl, Wolfgang Goes, Tibor Grasser	2016	18
7	Advanced MOSFET variability and reliability characterization array Lirias (KU Leuven) ·Marko Simicic, V. Putcha, Bertrand Parvais, Pieter Weckx, B. Kaczer, G. Groeseneken, Georges Gielen, D. Linten, A. Thean	2015	16
8	Statistical assessment of the full V<inf>G</inf>/V<inf>D</inf> degradation space using dedicated device arrays E. Bury, B. Kaczer, Kai-Hsin Chuang, J. Franco, Pieter Weckx, Adrian Chasin, Marko Simicic, D. Linten, G. Groeseneken	2017	13
9	Characterization and simulation methodology for time-dependent variability in advanced technologies Pieter Weckx, B. Kaczer, Prasanth Raghavan, J. Franco, Marko Simicic, Ph. Roussel, D. Linten, A. Thean, Diederik Verkest, Francky Catthoor, G. Groeseneken	2015	9
10	Comparative experimental analysis of time-dependent variability using a transistor test array Lirias (KU Leuven) ·Marko Simicic, A. Subirats, Pieter Weckx, B. Kaczer, J. Franco, Philippe Roussel, Dimitri Linten, Aaron Thean, G. Groeseneken, Georges Gielen	2016	8
11	ESD study on a-IGZO TFT device architectures Zenodo (CERN European Organization for Nuclear Research) ·Marko Simicic, Geert Hellings, Shih‐Hung Chen, Kris Myny, Dimitri Linten	2018	8
12	Smart-array for pipelined BTI characterization V. Putcha, Marko Simicic, Pieter Weckx, Bertrand Parvais, J. Franco, B. Kaczer, Dimitri Linten, Diederik Verkest, Aaron Thean, G. Groeseneken	2015	8
13	Benchmarking time-dependent variability of junctionless nanowire FETs B. Kaczer, G. Rzepa, J. Franco, Pieter Weckx, Adrian Chasin, V. Putcha, E. Bury, Marko Simicic, Ph. Roussel, Geert Hellings, A. Veloso, P. Matagne, Tibor Grasser, D. Linten	2017	8
14	Electrostatic discharge robustness of amorphous indium-gallium-zinc-oxide thin-film transistors Microelectronics Reliability ·Marko Simicic, Nowab Reza MD Ashif, Geert Hellings, Shih‐Hung Chen, Manoj Nag, Auke Jisk Kronemeijer, Kris Myny, Dimitri Linten	2020	6
15	Experimental evidences and simulations of trap generation along a percolation path Louis Gerrer, Razaidi Hussin, Salvatore Amoroso, J. Franco, Pieter Weckx, Marko Simicic, Naoto Horiguchi, B. Kaczer, Tibor Grasser, A. Asenov	2015	6
16	Scaling CMOS beyond Si FinFET: an analog/RF perspective VUBIR (Vrije Universiteit Brussel) ·Bertrand Parvais, Geert Hellings, Marko Simicic, Pieter Weckx, Jérôme Mitard, Doyoung Jang, Veeresh Deshpande, B. van Liempc, A. Veloso, A. Vandooren, Niamh Waldron, Piet Wambacq, Nadine Collaert, Diederik Verkest	2018	6
17	Degradation mechanisms in Germanium Electro-Absorption Modulators Artemisia Tsiara, A. Leśniewska, Philippe Roussel, Srinivasan Ashwyn Srinivasan, Mathias Berciano, Marko Simicic, Marianna Pantouvaki, Joris Van Campenhout, Kristof Croes	2022	5
18	A fully-integrated method for RTN parameter extraction Lirias (KU Leuven) ·Marko Simicic, Sébastien Morrison, Bertrand Parvais, Pieter Weckx, B. Kaczer, K. Sawada, H. Ammo, Satoshi Yamakawa, Kazuki Nomoto, M. Ohno, D. Linten, Diederik Verkest, Piet Wambacq, G. Groeseneken, Georges Gielen	2017	3
19	ESD diodes with Si/SiGe superlattice I/O finFET architecture in a vertically stacked horizontal nanowire technology Marko Simicic, Geert Hellings, Shih‐Hung Chen, Naoto Horiguchi, Dimitri Linten	2018	3
20	Extraction of Statistical Gate Oxide Parameters From Large MOSFET Arrays IEEE Transactions on Device and Materials Reliability ·Bernhard Stampfer, Marko Simicic, Pieter Weckx, Arash Abbasi, B. Kaczer, Tibor Grasser, Michael Waltl	2020	2

About Marko Simicic

Marko Simicic is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Atomic and Molecular Physics, and Optics, Infectious Diseases and Organic Chemistry, having authored 36 papers that have together received 403 indexed citations. Recurring topics across this work include Semiconductor materials and devices (25 papers), Integrated Circuits and Semiconductor Failure Analysis (25 papers), Advancements in Semiconductor Devices and Circuit Design (22 papers), Electrostatic Discharge in Electronics (14 papers), 3D IC and TSV technologies (6 papers), Thin-Film Transistor Technologies (4 papers), Photonic and Optical Devices (2 papers) and Ferroelectric and Negative Capacitance Devices (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (382 citations), Hardware and Architecture (26 citations), Materials Chemistry (62 citations), Atomic and Molecular Physics, and Optics (17 citations) and Biomedical Engineering (16 citations). Marko Simicic has collaborated with scholars based in Belgium, Austria and United States. Frequent co-authors include Pieter Weckx, B. Kaczer, D. Linten, J. Franco, Tibor Grasser, Michael Waltl, Ph. Roussel, G. Rzepa, Geert Hellings and A. Subirats. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Solid-State Electronics, IEEE Transactions on Device and Materials Reliability and VUBIR (Vrije Universiteit Brussel).

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