Y. Hayashi

2.9k citations
219 papers · 2.1k indexed · h-index 24
Topics
Semiconductor materials and devices (126 papers)Copper Interconnects and Reliability (90 papers)Advancements in Semiconductor Devices and Circuit Design (33 papers)
Partner nations
JapanUnited StatesFrance

In The Last Decade

Y. Hayashi

209 papers receiving 2.0k citations

Peers

Y. Hayashi
Comparison fields: 5 of 68
  • Electrical and Electronic Engineering 1.8k
  • Materials Chemistry 620
  • Electronic, Optical and Magnetic Materials 528
  • Biomedical Engineering 339
  • Mechanics of Materials 169
Replace Akinobu Teramoto with:
Akinobu Teramoto Japan
Zsolt Tökei Belgium
E. G. Colgan United States
Eric Joseph United States
Jia‐Min Shieh Taiwan
Ph. Roussel Belgium
R. Reif United States
Ilgu Yun South Korea
T.S. Cale United States
Sima Dimitrijev Australia
Y. Hayashi relative to Akinobu Teramoto Japan Akinobu Teramoto's profile →
Citations per field
00.5×1.5×
Akinobu Teramoto · 1×
Citations per year

Countries citing papers authored by Y. Hayashi

Since Specialization
Citations

This map shows the geographic impact of Y. Hayashi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y. Hayashi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y. Hayashi more than expected).

Fields of papers citing papers by Y. Hayashi

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Y. Hayashi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y. Hayashi. The network helps show where Y. Hayashi may publish in the future.

Co-authorship network of co-authors of Y. Hayashi

This figure shows the co-authorship network connecting the top 25 collaborators of Y. Hayashi. A scholar is included among the top collaborators of Y. Hayashi based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Y. Hayashi. Y. Hayashi is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 23
2 4
3 3
4 6
5
High-voltage complementary BEOL-FETs on Cu interconnects using N-type IGZO and P-type SnO dual oxide semiconductor channels
10
6 3
7 35
8
A novel BEOL transistor (BETr) with InGaZnO embedded in Cu-interconnects for on-chip high voltage I/Os in standard CMOS LSIs
30
9 100
10 1
11 2
12
Single-charge-based modeling of transistor characteristics fluctuations based on statistical measurement of RTN amplitude
33
13
Technology for High Reliability System LSIs
4
14 6
15 7
16
7-Mask Self-Aligned SiGe Base Bipolar Transistors with f_T of 80 GHz
3
17 3
18 1
19 1
20 1

About Y. Hayashi

Y. Hayashi is a scholar working on Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering and Mechanics of Materials, having authored 219 papers that have together received 2.1k indexed citations. Recurring topics across this work include Semiconductor materials and devices (126 papers), Copper Interconnects and Reliability (90 papers) and Advancements in Semiconductor Devices and Circuit Design (33 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.8k citations), Electronic, Optical and Magnetic Materials (528 citations) and Materials Chemistry (620 citations). Y. Hayashi has collaborated with scholars based in Japan, United States and France. Frequent co-authors include Kiyoshi Takeuchi, N. Furutake, Toshiharu Nagumo, Takashi Yamaguchi, N. Inoue, Toshio Kimura, Munehiro Tada, Takashi Hase, K. Imai and Shinji Yokogawa. Their work appears in journals such as Journal of The Electrochemical Society, Journal of Materials Chemistry A and Journal of the American Ceramic Society.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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