J.-L. Ogier
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- Advanced Memory and Neural Computing
- Silicon Carbide Semiconductor Technologies
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- Copper Interconnects and Reliability
Papers in
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- Semiconductor materials and devices 28
- Advancements in Semiconductor Devices and Circuit Design 20
- Integrated Circuits and Semiconductor Failure Analysis 7
- Ferroelectric and Negative Capacitance Devices 6
- Advanced Memory and Neural Computing 3
- Silicon Carbide Semiconductor Technologies 2
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- Electronic and Structural Properties of Oxides 6
- Co-authors
- R. Degraeve (7 shared papers)G. Groeseneken (6 shared papers)H.E. Maes (6 shared papers)Ph. Roussel (6 shared papers)R. Bellens (3 shared papers)Michel Depas (1 shared paper)D. Goguenheim (9 shared papers)J. De Blauwe (1 shared paper)
- Journals
- Microelectronics Reliability (9 papers)Solid-State Electronics (3 papers)IEEE Transactions on Electron Devices (2 papers)Electronics Letters (2 papers)Microelectronic Engineering (1 paper)
- Partner nations
- FranceBelgiumSwitzerland
In The Last Decade
J.-L. Ogier
28 papers receiving 722 citations
J.-L. Ogier's Hit Papers
Peers
Comparison fields: 5 of 34
- Electrical and Electronic Engineering 725
- Electronic, Optical and Magnetic Materials 86
- Materials Chemistry 171
- Hardware and Architecture 22
- Condensed Matter Physics 27
Countries citing papers authored by J.-L. Ogier
This map shows the geographic impact of J.-L. Ogier's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.-L. Ogier with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.-L. Ogier more than expected).
Fields of papers citing papers by J.-L. Ogier
This network shows the impact of papers produced by J.-L. Ogier. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.-L. Ogier. The network helps show where J.-L. Ogier may publish in the future.
Co-authors
The 17 scholars most cited alongside J.-L. Ogier, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 29 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | New insights in the relation between electron trap generation and the statistical properties of oxide breakdown Hit paper breakdown → | 1998 | 515 |
| 2 | 1998 | 111 | |
| 3 | 1996 | 31 | |
| 4 | 2002 | 10 | |
| 5 | 2014 | 9 | |
| 6 | 2011 | 9 | |
| 7 | 2007 | 7 | |
| 8 | 1996 | 6 | |
| 9 | On the Polarity Dependence of Oxide Breakdown in MOS-Devices with N+ and P+ Polysilicon Gate | 1996 | 5 |
| 10 | Analysis of the Early-Failure Rate Prediction of Time-Dependent-Dielectric Breakdown in Thin Oxides | 1995 | 5 |
| 11 | 2007 | 5 | |
| 12 | 2008 | 5 | |
| 13 | 2011 | 4 | |
| 14 | 2007 | 4 | |
| 15 | 2012 | 3 | |
| 16 | 2012 | 3 | |
| 17 | 2014 | 3 | |
| 18 | 2013 | 3 | |
| 19 | 2006 | 3 | |
| 20 | 2007 | 2 |
About J.-L. Ogier
J.-L. Ogier is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Hardware and Architecture, Electronic, Optical and Magnetic Materials and Computer Networks and Communications, having authored 29 papers that have together received 754 indexed citations. Recurring topics across this work include Semiconductor materials and devices (28 papers), Advancements in Semiconductor Devices and Circuit Design (20 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Ferroelectric and Negative Capacitance Devices (6 papers), Electronic and Structural Properties of Oxides (6 papers), Advanced Memory and Neural Computing (3 papers), Silicon Carbide Semiconductor Technologies (2 papers) and VLSI and Analog Circuit Testing (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (725 citations), Electronic, Optical and Magnetic Materials (86 citations), Materials Chemistry (171 citations), Hardware and Architecture (22 citations) and Condensed Matter Physics (27 citations). J.-L. Ogier has collaborated with scholars based in France, Belgium and Switzerland. Frequent co-authors include R. Degraeve, G. Groeseneken, H.E. Maes, Ph. Roussel, R. Bellens, Michel Depas, D. Goguenheim, J. De Blauwe, Catherine Roux and H. Aziza. Their work appears in journals such as Microelectronics Reliability, Solid-State Electronics, IEEE Transactions on Electron Devices, Electronics Letters and Microelectronic Engineering.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.