Hiroaki Arimura

1.3k total citations
96 papers, 651 citations indexed

About

Hiroaki Arimura is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, Hiroaki Arimura has authored 96 papers receiving a total of 651 indexed citations (citations by other indexed papers that have themselves been cited), including 94 papers in Electrical and Electronic Engineering, 10 papers in Atomic and Molecular Physics, and Optics and 7 papers in Biomedical Engineering. Recurrent topics in Hiroaki Arimura's work include Semiconductor materials and devices (88 papers), Advancements in Semiconductor Devices and Circuit Design (71 papers) and Integrated Circuits and Semiconductor Failure Analysis (35 papers). Hiroaki Arimura is often cited by papers focused on Semiconductor materials and devices (88 papers), Advancements in Semiconductor Devices and Circuit Design (71 papers) and Integrated Circuits and Semiconductor Failure Analysis (35 papers). Hiroaki Arimura collaborates with scholars based in Belgium, Japan and United States. Hiroaki Arimura's co-authors include Naoto Horiguchi, Jérôme Mitard, Nadine Collaert, Heiji Watanabe, Liesbeth Witters, J. Franco, B. Kaczer, Lars‐Åke Ragnarsson, Roger Loo and Eddy Simoen and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Applied Surface Science.

In The Last Decade

Hiroaki Arimura

83 papers receiving 627 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Hiroaki Arimura Belgium 15 620 95 95 82 20 96 651
A. Chou United States 11 657 1.1× 71 0.7× 114 1.2× 80 1.0× 24 1.2× 24 684
M. Togo Japan 14 599 1.0× 69 0.7× 66 0.7× 62 0.8× 24 1.2× 68 619
C. D’Emic United States 11 605 1.0× 49 0.5× 197 2.1× 115 1.4× 39 1.9× 15 630
Slimane Oussalah Algeria 11 264 0.4× 46 0.5× 124 1.3× 53 0.6× 27 1.4× 57 327
Paul M. Jordan Germany 10 397 0.6× 82 0.9× 115 1.2× 93 1.1× 33 1.6× 21 421
K. Rim United States 13 661 1.1× 146 1.5× 72 0.8× 138 1.7× 10 0.5× 20 697
Reza Arghavani United States 12 450 0.7× 76 0.8× 55 0.6× 60 0.7× 27 1.4× 30 479
E. Dentoni Litta Belgium 12 414 0.7× 50 0.5× 106 1.1× 53 0.6× 30 1.5× 69 469
F. Allibert France 15 717 1.2× 176 1.9× 94 1.0× 134 1.6× 8 0.4× 69 736
I. Polishchuk United States 8 446 0.7× 48 0.5× 44 0.5× 68 0.8× 38 1.9× 17 472

Countries citing papers authored by Hiroaki Arimura

Since Specialization
Citations

This map shows the geographic impact of Hiroaki Arimura's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Hiroaki Arimura with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Hiroaki Arimura more than expected).

Fields of papers citing papers by Hiroaki Arimura

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Hiroaki Arimura. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Hiroaki Arimura. The network helps show where Hiroaki Arimura may publish in the future.

Co-authorship network of co-authors of Hiroaki Arimura

This figure shows the co-authorship network connecting the top 25 collaborators of Hiroaki Arimura. A scholar is included among the top collaborators of Hiroaki Arimura based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Hiroaki Arimura. Hiroaki Arimura is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Franco, J., Hiroaki Arimura, S. Brus, et al.. (2024). Impact of work function metal stacks on the performance and reliability of multi-V RMG CMOS technology. Solid-State Electronics. 216. 108929–108929. 1 indexed citations
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Franco, J., Hiroaki Arimura, Jean‐François de Marneffe, et al.. (2023). Novel Low Thermal Budget CMOS RMG: Performance and Reliability Benchmark Against Conventional High Thermal Budget Gate Stack Solutions. 1–2. 1 indexed citations
5.
Eyben, Pierre, Goutham Arutchelvan, T. Chiarella, et al.. (2022). Investigation of access resistance components in Si-channel p-FinFET using cascaded devices.. 1 indexed citations
6.
Eneman, Geert, A. Veloso, Paola Favia, et al.. (2021). Stress in Silicon–Germanium Nanowires: Layout Dependence and Imperfect Source/Drain Epitaxial Stressors. IEEE Transactions on Electron Devices. 68(11). 5380–5385. 7 indexed citations
7.
Wu, Zhicheng, J. Franco, Hiroaki Arimura, et al.. (2021). 3D sequential CMOS top tier devices demonstration using a low temperature Smart Cut™ Si layer transfer. 1 indexed citations
8.
Franco, J., Jean‐François de Marneffe, A. Vandooren, et al.. (2021). Low Temperature Atomic Hydrogen Treatment for Superior NBTI Reliability—Demonstration and Modeling across SiO 2 IL Thicknesses from 1.8 to 0.6 nm for I/O and Core Logic. Symposium on VLSI Technology. 1–2. 3 indexed citations
9.
Arimura, Hiroaki, Kurt Wostyn, Lars‐Åke Ragnarsson, et al.. (2020). (Invited) Si-Cap-Free Low-DIT SiGe Gate Stack for High-Performance pFETs. ECS Transactions. 98(5). 377–386.
10.
Eneman, Geert, A. Veloso, Paola Favia, et al.. (2020). (Invited) Stress Simulations of Fins, Wires, and Nanosheets. ECS Meeting Abstracts. MA2020-02(24). 1737–1737. 1 indexed citations
11.
Eneman, Geert, A. Veloso, Paola Favia, et al.. (2020). (Invited) Stress Simulations of Fins, Wires, and Nanosheets. ECS Transactions. 98(5). 253–265. 11 indexed citations
12.
Arimura, Hiroaki, G. Boccardi, Nadine Collaert, et al.. (2020). Low-Frequency Noise Characterization of Germanium n-Channel FinFETs. IEEE Transactions on Electron Devices. 67(7). 2872–2877. 10 indexed citations
13.
Simoen, Eddy, et al.. (2020). Impact of Dummy Gate Removal and a Silicon Cap on the Low-Frequency Noise Performance of Germanium nFinFETs. IEEE Transactions on Electron Devices. 67(11). 4713–4719. 8 indexed citations
14.
Hiblot, Gaspard, Hiroaki Arimura, Liesbeth Witters, et al.. (2019). Observation of Plasma-Induced Damage in Bulk Germanium ${p}$ -Type FinFET Devices and Curing in High-Pressure Anneal. IEEE Transactions on Device and Materials Reliability. 19(2). 468–470. 6 indexed citations
15.
Arimura, Hiroaki, Harold Dekkers, Lars‐Åke Ragnarsson, et al.. (2019). Record GmSAT/SSSAT and PBTI Reliability in Si-Passivated Ge nFinFETs by Improved Gate-Stack Surface Preparation. IEEE Transactions on Electron Devices. 66(12). 5387–5392. 4 indexed citations
16.
Favia, Paola, Olivier Richard, Geert Eneman, et al.. (2019). TEM investigations of gate-all-around nanowire devices. Semiconductor Science and Technology. 34(12). 124003–124003. 8 indexed citations
17.
Arimura, Hiroaki, Sonja Sioncke, Daire Cott, et al.. (2016). Si-passivated Ge nFET towards a reliable Ge CMOS. 1 indexed citations
18.
Arimura, Hiroaki, Sonja Sioncke, Daire Cott, et al.. (2015). Ge nFET with high electron mobility and superior PBTI reliability enabled by monolayer-Si surface passivation and La-induced interface dipole formation. 21.6.1–21.6.4. 27 indexed citations
19.
Groeseneken, G., J. Franco, M. Cho, et al.. (2014). BTI reliability of advanced gate stacks for Beyond-Silicon devices: Challenges and opportunities. 34.4.1–34.4.4. 30 indexed citations
20.
Yamamoto, Takashi, Masahiro Kunisu, Koji Kita, et al.. (2011). Electronic Structure Characterization of La Incorporated Hf-Based High-<I>k</I> Gate Dielectrics by NEXAFS. Journal of Nanoscience and Nanotechnology. 11(4). 2823–2828. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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