Hiroaki Arimura
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- Semiconductor materials and devices 88
- Advancements in Semiconductor Devices and Circuit Design 71
- Integrated Circuits and Semiconductor Failure Analysis 35
- Ferroelectric and Negative Capacitance Devices 26
- Thin-Film Transistor Technologies 7
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- Semiconductor materials and interfaces 9
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- Nanowire Synthesis and Applications 7
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- Electronic and Structural Properties of Oxides 5
- Co-authors
- Naoto HoriguchiJérôme MitardNadine CollaertHeiji WatanabeLiesbeth WittersJ. FrancoB. KaczerLars‐Åke Ragnarsson
- Cited by
- Electrical and Electronic EngineeringAtomic and Molecular Physics, and OpticsBiomedical Engineering
- Journals
- IEEE Transactions on Electron Devices (12 papers)Japanese Journal of Applied Physics (5 papers)Applied Physics Letters (4 papers)
- Partner nations
- BelgiumJapanUnited States
In The Last Decade
Hiroaki Arimura
83 papers receiving 627 citations
Peers
Comparison fields: 5 of 26
- Electrical and Electronic Engineering 620
- Atomic and Molecular Physics, and Optics 82
- Biomedical Engineering 95
- Structural Biology 3
- Materials Chemistry 95
Countries citing papers authored by Hiroaki Arimura
This map shows the geographic impact of Hiroaki Arimura's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Hiroaki Arimura with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Hiroaki Arimura more than expected).
Fields of papers citing papers by Hiroaki Arimura
This network shows the impact of papers produced by Hiroaki Arimura. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Hiroaki Arimura. The network helps show where Hiroaki Arimura may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Hiroaki Arimura, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 1 | |
| 2 | 2024 | 2 | |
| 3 | 2024 | 6 | |
| 4 | 2023 | 1 | |
| 5 | 2022 | 1 | |
| 6 | 2021 | 7 | |
| 7 | 2021 | 1 | |
| 8 | Low Temperature Atomic Hydrogen Treatment for Superior NBTI Reliability—Demonstration and Modeling across SiO 2 IL Thicknesses from 1.8 to 0.6 nm for I/O and Core Logic | 2021 | 3 |
| 9 | 2020 | 0 | |
| 10 | 2020 | 1 | |
| 11 | 2020 | 11 | |
| 12 | 2020 | 10 | |
| 13 | 2020 | 8 | |
| 14 | 2019 | 6 | |
| 15 | 2019 | 4 | |
| 16 | 2019 | 8 | |
| 17 | 2016 | 1 | |
| 18 | 2015 | 27 | |
| 19 | 2014 | 30 | |
| 20 | 2011 | 4 |
About Hiroaki Arimura
Hiroaki Arimura is a scholar working on Electrical and Electronic Engineering, Structural Biology and Atomic and Molecular Physics, and Optics, having authored 96 papers that have together received 651 indexed citations. Recurring topics across this work include Semiconductor materials and devices (88 papers), Advancements in Semiconductor Devices and Circuit Design (71 papers), Integrated Circuits and Semiconductor Failure Analysis (35 papers), Ferroelectric and Negative Capacitance Devices (26 papers), Semiconductor materials and interfaces (9 papers), Nanowire Synthesis and Applications (7 papers), Thin-Film Transistor Technologies (7 papers) and Electronic and Structural Properties of Oxides (5 papers). The work is most often cited by research in Electrical and Electronic Engineering (620 citations), Atomic and Molecular Physics, and Optics (82 citations) and Biomedical Engineering (95 citations). Hiroaki Arimura has collaborated with scholars based in Belgium, Japan and United States. Frequent co-authors include Naoto Horiguchi, Jérôme Mitard, Nadine Collaert, Heiji Watanabe, Liesbeth Witters, J. Franco, B. Kaczer, Lars‐Åke Ragnarsson, Roger Loo and Eddy Simoen. Their work appears in journals such as IEEE Transactions on Electron Devices, Japanese Journal of Applied Physics, Applied Physics Letters, ECS Journal of Solid State Science and Technology and IEEE Transactions on Device and Materials Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.