Thierry Conard

7.2k total citations
368 papers, 5.6k citations indexed

About

Thierry Conard is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Surfaces, Coatings and Films. According to data from OpenAlex, Thierry Conard has authored 368 papers receiving a total of 5.6k indexed citations (citations by other indexed papers that have themselves been cited), including 300 papers in Electrical and Electronic Engineering, 118 papers in Materials Chemistry and 75 papers in Surfaces, Coatings and Films. Recurrent topics in Thierry Conard's work include Semiconductor materials and devices (232 papers), Electron and X-Ray Spectroscopy Techniques (70 papers) and Advancements in Semiconductor Devices and Circuit Design (63 papers). Thierry Conard is often cited by papers focused on Semiconductor materials and devices (232 papers), Electron and X-Ray Spectroscopy Techniques (70 papers) and Advancements in Semiconductor Devices and Circuit Design (63 papers). Thierry Conard collaborates with scholars based in Belgium, Germany and Netherlands. Thierry Conard's co-authors include Marc Heyns, Stefan De Gendt, Matty Caymax, Annelies Delabie, Sven Van Elshocht, Wilfried Vandervorst, Marc Meuris, H. Bender, Alexis Franquet and Michel Houssa and has published in prestigious journals such as The Journal of Chemical Physics, Nano Letters and ACS Nano.

In The Last Decade

Thierry Conard

350 papers receiving 5.4k citations

Peers

Countries citing papers authored by Thierry Conard

Since Specialization

Citations

This map shows the geographic impact of Thierry Conard's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thierry Conard with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thierry Conard more than expected).

Fields of papers citing papers by Thierry Conard

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Thierry Conard. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thierry Conard. The network helps show where Thierry Conard may publish in the future.

Co-authorship network of co-authors of Thierry Conard

This figure shows the co-authorship network connecting the top 25 collaborators of Thierry Conard. A scholar is included among the top collaborators of Thierry Conard based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Thierry Conard. Thierry Conard is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	InAs Colloidal Quantum Dot Photodiode Stack for CMOS-Integrated Infrared Imaging 2025 ·ACS Nano ·Abu Bakar Siddik, Wenya Song, Epimitheas Georgitzikis, (unknown), (unknown), (unknown), Itai Lieberman, Paweł E. Malinowski, Thierry Conard, David Cheyns, Paul Heremans	0
2	Achieving High Ferroelectric Polarization in Ultrathin BaTiO₃ Films on Si 2024 ·Advanced Electronic Materials ·(unknown), (unknown), Pieter Lagrain, Stefanie Sergeant, I. Hoflijk, (unknown), (unknown), Thierry Conard, Jan Van Houdt, Ingrid De Wolf, S. R. C. McMitchell	3
3	Influence of thickness scaling on the electronic structure and optical properties of oxygen deficient BaBiO3-δ thin films grown on SrTiO3-buffered Si(001) substrate 2024 ·APL Materials ·(unknown), M. Korytov, Stefanie Sergeant, Thomas Nuytten, Thierry Conard, Stefan De Gendt, Clément Merckling	2
4	New challenges associated with hard X‐ray photoelectron spectroscopy (report on the 2023 ASTM E42‐ASSD AVS workshop) 2024 ·Surface and Interface Analysis ·Alberto Herrera‐Gómez, David J. H. Cant, Thierry Conard, O. Renault, Matthew R. Linford, (unknown), (unknown), Donald R. Baer	5
5	Impact of monolayer WS2 surface properties on the gate dielectrics formation by atomic layer deposition 2024 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·(unknown), (unknown), Daire Cott, Benjamin Groven, Stefanie Sergeant, Thierry Conard, Xiangyu Wu, (unknown), Dennis Lin, César Javier Lockhart de la Rosa, Gouri Sankar Kar, Annelies Delabie	0
6	PbS and InAs Quantum-Dot Thin Films for Short-Wave Infrared Detectors 2024 ·ACS Applied Nano Materials ·Abu Bakar Siddik, Epimitheas Georgitzikis, Wenya Song, (unknown), (unknown), (unknown), Vladimir Pejović, Itai Lieberman, Paweł E. Malinowski, Jan Genoe, Thierry Conard, David Cheyns, Paul Heremans	3
7	Intensity-energy response function of Al/Cr-Kα x-ray photoemission instruments: An inter-laboratory study 2024 ·Journal of Electron Spectroscopy and Related Phenomena ·David Alamarguy, Damien Aureau, Thierry Conard, Nicolas Gauthier, (unknown), (unknown), Samar Hajjar‐Garreau, Olivier Heintz, Guillaume Monier, Christophe Méthivier, (unknown), (unknown), O. Renault, Rémi Lazzari	2
8	Transient-assisted plasma etching (TAPE): Concept, mechanism, and prospects 2024 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·(unknown), (unknown), Maxime Darnon, (unknown), Thierry Conard, I. Hoflijk, Frédéric Lazzarino, Stefan De Gendt	1
9	Top-Gate Stack Engineering Featuring a High-κ Gadolinium Aluminate Interfacial Layer for Field-Effect Transistors Based on Two-Dimensional Transition-Metal Dichalcogenides 2024 ·ACS Applied Electronic Materials ·(unknown), Xiangyu Wu, Daire Cott, Yuanyuan Shi, Henry Medina, Stefanie Sergeant, Thierry Conard, Johan Meersschaut, Ankit Nalin Mehta, Benjamin Groven, P. Morin, Inge Asselberghs, César Javier Lockhart de la Rosa, Gouri Sankar Kar, Dennis Lin, Annelies Delabie	4
10	Interface-Engineered Organic Near-Infrared Photodetector for Imaging Applications 2023 ·ACS Applied Materials & Interfaces ·Abu Bakar Siddik, Epimitheas Georgitzikis, Yannick Hermans, (unknown), Joo Hyoung Kim, Vladimir Pejović, Itai Lieberman, Paweł E. Malinowski, (unknown), Jan Genoe, Thierry Conard, David Cheyns, Paul Heremans	25
11	Photoemission spectroscopy on photoresist materials: A protocol for analysis of radiation sensitive materials 2023 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·(unknown), (unknown), Kevin M. Dorney, D. P. Singh, Fabian Holzmeier, Michiel J. van Setten, Stefan De Gendt, Thierry Conard	5
12	High energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk bismuth 2023 ·Surface Science Spectra ·(unknown), I. Hoflijk, I. Vaesen, (unknown), Kateryna Artyushkova, Thierry Conard	1
13	Properties of ultrathin molybdenum films for interconnect applications 2022 ·Materialia ·(unknown), Jean-Philippe Soulié, Kiroubanand Sankaran, Kris Vanstreels, Karl Opsomer, P. Morin, Pieter Lagrain, Alexis Franquet, Danielle Vanhaeren, Thierry Conard, Johan Meersschaut, Christophe Detavernier, Joris Van de Vondel, Ingrid De Wolf, Geoffrey Pourtois, Zsolt Tökei, Johan Swerts, Christoph Adelmann	36
14	Self-assembled monolayers as inhibitors for area-selective deposition: A novel approach towards resist-less EUV lithography 2022 ·Applied Surface Science ·(unknown), Ivan Pollentier, Thierry Conard, (unknown), Stefan De Gendt, Silvia Armini	9
15	Chemical Etching of GaN in KOH Solution: Role of Surface Polarity and Prior Photoetching 2022 ·The Journal of Physical Chemistry C ·J.L. Weyher, Dennis H. van Dorp, Thierry Conard, G. Nowak, (unknown), J. J. Kelly	25
16	(Invited) Si-Cap-Free Low-D_IT SiGe Gate Stack for High-Performance pFETs 2020 ·ECS Transactions ·Hiroaki Arimura, Kurt Wostyn, Lars‐Åke Ragnarsson, Thierry Conard, Adrian Chasin, J. Franco, Jérôme Mitard, Naoto Horiguchi	0
17	Peculiar alignment and strain of 2D WSe ₂ grown by van der Waals epitaxy on reconstructed sapphire surfaces 2019 ·Nanotechnology ·Wouter Mortelmans, Salim El Kazzi, Ankit Nalin Mehta, Danielle Vanhaeren, Thierry Conard, Johan Meersschaut, Thomas Nuytten, Stefan De Gendt, Marc Heyns, Clément Merckling	25
18	Record Gm_SAT/SS_SAT and PBTI Reliability in Si-Passivated Ge nFinFETs by Improved Gate-Stack Surface Preparation 2019 ·IEEE Transactions on Electron Devices ·Hiroaki Arimura, Harold Dekkers, Lars‐Åke Ragnarsson, Jérôme Mitard, V. De Heyn, D. Mocuta, Nadine Collaert, Naoto Horiguchi, Daire Cott, G. Boccardi, Roger Loo, Kurt Wostyn, Liesbeth Witters, Thierry Conard, Samuel Suhard, Dennis H. van Dorp	4
19	Impact of SiON tunnel layer composition on 3D NAND cell performance 2019 ·L. Breuil, Laura Nyns, Kaustuv Banerjee, (unknown), A. Subirats, Olivier Richard, Thierry Conard, G. Van den bosch, A. Furnémont	10
20	Si-passivated Ge nFET towards a reliable Ge CMOS 2016 ·Hiroaki Arimura, Sonja Sioncke, Daire Cott, Jérôme Mitard, Wendy Vanherle, Roger Loo, J. Franco, Thierry Conard, Paola Favia, H. Bender, Liesbeth Witters, Hans Mertens, L.-Å. Ragnarsson, G. Pourtois, Marc Heyns, A. Mocuta, Aaron Thean, D. Mocuta, Nadine Collaert	1

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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