E. A. Irene

7.4k total citations
215 papers, 5.8k citations indexed

About

E. A. Irene is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, E. A. Irene has authored 215 papers receiving a total of 5.8k indexed citations (citations by other indexed papers that have themselves been cited), including 170 papers in Electrical and Electronic Engineering, 84 papers in Materials Chemistry and 47 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in E. A. Irene's work include Semiconductor materials and devices (100 papers), Thin-Film Transistor Technologies (58 papers) and Silicon Nanostructures and Photoluminescence (54 papers). E. A. Irene is often cited by papers focused on Semiconductor materials and devices (100 papers), Thin-Film Transistor Technologies (58 papers) and Silicon Nanostructures and Photoluminescence (54 papers). E. A. Irene collaborates with scholars based in United States, Australia and China. E. A. Irene's co-authors include Hisham Z. Massoud, E. Kobeda, J.D. Plummer, E. Tierney, Royce W. Murray, Yi Hu, Donald R. Young, R. Ghez, D. W. Dong and J. Angilello and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

E. A. Irene

211 papers receiving 5.5k citations

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author Last Decade Papers Cites
E. A. Irene 4.6k 2.7k 1.3k 930 568 215 5.8k
R. Swanepoel 3.2k 0.7× 3.6k 1.3× 567 0.4× 663 0.7× 304 0.5× 22 4.4k
John R. Abelson 3.4k 0.7× 3.8k 1.4× 854 0.6× 739 0.8× 406 0.7× 210 5.5k
Yoshihiro Hamakawa 7.3k 1.6× 6.2k 2.3× 2.3k 1.7× 1.0k 1.1× 274 0.5× 492 9.4k
Gerd Duscher 3.1k 0.7× 4.5k 1.7× 761 0.6× 1.3k 1.4× 379 0.7× 213 7.0k
J. J. Cuomo 3.4k 0.7× 3.2k 1.2× 1.4k 1.0× 693 0.7× 1.0k 1.8× 138 6.3k
S. T. Picraux 4.5k 1.0× 2.8k 1.0× 2.0k 1.5× 1.3k 1.4× 1.0k 1.8× 165 6.8k
F. Phillipp 2.4k 0.5× 3.5k 1.3× 1.2k 0.9× 827 0.9× 165 0.3× 158 4.9k
M. Vaněček 4.3k 0.9× 4.0k 1.5× 819 0.6× 974 1.0× 359 0.6× 162 5.8k
V. R. Deline 3.0k 0.7× 2.6k 1.0× 1.1k 0.8× 433 0.5× 840 1.5× 108 4.9k
J. Bruley 2.3k 0.5× 2.8k 1.0× 788 0.6× 796 0.9× 315 0.6× 136 4.4k

Countries citing papers authored by E. A. Irene

Since Specialization
Citations

This map shows the geographic impact of E. A. Irene's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. A. Irene with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. A. Irene more than expected).

Fields of papers citing papers by E. A. Irene

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. A. Irene. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. A. Irene. The network helps show where E. A. Irene may publish in the future.

Co-authorship network of co-authors of E. A. Irene

This figure shows the co-authorship network connecting the top 25 collaborators of E. A. Irene. A scholar is included among the top collaborators of E. A. Irene based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with E. A. Irene. E. A. Irene is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Losurdo, María, Maria M. Giangregorio, Giovanni Bruno, et al.. (2007). Er 2 O 3 as a high-K dielectric candidate. Applied Physics Letters. 91(9). 56 indexed citations
2.
Irene, E. A., et al.. (2006). A study of HfO2 film interfaces with Si and SiO2. Journal of Applied Physics. 99(2). 15 indexed citations
3.
Irene, E. A.. (2001). Ultra-thin SiO2 film studies: index, thickness, roughness and the initial oxidation regime. Solid-State Electronics. 45(8). 1207–1217. 27 indexed citations
4.
Michaelis, A., E. A. Irene, Orlando Auciello, A.R. Krauss, & B. W. Veal. (1998). A spectroscopic anisotropy ellipsometry study of YBa2Cu3O7−x superconductors. Thin Solid Films. 313-314. 362–367. 5 indexed citations
5.
Irene, E. A., et al.. (1996). Insitu investigation of the passivation of Si and Ge by electron cyclotron resonance plasma enhanced chemical vapor deposition of SiO2. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(3). 1687–1696. 10 indexed citations
6.
Irene, E. A., et al.. (1995). Real-time monitoring of the deposition and growth of thin organic films by in situ ellipsometry. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 13(5). 2348–2354. 8 indexed citations
7.
Irene, E. A., et al.. (1994). Investigation of roughened silicon surfaces using fractal analysis. II. Chemical etching, rapid thermal chemical vapor deposition, and thermal oxidation. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 12(5). 2653–2661. 26 indexed citations
8.
Higashi, G. S., et al.. (1993). Surface chemical cleaning and passivation for semiconductor processing. 27 indexed citations
9.
Irene, E. A., et al.. (1993). Ellipsometry investigation of nucleation and growth of electron cyclotron resonance plasma deposited silicon films. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 11(4). 1686–1691. 5 indexed citations
10.
Irene, E. A., et al.. (1993). Infrared rotating-analyzer ellipsometry: calibration and data processing. Journal of the Optical Society of America A. 10(3). 509–509. 1 indexed citations
11.
Poler, Jordan C., W. S. Woodward, & E. A. Irene. (1993). Novel charge integrating pulsed I(V) technique: A measurement of Fowler–Nordheim currents through thin SiO2 films. Review of Scientific Instruments. 64(3). 781–787. 1 indexed citations
13.
Irene, E. A., et al.. (1992). An Oxygen Tracer Study of InP Oxidation. Journal of The Electrochemical Society. 139(3). 799–802. 5 indexed citations
14.
Irene, E. A., et al.. (1991). In Situ Differential Reflectance Study of the Etching of SiO2 Films. Journal of The Electrochemical Society. 138(1). 308–313. 8 indexed citations
15.
Kalnitsky, A., et al.. (1990). Measurements and Modeling of Thin Silicon Dioxide Films on Silicon. Journal of The Electrochemical Society. 137(1). 234–238. 56 indexed citations
16.
Fitch, J. T., G. Lucovsky, E. Kobeda, & E. A. Irene. (1989). Effects of thermal history on stress-related properties of very thin films of thermally grown silicon dioxide. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 7(2). 153–162. 112 indexed citations
17.
Choi, Seong Soo, et al.. (1987). Redistribution of arsenic in silicon during high pressure thermal oxidation. Applied Physics Letters. 50(11). 688–690. 9 indexed citations
18.
Irene, E. A.. (1976). Residual stress in silicon nitride films. Journal of Electronic Materials. 5(3). 287–298. 59 indexed citations
19.
Irene, E. A., et al.. (1973). The chemical transport rates and crystal Morphology of GeSe. Zeitschrift für anorganische und allgemeine Chemie. 400(1). 59–66. 20 indexed citations
20.
Wiedemeier, Heribert, et al.. (1972). Crystal growth by vapor transport of GeSe, GeSe2, and GeTe and transport mechanism and morphology of GeTe. Journal of Crystal Growth. 13-14. 393–396. 27 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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