Wilfried Vandervorst

13.4k total citations
650 papers, 10.4k citations indexed

About

Wilfried Vandervorst is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, Wilfried Vandervorst has authored 650 papers receiving a total of 10.4k indexed citations (citations by other indexed papers that have themselves been cited), including 524 papers in Electrical and Electronic Engineering, 251 papers in Atomic and Molecular Physics, and Optics and 147 papers in Biomedical Engineering. Recurrent topics in Wilfried Vandervorst's work include Semiconductor materials and devices (261 papers), Integrated Circuits and Semiconductor Failure Analysis (242 papers) and Force Microscopy Techniques and Applications (124 papers). Wilfried Vandervorst is often cited by papers focused on Semiconductor materials and devices (261 papers), Integrated Circuits and Semiconductor Failure Analysis (242 papers) and Force Microscopy Techniques and Applications (124 papers). Wilfried Vandervorst collaborates with scholars based in Belgium, United States and Netherlands. Wilfried Vandervorst's co-authors include H. Bender, Trudo Clarysse, Matty Caymax, Thomas Hantschel, Riikka L. Puurunen, Umberto Celano, Marc Heyns, Olivier Richard, Roger Loo and Thierry Conard and has published in prestigious journals such as Physical Review Letters, The Journal of Chemical Physics and Nano Letters.

In The Last Decade

Wilfried Vandervorst

634 papers receiving 10.0k citations

Peers

Countries citing papers authored by Wilfried Vandervorst

Since Specialization

Citations

This map shows the geographic impact of Wilfried Vandervorst's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Wilfried Vandervorst with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Wilfried Vandervorst more than expected).

Fields of papers citing papers by Wilfried Vandervorst

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Wilfried Vandervorst. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Wilfried Vandervorst. The network helps show where Wilfried Vandervorst may publish in the future.

Co-authorship network of co-authors of Wilfried Vandervorst

This figure shows the co-authorship network connecting the top 25 collaborators of Wilfried Vandervorst. A scholar is included among the top collaborators of Wilfried Vandervorst based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Wilfried Vandervorst. Wilfried Vandervorst is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	OrbiSIMS depth profiling of semiconductor materials—Useful yield and depth resolution 2024 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·Yundong Zhou, Alexis Franquet, Valentina Spampinato, A. Merkulov, Michael R. Keenan, P.A.W. van der Heide, Gustavo F. Trindade, Wilfried Vandervorst, Ian S. Gilmore	4
2	Influence of the Emitter Shape on the Field-of-View in Atom Probe Tomography 2024 ·Microscopy and Microanalysis ·(unknown), (unknown), Janusz Bogdanowicz, (unknown), Olivier Richard, Wilfried Vandervorst, Claudia Fleischmann	0
3	Unravelling stacking order in epitaxial bilayer MX ₂ using 4D-STEM with unsupervised learning 2020 ·Nanotechnology ·Ankit Nalin Mehta, Nicolas Gauquelin, Magnus Nord, Andrey Orekhov, H. Bender, (unknown), Johan Verbeeck, Wilfried Vandervorst	17
4	Grain-Boundary-Induced Strain and Distortion in Epitaxial Bilayer MoS₂ Lattice 2020 ·The Journal of Physical Chemistry C ·Ankit Nalin Mehta, (unknown), Geoffrey Pourtois, (unknown), Benjamin Groven, H. Bender, Paola Favia, Matty Caymax, Wilfried Vandervorst	19
5	Low temperature epitaxial growth of Ge:B and Ge _0.99 Sn _0.01 :B source/drain for Ge pMOS devices: in-situ and conformal B-doping, selectivity towards oxide and nitride with no need for any post-epi activation treatment 2019 ·Japanese Journal of Applied Physics ·Anurag Vohra, Clément Porret, David Kohen, (unknown), (unknown), Marc Schaekers, John Tolle, Andriy Hikavyy, E. Capogreco, Liesbeth Witters, R. Langer, Wilfried Vandervorst, Roger Loo	11
6	Effects of buried grain boundaries in multilayer MoS ₂ 2019 ·Nanotechnology ·Jonathan Ludwig, Ankit Nalin Mehta, (unknown), Umberto Celano, Daniele Chiappe, H. Bender, Wilfried Vandervorst, Kristof Paredis	21
7	Chemical vapor deposition of monolayer-thin WS2 crystals from the WF6 and H2S precursors at low deposition temperature 2019 ·The Journal of Chemical Physics ·Benjamin Groven, (unknown), Ankit Nalin Mehta, H. Bender, Wilfried Vandervorst, Marc Heyns, Matty Caymax, Iuliana Radu, Annelies Delabie	11
8	Heavily phosphorus doped germanium: Strong interaction of phosphorus with vacancies and impact of tin alloying on doping activation 2019 ·Journal of Applied Physics ·Anurag Vohra, (unknown), J. Slotte, Ilja Makkonen, Geoffrey Pourtois, Clément Porret, Roger Loo, Wilfried Vandervorst	6
9	Atom probe of GaN/AlGaN heterostructures: The role of electric field, sample crystallography and laser excitation on quantification 2019 ·Ultramicroscopy ·R. J. H. Morris, (unknown), (unknown), Ming Zhao, Paul van der Heide, Wilfried Vandervorst	19
10	Laser-assisted atom probe tomography of semiconductors: The impact of the focused-ion beam specimen preparation 2018 ·Ultramicroscopy ·Janusz Bogdanowicz, (unknown), Claudia Fleischmann, M. Gilbert, Jonathan Houard, Angela Vella, Wilfried Vandervorst	16
11	Development and Synchrotron‐Based Characterization of Al and Cr Nanostructures as Potential Calibration Samples for 3D Analytical Techniques 2017 ·physica status solidi (a) ·(unknown), Federico Ferrarese Lupi, Philipp Hönicke, Yves Kayser, Burkhard Beckhoff, Thomas Weimann, Claudia Fleischmann, Wilfried Vandervorst, Pavo Dubček, B. Pivac, Michele Perego, Gabriele Seguini, Natascia De Leo, Luca Boarino	10
12	Structural characterization of SnS crystals formed by chemical vapour deposition 2017 ·Journal of Microscopy ·Ankit Nalin Mehta, Haodong Zhang, (unknown), Olivier Richard, Paola Favia, H. Bender, Annelies Delabie, Matty Caymax, Michel Houssa, Geoffrey Pourtois, Wilfried Vandervorst	18
13	Local traps as nanoscale reaction-diffusion probes: B clustering in c-Si 2014 ·Applied Physics Letters ·Bartek Pawlak, N. E. B. Cowern, (unknown), Wilfried Vandervorst, R. Gwilliam, J. G. M. van Berkum	1
14	Laser pulsing of field evaporation in atom probe tomography 2013 ·Current Opinion in Solid State and Materials Science ·Thomas F. Kelly, (unknown), Joseph H. Bunton, Jonathan Houard, Elena P. Silaeva, Janusz Bogdanowicz, Wilfried Vandervorst	61
15	Heated implantation with amorphous Carbon CMOS mask for scaled FinFETs 2013 ·Symposium on VLSI Technology ·M. Togo, (unknown), (unknown), G. Boccardi, R. Ritzenthaler, (unknown), (unknown), B. Colombeau, (unknown), (unknown), S. Brus, (unknown), G. Mannaert, Harold Dekkers, Geert Hellings, Naoto Horiguchi, Wilfried Vandervorst, Aaron Thean	6
16	Atomic insight into Ge1−xSnx using atom probe tomography 2013 ·Ultramicroscopy ·(unknown), Manu Perumkunnil, (unknown), (unknown), (unknown), Federica Gencarelli, Benjamin Vincent, Wilfried Vandervorst	10
17	Conformal ultra shallow junctions by vapor phase doping with boron 2008 ·Open Repository and Bibliography (University of Liège) ·Ngoc Duy Nguyen, Frederik Leys, Shotaro Takeuchi, Roger Loo, Matty Caymax, Pierre Eyben, Wilfried Vandervorst	1
18	Laser-annealed junctions with advanced CMOS gate stacks for 32nm node: perspectives on device performance and manufacturability 2008 ·C. Ortolland, (unknown), T. Chiarella, Stefan Kubicek, C. Kerner, Wilfried Vandervorst, A. Opdebeeck, C. Vrancken, Naoto Horiguchi, Muriel de Potter de ten Broeck, M. Aoulaiche, Erik Rosseel, Susan B. Felch, (unknown), R.J. Schreutelkamp, (unknown), (unknown)	4
19	Nanopotentiometry: Data Interpretation and Quantification 1999 ·European Solid-State Device Research Conference ·Bart Haegeman, Thomas Trenkler, Pierre Eyben, Wilfried Vandervorst, Peter Wolf, L. Hellemans	0
20	Local Potential Measurements in Silicon Devices using Atomic Force Microscopy with Conductive Tips 1995 ·European Solid-State Device Research Conference ·Thomas Trenkler, Peter Wolf, J. Snauwaert, (unknown), Wilfried Vandervorst, L. Hellemans	1

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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