O. Renault
- Structural Biology top 2%
- Surfaces, Coatings and Films top 1%
- Electron and X-Ray Spectroscopy Techniques 53
- Materials Chemistry top 2%
- Electronic and Structural Properties of Oxides 35
- Graphene research and applications 19
- 2D Materials and Applications 14
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- Semiconductor materials and devices 73
- Integrated Circuits and Semiconductor Failure Analysis 27
- Advancements in Photolithography Techniques 15
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- X-ray Spectroscopy and Fluorescence Analysis 14
O. Renault
155 papers receiving 3.4k citations
Peers
Comparison fields: 5 of 90
- Structural Biology 96
- Surfaces, Coatings and Films 438
- Materials Chemistry 2.0k
- Electrical and Electronic Engineering 2.2k
- Electronic, Optical and Magnetic Materials 409
Countries citing papers authored by O. Renault
This map shows the geographic impact of O. Renault's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by O. Renault with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites O. Renault more than expected).
Fields of papers citing papers by O. Renault
This network shows the impact of papers produced by O. Renault. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by O. Renault. The network helps show where O. Renault may publish in the future.
Co-authorship network
The 25 scholars most cited alongside O. Renault, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 5 | |
| 2 | 2024 | 4 | |
| 3 | 2023 | 3 | |
| 4 | 2022 | 2 | |
| 5 | 2022 | 3 | |
| 6 | 2022 | 5 | |
| 7 | 2022 | 4 | |
| 8 | 2022 | 3 | |
| 9 | 2022 | 3 | |
| 10 | 2022 | 12 | |
| 11 | 2021 | 3 | |
| 12 | 2020 | 36 | |
| 13 | 2019 | 13 | |
| 14 | 2018 | 44 | |
| 15 | 2018 | 66 | |
| 16 | 2018 | 8 | |
| 17 | 2017 | 33 | |
| 18 | 2017 | 13 | |
| 19 | Chemical interface analysis of as grown HfO[sub 2] ultrathin films on SiO[sub 2] | 2007 | 3 |
| 20 | 1999 | 1 |
About O. Renault
O. Renault is a scholar working on Structural Biology, Surfaces, Coatings and Films and Electrical and Electronic Engineering, having authored 163 papers that have together received 3.4k indexed citations. Recurring topics across this work include Semiconductor materials and devices (73 papers), Electron and X-Ray Spectroscopy Techniques (53 papers), Electronic and Structural Properties of Oxides (35 papers), Integrated Circuits and Semiconductor Failure Analysis (27 papers), Graphene research and applications (19 papers), Advancements in Photolithography Techniques (15 papers), 2D Materials and Applications (14 papers) and X-ray Spectroscopy and Fluorescence Analysis (14 papers). The work is most often cited by research in Structural Biology (96 citations), Surfaces, Coatings and Films (438 citations) and Materials Chemistry (2.0k citations). O. Renault has collaborated with scholars based in France, Germany and United Kingdom. Frequent co-authors include N. Barrett, F. Martín, D. Rouchon, J.-F. Damlencourt, E. Martínez, Victor Christou, M. Etchells, Oleg V. Salata, P.J. Dobson and S. Marthon. Their work appears in journals such as Applied Physics Letters, Surface and Interface Analysis, Journal of Applied Physics, Applied Surface Science and Journal of Electron Spectroscopy and Related Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.