F. Phillipp

5.9k total citations · 1 hit paper
158 papers, 4.9k citations indexed

About

F. Phillipp is a scholar working on Materials Chemistry, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, F. Phillipp has authored 158 papers receiving a total of 4.9k indexed citations (citations by other indexed papers that have themselves been cited), including 98 papers in Materials Chemistry, 79 papers in Electrical and Electronic Engineering and 66 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in F. Phillipp's work include Semiconductor Quantum Structures and Devices (37 papers), Semiconductor materials and devices (35 papers) and Silicon Nanostructures and Photoluminescence (20 papers). F. Phillipp is often cited by papers focused on Semiconductor Quantum Structures and Devices (37 papers), Semiconductor materials and devices (35 papers) and Silicon Nanostructures and Photoluminescence (20 papers). F. Phillipp collaborates with scholars based in Germany, China and United States. F. Phillipp's co-authors include Guowen Meng, Linjie Zhang, Yangfang Li, N. Y. Jin-Phillipp, Yong Lei, Changhai Liang, M. Hohenstein, K. Ploog, O. Brandt and Andreas Schaper and has published in prestigious journals such as Science, Physical Review Letters and Advanced Materials.

In The Last Decade

F. Phillipp

152 papers receiving 4.8k citations

Hit Papers

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What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Ordered semiconductor ZnO nanowire arrays and their photoluminescence properties

2000 865 citations F. Phillipp et al. Applied Physics Letters profile →

Peers

Countries citing papers authored by F. Phillipp

Since Specialization

Citations

This map shows the geographic impact of F. Phillipp's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Phillipp with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Phillipp more than expected).

Fields of papers citing papers by F. Phillipp

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. Phillipp. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Phillipp. The network helps show where F. Phillipp may publish in the future.

Co-authorship network of co-authors of F. Phillipp

This figure shows the co-authorship network connecting the top 25 collaborators of F. Phillipp. A scholar is included among the top collaborators of F. Phillipp based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. Phillipp. F. Phillipp is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Metal‐Catalyzed Growth of Semiconductor Nanostructures Without Solubility and Diffusivity Constraints 2010 ·Advanced Materials ·Zumin Wang, Lin Gu, F. Phillipp, (unknown), Lars P. H. Jeurgens, E. J. Mittemeijer	38
2	Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications 2010 ·Journal of Microscopy ·J. Ratajczak, (unknown), (unknown), J. Kątcki, F. Phillipp, Peter A. van Aken, Nicolas Reckinger, (unknown)	5
3	Transmission electron microscopy characterization of Au/Pt/Ti/Pt/GaAs ohmic contacts for high power GaAs/InGaAs semiconductor lasers 2009 ·Journal of Microscopy ·(unknown), A. Czerwiński, J. Ratajczak, Anna Szerling, F. Phillipp, Peter A. van Aken, J. Kątcki	2
4	High-resolution transmission-electron-microscopy study of ultrathin Al-induced crystallization of amorphous Si 2009 ·Journal of materials research/Pratt's guide to venture capital sources ·Zumin Wang, Lars P. H. Jeurgens, (unknown), F. Phillipp, (unknown)	5
5	A Shield for Reducing the Thermal Signal from Heating Holders DuringIn SituEnergy-Dispersive X-Ray Spectroscopy Analysis 2007 ·Microscopy and Microanalysis ·Santhana Eswara, James M. Howe, F. Phillipp	3
6	High‐Temperature Resistance Anomaly at a Strontium Titanate Grain Boundary and Its Correlation with the Grain‐Boundary Faceting–Defaceting Transition 2007 ·Advanced Materials ·Sung Bo Lee, Jong‐Heun Lee, (unknown), Doyoung Kim, Wilfried Sigle, F. Phillipp	30
7	Structure and Magnetization of Small Monodisperse Platinum Clusters 2006 ·Physical Review Letters ·Xiong Liu, Matthias Bauer, H. Bertagnolli, Emil Roduner, Joris van Slageren, F. Phillipp	74
8	On the accuracy of lattice‐distortion analysis directly from high‐resolution transmission electron micrographs 2006 ·Journal of Microscopy ·Kui Du, F. Phillipp	14
9	Step-shaped bismuth nanowires with metal–semiconductor junction characteristics 2006 ·Nanotechnology ·Ye Tian, (unknown), (unknown), F. Phillipp, Shuhui Sun, L D Zhang	15
10	Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs 2006 ·Ultramicroscopy ·Kui Du, (unknown), F. Phillipp	27
11	In situ high-resolution transmission electron microscopy study of interfacial reactions of Cu thin films on amorphous silicon 2006 ·Applied Physics Letters ·Sung Bo Lee, Duck‐Kyun Choi, F. Phillipp, (unknown), Chang Kyung Kim	9
12	Nanoscale TiO island formation on the SrTiO3(001) surface studied by in situ high-resolution transmission electron microscopy 2005 ·Ultramicroscopy ·Sung Bo Lee, F. Phillipp, Wilfried Sigle, M. Rühle	22
13	The role of iron carbide in multiwalled carbon nanotube growth 2004 ·Journal of Catalysis ·Andreas Schaper, Haoqing Hou, Andreas Greiner, F. Phillipp	182
14	Texture of MBE grown Cr films on α-Al2O3(0001): the occurrence of Nishiyama-Wassermann (NW) and Kurdjumov-Sachs (KS) related orientation relationships 2003 ·Journal of the European Ceramic Society ·Susumu Tsukimoto, F. Phillipp, Thomas Wagner	7
15	Lattice Distortion Analysis Directly from High Resolution Transmission Electron Microscopy Images—the LADIA Program Package 2002 ·Journal of Material Science and Technology ·Kui Du, (unknown), N. Y. Jin-Phillipp, F. Phillipp	50
16	Collective Effects in Grain Boundary Migration 2002 ·Physical Review Letters ·K. L. Merkle, L. J. Thompson, F. Phillipp	64
17	high-resolution electron microscopy at a (113) symmetric Thermally activated step motion observed by tilt grain-boundary in aluminium 2002 ·Philosophical Magazine Letters ·K. L. Merkle, L. J. Thompson, F. Phillipp	26
18	Synthesis of β-SiC nanowires with SiO2 wrappers 1999 ·Nanostructured Materials ·Guoyun Meng, L.D. Zhang, Yan Qin, C. M. Mo, F. Phillipp	55
19	HREM and EXELFS investigation of local structure in thin CVD diamond films 1997 ·Diamond and Related Materials ·(unknown), V. Serin, (unknown), F. Phillipp, D. Rats, L. Vandenbulcke	18
20	Dislocation generation in silicon grown laterally over SiO2 by liquid phase epitaxy 1991 ·Applied Physics A ·Florian Banhart, Ralf B. Bergmann, F. Phillipp, E. Bauser	16

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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