O. Faynot

814 citations
38 papers · 323 indexed · h-index 9
Topics
Semiconductor materials and devices (29 papers)Advancements in Semiconductor Devices and Circuit Design (28 papers)Integrated Circuits and Semiconductor Failure Analysis (11 papers)
Partner nations
FranceSwitzerlandJapan

In The Last Decade

O. Faynot

36 papers receiving 306 citations

Peers

O. Faynot
Comparison fields: 5 of 26
  • Electrical and Electronic Engineering 298
  • Biomedical Engineering 53
  • Materials Chemistry 36
  • Atomic and Molecular Physics, and Optics 24
  • Computational Mechanics 24
Replace F. Bénistant with:
F. Bénistant Singapore
M. Horiuchi Japan
Jan-Erik Mueller Germany
S. Inaba Japan
C. Ortolland Belgium
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O. Faynot relative to F. Bénistant Singapore F. Bénistant's profile →
Citations per field
00.5×1.5×1.9×
F. Bénistant · 1×
Citations per year

Countries citing papers authored by O. Faynot

Since Specialization
Citations

This map shows the geographic impact of O. Faynot's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by O. Faynot with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites O. Faynot more than expected).

Fields of papers citing papers by O. Faynot

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by O. Faynot. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by O. Faynot. The network helps show where O. Faynot may publish in the future.

Co-authorship network of co-authors of O. Faynot

This figure shows the co-authorship network connecting the top 25 collaborators of O. Faynot. A scholar is included among the top collaborators of O. Faynot based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with O. Faynot. O. Faynot is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 22
2 7
3
Charge Collection Analysis under Heavy Ion Irradiation in Multiple-Gate Devices: FinFETs and Nanowires
1
4 3
5
Improved DIBL in Ultra Thin Body SOI MOSFETs with Ultra Thin Buried Oxide and inverted substrate
2
6 9
7 8
8 4
9 2
10 63
11 3
12 70
13 3
14 0
15 0
16 13
17
Detailed Analysis of Short-Channel SOI DT-MOSFET
6
18 2
19
Comprehensive Study and Analytical Modeling of Sub-0.25 um Dynamic Threshold Voltage MOSFET (DTMOS) for Low-Voltage and Low-Power Applications
1
20 5

About O. Faynot

O. Faynot is a scholar working on Electrical and Electronic Engineering, Instrumentation and Surfaces, Coatings and Films, having authored 38 papers that have together received 323 indexed citations. Recurring topics across this work include Semiconductor materials and devices (29 papers), Advancements in Semiconductor Devices and Circuit Design (28 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). The work is most often cited by research in Electrical and Electronic Engineering (298 citations), Hardware and Architecture (10 citations) and Biomedical Engineering (53 citations). O. Faynot has collaborated with scholars based in France, Switzerland and Japan. Frequent co-authors include C. Jahan, Jean‐Michel Hartmann, L. Tosti, Marc Gaillardin, S. Cristoloveanu, A. Torres, Véronique Ferlet-Cavrois, J.L. Pelloie, T. Poiroux and S. Cristoloveanu. Their work appears in journals such as Journal of Applied Physics, Journal of Crystal Growth and Solid-State Electronics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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