R. Truche

1.0k citations

45 papers · 714 indexed · h-index 17

Impact in

Structural Biology top 2%
- Advanced Electron Microscopy Techniques and Applications
Electrical and Electronic Engineering top 10%
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- Thin-Film Transistor Technologies

Papers in

Structural Biology 5
- Advanced Electron Microscopy Techniques and Applications 5
Electrical and Electronic Engineering 43
- Semiconductor materials and devices 31
- Advancements in Semiconductor Devices and Circuit Design 30
- Integrated Circuits and Semiconductor Failure Analysis 17
- Radiation Effects in Electronics 6

Co-authors: Jean‐Michel Hartmann David Cooper G. Rolland Y. Bogumilowicz Y. Campidelli T. Billon S. Deleonibus Jean‐Luc Rouvière
Journals: IEEE Transactions on Nuclear Science (9 papers)Semiconductor Science and Technology (4 papers)Microelectronic Engineering (3 papers)Solid-State Electronics (3 papers)IEEE Electron Device Letters (2 papers)
Partner nations: France Russia United States

In The Last Decade

R. Truche

42 papers receiving 686 citations

Peers

Countries citing papers authored by R. Truche

Since Specialization

Citations

This map shows the geographic impact of R. Truche's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Truche with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Truche more than expected).

Fields of papers citing papers by R. Truche

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. Truche. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Truche. The network helps show where R. Truche may publish in the future.

Co-authorship network

The 25 scholars most cited alongside R. Truche, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with R. Truche Line = papers co-authored together R. Truche links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	HfO2-based gate stacks transport mechanisms and parameter extraction Solid-State Electronics ·J. Coignus, Cédric Leroux, R. Clerc, R. Truche, G. Ghibaudo, G. Reimbold, F. Boulanger	2010	1
2	Fabrication, structural and electrical properties of compressively strained Ge-on-insulator substrates Semiconductor Science and Technology ·Janet Afary, L. Sanchez, Anastasiia Shmatkova, Alexandra Abbadie, L. Baud, R. Truche, E. Augendre, L. Clavelier, N. Cherkashin, Martin Hÿtch, S. Cristoloveanu	2010	13
3	Quantitative off‐axis electron holography of GaAs p‐n junctions prepared by focused ion beam milling Journal of Microscopy ·David Cooper, R. Truche, A. C. Twitchett-Harrison, Rafal E. Dunin–Borkowski, Paul A. Midgley	2009	26
4	Diffusion and activation of Boron and Phosphorus in preamorphized and crystalline Germanium using ultra fast spike anneal V. Mazzocchi, Xavier Llimona i Pagès, M. Py, Jean‐Paul Barnes, 纪奎江, Louis Hutin, R. Truche, Vladislav P. Makhrov, M. Vinet, C. Le Royer, Billy J. Garrett	2009	3
5	High performance 70nm gate length germanium-on-insulator pMOSFET with high-k/metal gate Solid-State Electronics ·K. Romanjek, Louis Hutin, C. Le Royer, A. Pouydebasque, M.-A. Jaud, C. Tabone, E. Augendre, L. Sanchez, Jean‐Michel Hartmann, H. Grampeix, V. Mazzocchi, Fabio Tedeschi, R. Truche, L. Clavelier, P. Scheiblin, X. Garros, G. Reimbold, M. Vinet, F. Boulanger, S. Deleonibus	2009	32
6	First Demonstration of Deep Sub-Micron Germanium-on-Insulator PMOSFET with Adapted Threshold Voltage A. Pouydebasque, C. Le Royer, C. Tabone, K. Romanjek, E. Augendre, L. Sanchez, Jean‐Michel Hartmann, H. Grampeix, V. Mazzocchi, Fabio Tedeschi, R. Truche, L. Clavelier, S. Deleonibus	2008	8
7	105nm Gate length pMOSFETs with high-K and metal gate fabricated in a Si process line on 200mm GeOI wafers Solid-State Electronics ·C. Le Royer, L. Clavelier, C. Tabone, K. Romanjek, C. Deguet, L. Sanchez, Jean‐Michel Hartmann, 陈溪然, H. Grampeix, Fabio Tedeschi, G. Le Carval, R. Truche, A. Pouydebasque, M. Vinet, S. Deleonibus	2008	24
8	Reduction of electrical damage in specimens prepared using focused ion beam milling for dopant profiling using off-axis electron holography Ultramicroscopy ·David Cooper, R. Truche, Jean‐Luc Rouvière	2007	11
9	10 nm-gate-length transistors on ultra-thin SOI film: process realization and design optimisation J. Lolivier, M. Vinet, T. Poiroux, B. Prévitali, T. Chevolleau, Jean‐Michel Hartmann, 悟志新子, R. Truche, O. Faynot, F. Balestra, S. Deleonibus	2005	3
10	SiGe channel p-MOSFETs scaling-down F. Andrieu, T. Ernst, K. Romanjek, O. Weber, Charles Renard, Jean‐Michel Hartmann, A. Toffoli, 悟志新子, R. Truche, P. Holliger, L. Brévard, G. Ghibaudo, S. Deleonibus	2004	12
11	High C content Si/Si_1 yC_yheterostructures for n-type metal oxide semiconductor transistors Semiconductor Science and Technology ·Jean‐Michel Hartmann, T. Ernst, F. Ducroquet, G. Rolland, D. Lafond, Anne‐Marie Papon, R. Truche, P. Holliger, F. Laugier, M.N. Séméria, S. Deleonibus	2004	12
12	P-JFET on SIMOX for rad-hard analog devices Juliette Blanc, Lina Zhang, Pakorn Siripakdee, J. Gautier, J. de Pontcharra, R. Truche, Bruno Glaser, José Luis Martín Martín, John Buchter	2002	1
13	Thick film SOI technology: characteristics of devices and performance of circuits for high-energy physics at cryogenic temperatures; effects of ionizing radiation Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ·N. Fourches, P. Abbon, R. Chipaux, E. Delagnes, I Balazsi, P. Pailler, J. Z. Zhang, M. Rouger, Cedr, R. Truche	1997	1
14	Enhanced total dose damage in junction field effect transistors and related linear integrated circuits IEEE Transactions on Nuclear Science ·O. Flament, Jean‐Luc Autran, P. Roche, J.L. Leray, O. Musseau, R. Truche, I Balazsi	1996	18
15	Radiation effects on SOI analog devices parameters IEEE Transactions on Nuclear Science ·O. Flament, J.L. Leray, Juliette Martin, John Buchter, Marco Raffaelli, Juliette Blanc, Pakorn Siripakdee, J. Gautier, J.L. Pelloie, Constanze Ondruschka, R. Truche, E. Delagnes, M. Dentan, N. Fourches	1994	9
16	Study of a CMOS-JFET-bipolar radiation hard analog-digital technology suitable for high energy physics electronics IEEE Transactions on Nuclear Science ·M. Dentan, E. Delagnes, N. Fourches, M. Rouger, M.C. Habrard, L. Blanquart, P. Delpierre, R. Potheau, R. Truche, Juliette Blanc, Pakorn Siripakdee, J. Gautier, J.L. Pelloie, J. de Pontcharra, O. Flament, J.L. Leray, Juliette Martin, John Buchter, O. Musseau	1993	27
17	‘SIMOX’ (Separation by Ion Implantation of Oxygen): a Technology for high-temperature silicon sensors Sensors and Actuators A Physical ·E. Lati, R. Truche, 入江寛, G. Delapierre	1990	19
18	Formation of shallow P+-N junctions by dual Ge+/B+ implantation Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·V. Zˇelezny ́, B. Biasse, Anne‐Marie Papon, J. de Pontcharra, R. Truche	1989	8
19	From substrate to VLSI: investigation of hardened SIMOX without epitaxy, for dose, dose rate and SEU phenomena IEEE Transactions on Nuclear Science ·J.L. Leray, Bruno Glaser, O. Musseau, Yves‐Marie Coïc, Arthur Rakover, P. Lalande, Shuo-Che Yang, A.J. Auberton‐Hervé, M. Bruel, C. Jaussaud, J. Margail, B. Giffard, R. Truche, F. Martín	1988	46
20	Study of the diffusion of the boron in high temperature proton irradiated silicon C. A. Lucas, J. P. Gailliard, S. Loualiche, P. Baruch, J. C. Pfister, R. Truche	1978	1

About R. Truche

R. Truche is a scholar working on Structural Biology, Electrical and Electronic Engineering, Surfaces, Coatings and Films, Radiation and Biomedical Engineering, having authored 45 papers that have together received 714 indexed citations. Recurring topics across this work include Semiconductor materials and devices (31 papers), Advancements in Semiconductor Devices and Circuit Design (30 papers), Integrated Circuits and Semiconductor Failure Analysis (17 papers), Nanowire Synthesis and Applications (8 papers), Radiation Effects in Electronics (6 papers), Advanced Electron Microscopy Techniques and Applications (5 papers), Ion-surface interactions and analysis (4 papers) and Semiconductor materials and interfaces (4 papers). The work is most often cited by research in Structural Biology (103 citations), Electrical and Electronic Engineering (613 citations), Surfaces, Coatings and Films (68 citations), Radiation (36 citations) and Atomic and Molecular Physics, and Optics (125 citations). R. Truche has collaborated with scholars based in France, Russia and United States. Frequent co-authors include Jean‐Michel Hartmann, David Cooper, G. Rolland, Y. Bogumilowicz, Y. Campidelli, T. Billon, S. Deleonibus, Jean‐Luc Rouvière, Anne‐Marie Papon and O. Flament. Their work appears in journals such as IEEE Transactions on Nuclear Science, Semiconductor Science and Technology, Microelectronic Engineering, Solid-State Electronics and IEEE Electron Device Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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