J. Margail

952 citations

43 papers · 727 indexed · h-index 15

Electrical and Electronic Engineering top 5%
- Semiconductor materials and devices 33
- Silicon and Solar Cell Technologies 20
- Advancements in Semiconductor Devices and Circuit Design 15
- Integrated Circuits and Semiconductor Failure Analysis 11
- Thin-Film Transistor Technologies 7
Computational Mechanics top 10%
- Ion-surface interactions and analysis 5
Materials Chemistry
- Silicon Nanostructures and Photoluminescence 5
Ceramics and Composites
Structural Biology
Biomedical Engineering
- Advanced Surface Polishing Techniques 4

Co-authors: J. Stoëmenos C. Jaussaud M. Bruel M. Dupuy A.J. Auberton‐Hervé J.L. Leray R. A. B. Devine B. Blanchard
Cited by: Electrical and Electronic Engineering Computational Mechanics Materials Chemistry
Journals: Materials Science and Engineering B (5 papers)Applied Physics Letters (4 papers)Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms (4 papers)
Partner nations: France Greece Spain

In The Last Decade

J. Margail

41 papers receiving 701 citations

Peers

Countries citing papers authored by J. Margail

Since Specialization

Citations

This map shows the geographic impact of J. Margail's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Margail with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Margail more than expected).

Fields of papers citing papers by J. Margail

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Margail. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Margail. The network helps show where J. Margail may publish in the future.

Co-authorship network

The 25 scholars most cited alongside J. Margail, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. Margail Line = papers co-authored together J. Margail links everyone, so they are left out of the graph.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work
1	A Detailed Investigation of the Pseudo-Mos Transistor for in Situ Characterization of Soi Wafers T. Ouisse,Hiba Dirawi,O. Faynot,KM Ahlén,J. Margail,S. Cristoloveanu	2005	3
2	A novel electrostatic actuator for micro deformable mirrors: fabrication and test А А Малюкіна,J. Charton,Rolland Thierry,Eric Stadler,J. Margail,L. Jocou,T. Enot,J. C. Barbé,Jacques Chiaroni,M Cardoso	2004	14
3	Measurement of sidewall, line, and line-edge roughness with scanning probe microscopy Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·ΚΩΝΣΤΑΝΤΙΝΟΣ ΤΖΙΕΡΑΚΗΣ,Khadija Hassan Al Maqbali,Monia Trasolini,J. Margail	2001	2
4	Silicon on Insulator Obtained by High Dose Oxygen Implantation, Microstructure, and Formation Mechanism Journal of The Electrochemical Society ·J. Stoëmenos,Á. García,B. Aspar,J. Margail	1995	13
5	Selective Epitaxial Silicon and Selective Titanium Silicide in an Industrial Integrated Cluster Tool MRS Proceedings ·J.L. Regolini,J. Margail,胡良荣,Sanghamitra Jena	1994	1
6	SIMOX material manufacturability Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·J. Margail	1993	11
7	Buried oxide layers formed by oxygen implantation on screened oxide silicon wafers: structural analysis Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·Josep Samitier,S. Martı́nez,A. Pérez‐Rodríguez,B. Garrido,J.R. Morante,Anne‐Marie Papon,J. Margail	1993	2
8	Characterization of metal impurities in silicon-on-insulator material Materials Science and Engineering B ·L. Frey,Douglas Bellomo Cavalcante,小笠原真澄,H. Ryssel,J. Margail	1992	3
9	Field dependent charge trapping effects in SIMOX and buried oxides at very high dose IEEE Transactions on Nuclear Science ·O. Flament,Dominique Hervé,O. Musseau,Christoph F. Priebe,Marco Raffaelli,J.L. Leray,J. Margail,B. Giffard,A.J. Auberton‐Hervé	1992	10
10	Characterization of oxygen-ion-implanted silicon using spectroscopic ellipsometry and transmission electron microscopy Materials Science and Engineering B ·Mustafa Kemal Dagdelen,K.-W. Lee,R. Greef,J. Margail,Venna von Lepel,J. Stoëmenos	1992	3
11	A Chemical Etching for the Delineation of Oxidation Stacking Faults in Silicon Implanted with Oxygen Structures Journal of The Electrochemical Society ·C. Tsamis,D. Tsoukalas,N. Guillemot,J. Stoëmenos,J. Margail	1991	5
12	SIMOX-material quality in a semi-industrial production Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·Venna von Lepel,J. Margail,B. Biasse,Jean-François Michaud,Assunta Sias,S Smaarani,Amber Peifer,C. Jaussaud	1991	5
13	Ultraviolet radiation induced defect creation in buried SiO2 layers Applied Physics Letters ·R. A. B. Devine,J.L. Leray,J. Margail	1991	46
14	Growth and misfit accommodation of ?-SiC precipitates in silicon as implanted by oxygen Journal of Materials Science Letters ·J. Antonopoulos,J. Stoëmenos,C. Jaussaud,J. Margail	1989	4
15	Reduced defect density in silicon-on-insulator structures formed by oxygen implantation in two steps Applied Physics Letters ·J. Margail,J. Stoëmenos,C. Jaussaud,M. Bruel	1989	54
16	High Temperature Annealing of Simox Layers Physical Mechanisms of Oxygen Segregation MRS Proceedings ·C. Jaussaud,J. Margail,J. Stoëmenos,M. Bruel	1988	20
17	Silicon-on-insulator by oxygen implantation: An advanced technology Microelectronic Engineering ·M. Bruel,J. Margail,C. Jaussaud,A.J. Auberton‐Hervé,J. Stoëmenos	1988	10
18	Self-Interstitial Migration in Si Implanted with Oxygen Physica Scripta ·J. Stoëmenos,J. Margail,M. Dupuy,C. Jaussaud	1987	18
19	On the formation of stacking faults in silicon implanted with high doses of oxygen Journal of Materials Science ·Ph. Komninou,Th. Karakostas,J. Stoëmenos,C. Jaussaud,J. Margail	1987	3
20	SiO2 buried layer formation by subcritical dose oxygen ion implantation Applied Physics Letters ·J. Stoëmenos,J. Margail,C. Jaussaud,M. Dupuy,M. Bruel	1986	40

About J. Margail

J. Margail is a scholar working on Electrical and Electronic Engineering, Ceramics and Composites, Computational Mechanics, Atomic and Molecular Physics, and Optics and Biomedical Engineering, having authored 43 papers that have together received 727 indexed citations. Recurring topics across this work include Semiconductor materials and devices (33 papers), Silicon and Solar Cell Technologies (20 papers), Advancements in Semiconductor Devices and Circuit Design (15 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Thin-Film Transistor Technologies (7 papers), Ion-surface interactions and analysis (5 papers), Silicon Nanostructures and Photoluminescence (5 papers) and Advanced Surface Polishing Techniques (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (695 citations), Computational Mechanics (95 citations), Materials Chemistry (193 citations), Ceramics and Composites (20 citations) and Structural Biology (4 citations). J. Margail has collaborated with scholars based in France, Greece and Spain. Frequent co-authors include J. Stoëmenos, C. Jaussaud, M. Bruel, M. Dupuy, A.J. Auberton‐Hervé, J.L. Leray, R. A. B. Devine, B. Blanchard, A.M. Papon and B. Giffard. Their work appears in journals such as Materials Science and Engineering B, Applied Physics Letters, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Journal of Applied Physics and Thin Solid Films.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact