J. Coignus

1.1k total citations
54 papers, 506 citations indexed

About

J. Coignus is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, J. Coignus has authored 54 papers receiving a total of 506 indexed citations (citations by other indexed papers that have themselves been cited), including 49 papers in Electrical and Electronic Engineering, 12 papers in Atomic and Molecular Physics, and Optics and 11 papers in Materials Chemistry. Recurrent topics in J. Coignus's work include Semiconductor materials and devices (31 papers), Ferroelectric and Negative Capacitance Devices (23 papers) and Advanced Memory and Neural Computing (18 papers). J. Coignus is often cited by papers focused on Semiconductor materials and devices (31 papers), Ferroelectric and Negative Capacitance Devices (23 papers) and Advanced Memory and Neural Computing (18 papers). J. Coignus collaborates with scholars based in France, Germany and Italy. J. Coignus's co-authors include L. Grenouillet, E. Nowak, D. Muñoz, G. Reimbold, Wilfried Favre, Elisa Vianello, G. Molas, C. Carabasse, Nicolas Vaxelaire and Thomas Mikolajick and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Transactions on Electron Devices.

In The Last Decade

J. Coignus

50 papers receiving 488 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
J. Coignus France 13 483 137 67 34 25 54 506
Jiahao Yin China 13 333 0.7× 107 0.8× 85 1.3× 41 1.2× 33 1.3× 48 390
D. Crotti Belgium 15 417 0.9× 83 0.6× 226 3.4× 55 1.6× 24 1.0× 34 518
Siddarth Krishnan United States 19 873 1.8× 126 0.9× 64 1.0× 19 0.6× 18 0.7× 65 892
Jiancong Li China 9 184 0.4× 105 0.8× 40 0.6× 64 1.9× 18 0.7× 26 356
Boyoung Seo South Korea 3 362 0.7× 57 0.4× 97 1.4× 44 1.3× 23 0.9× 4 418
Vaibhav Ostwal United States 9 251 0.5× 215 1.6× 113 1.7× 21 0.6× 20 0.8× 14 414
Gary Bronner United States 6 310 0.6× 48 0.4× 91 1.4× 42 1.2× 11 0.4× 13 327
Shamiul Alam United States 12 285 0.6× 127 0.9× 115 1.7× 11 0.3× 29 1.2× 43 404
Zia Karim United States 5 286 0.6× 55 0.4× 38 0.6× 66 1.9× 36 1.4× 23 304
Kai‐Shin Li Taiwan 13 739 1.5× 302 2.2× 44 0.7× 47 1.4× 59 2.4× 36 804

Countries citing papers authored by J. Coignus

Since Specialization
Citations

This map shows the geographic impact of J. Coignus's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Coignus with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Coignus more than expected).

Fields of papers citing papers by J. Coignus

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Coignus. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Coignus. The network helps show where J. Coignus may publish in the future.

Co-authorship network of co-authors of J. Coignus

This figure shows the co-authorship network connecting the top 25 collaborators of J. Coignus. A scholar is included among the top collaborators of J. Coignus based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Coignus. J. Coignus is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Coignus, J., et al.. (2024). Data Retention Insights from Joint Analysis on BEOL-Integrated HZO-Based Scaled FeCAPs and 16kbit 1T-1C FeRAM Arrays. SPIRE - Sciences Po Institutional REpository. 1–7.
2.
Barrett, N., C. Lubin, C. Carabasse, et al.. (2024). Oxygen vacancy engineering in Si-doped, HfO2 ferroelectric capacitors using Ti oxygen scavenging layers. Applied Physics Letters. 125(4). 5 indexed citations
3.
Coignus, J., François Triozon, C. Carabasse, et al.. (2023). Dynamics of polarization loss and imprint in bilayer ferroelectric tunnel junctions. Journal of Applied Physics. 134(21). 5 indexed citations
4.
Lancaster, Suzanne, F. Driussi, L. Grenouillet, et al.. (2022). Interplay Between Charge Trapping and Polarization Switching in BEOL-Compatible Bilayer Ferroelectric Tunnel Junctions. IEEE Journal of the Electron Devices Society. 10. 593–599. 12 indexed citations
5.
Alcala, Ruben, Patrick D. Lomenzo, Terence Mittmann, et al.. (2022). The Role of Interface Dynamics on the Reliability Performance of BEOL Integrated Ferroelectric HfO2 Capacitors. 2022 International Electron Devices Meeting (IEDM). 2. 32.8.1–32.8.4. 4 indexed citations
6.
Alcala, Ruben, Monica Materano, Patrick D. Lomenzo, et al.. (2022). BEOL Integrated Ferroelectric HfO₂-Based Capacitors for FeRAM: Extrapolation of Reliability Performance to Use Conditions. IEEE Journal of the Electron Devices Society. 10. 907–912. 17 indexed citations
7.
Martin, M., Christophe Jany, Léopold Virot, et al.. (2021). Monolithically integrated InGaAs/AlGaAs multiple quantum well photodetectors on 300 mm Si wafers. AIP Advances. 11(8). 8 indexed citations
8.
Jaud, M.-A., J. Coignus, J. Cluzel, et al.. (2021). Study on the difference between ID(VG) and C(VG) pBTI shifts in GaN-on-Si E-mode MOSc-HEMT. SPIRE - Sciences Po Institutional REpository. 1–8. 6 indexed citations
9.
Martin, M., S. David, J. Moeyaert, et al.. (2020). Monolithic integration of GaAs p–i–n photodetectors grown on 300 mm silicon wafers. AIP Advances. 10(12). 6 indexed citations
10.
Molas, G., Gilbert Sassine, C. Cagli, et al.. (2018). (Invited) Resistive Memories (RRAM) Variability: Challenges and Solutions. ECS Transactions. 86(3). 35–47. 27 indexed citations
11.
Rafhay, Quentin, X. Garros, M. Cassé, et al.. (2017). Precise EOT regrowth extraction enabling performance analysis of low temperature extension first devices. HAL (Le Centre pour la Communication Scientifique Directe). 144–147. 1 indexed citations
12.
Grossi, Alessandro, L. Grenouillet, Elisa Vianello, et al.. (2017). Improvement of HfO<inf>2</inf> based RRAM array performances by local Si implantation. 133102. 14.6.1–14.6.4. 7 indexed citations
13.
Federspiel, X., D. Rideau, F. Monsieur, et al.. (2016). Hot carrier stress: Aging modeling and analysis of defect location. HAL (Le Centre pour la Communication Scientifique Directe). 5A–4. 4 indexed citations
14.
Coignus, J., et al.. (2016). Microscopic Analysis of Erase-Induced Degradation in 40 nm NOR Flash Technology. IEEE Transactions on Device and Materials Reliability. 16(4). 597–603. 4 indexed citations
15.
Coignus, J., et al.. (2015). Physically-based extraction methodology for accurate MOSFET degradation assessment. Microelectronics Reliability. 55(9-10). 1417–1421. 4 indexed citations
16.
Vianello, Elisa, Olivier Thomas, G. Molas, et al.. (2014). Resistive Memories for Ultra-Low-Power embedded computing design. 6.3.1–6.3.4. 69 indexed citations
17.
Merten, J., J. Coignus, Guillaume Razongles, & D. Muñoz. (2012). Novel Equivalent Circuit for Heterojunction Cells and Diagnostic Method Based on Variable Illumination Measurements (VIM). EU PVSEC. 1268–1271. 2 indexed citations
18.
Coignus, J., Cédric Leroux, R. Clerc, et al.. (2010). HfO2-based gate stacks transport mechanisms and parameter extraction. Solid-State Electronics. 54(9). 972–978. 1 indexed citations
19.
Coignus, J., et al.. (2007). Integrated monitoring of ULK dielectrics out-gassing and measurement of pore sealing efficiency by residual gas analysis technique. Microelectronic Engineering. 84(11). 2719–2722. 1 indexed citations
20.
Dainty, J. C., et al.. (2005). Wavefront correction of extended objects through image sharpness maximisation. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6018. 60181A–60181A. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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