J.L. Pelloie
- Electrical and Electronic Engineering top 5%
- Biomedical Engineering
- Hardware and Architecture top 10%
- Atomic and Molecular Physics, and Optics
- Materials Chemistry
- Co-authors
- V. Ferlet-CavroisO. MusseauF. BalestraC. RaynaudJ.L. LerayO. FaynotO. FlamentS. Cristoloveanu
- Topics
- Advancements in Semiconductor Devices and Circuit Design (64 papers)Semiconductor materials and devices (57 papers)Integrated Circuits and Semiconductor Failure Analysis (24 papers)
- Partner nations
- FranceUnited StatesTaiwan
In The Last Decade
J.L. Pelloie
66 papers receiving 738 citations
Peers
Comparison fields: 5 of 30
- Electrical and Electronic Engineering 771
- Biomedical Engineering 33
- Hardware and Architecture 32
- Atomic and Molecular Physics, and Optics 31
- Materials Chemistry 27
Countries citing papers authored by J.L. Pelloie
This map shows the geographic impact of J.L. Pelloie's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.L. Pelloie with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.L. Pelloie more than expected).
Fields of papers citing papers by J.L. Pelloie
This network shows the impact of papers produced by J.L. Pelloie. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.L. Pelloie. The network helps show where J.L. Pelloie may publish in the future.
Co-authorship network of co-authors of J.L. Pelloie
This figure shows the co-authorship network connecting the top 25 collaborators of J.L. Pelloie. A scholar is included among the top collaborators of J.L. Pelloie based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J.L. Pelloie. J.L. Pelloie is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 1 | |
| 3 | 2 | |
| 4 | 5 | |
| 5 | 5 | |
| 6 | 0 | |
| 7 | 1 | |
| 8 | 1 | |
| 9 | 0 | |
| 10 | 69 | |
| 11 | 41 | |
| 12 | 11 | |
| 13 | Detailed Analysis of Short-Channel SOI DT-MOSFET | 6 |
| 14 | 2 | |
| 15 | Comprehensive Study and Analytical Modeling of Sub-0.25 um Dynamic Threshold Voltage MOSFET (DTMOS) for Low-Voltage and Low-Power Applications | 1 |
| 16 | 3 | |
| 17 | 2 | |
| 18 | Impact of Latch Phenomenon on Low Frequency Noise in SOI MOSFETs | 2 |
| 19 | 27 | |
| 20 | 13 |
About J.L. Pelloie
J.L. Pelloie is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Atomic and Molecular Physics, and Optics, having authored 72 papers that have together received 780 indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (64 papers), Semiconductor materials and devices (57 papers) and Integrated Circuits and Semiconductor Failure Analysis (24 papers). The work is most often cited by research in Electrical and Electronic Engineering (771 citations), Hardware and Architecture (32 citations) and Radiation (11 citations). J.L. Pelloie has collaborated with scholars based in France, United States and Taiwan. Frequent co-authors include V. Ferlet-Cavrois, O. Musseau, F. Balestra, C. Raynaud, J.L. Leray, O. Faynot, O. Flament, S. Cristoloveanu, N. Fel and Jean‐Luc Gautier. Their work appears in journals such as Journal of Applied Physics, IEEE Transactions on Electron Devices and Solid-State Electronics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.