V. Delaye

2.0k citations
70 papers · 1.0k indexed · h-index 19

V. Delaye

69 papers receiving 984 citations

Peers

V. Delaye
Comparison fields: 5 of 50
  • Structural Biology 30
  • Electrical and Electronic Engineering 885
  • Surfaces, Coatings and Films 53
  • Atomic and Molecular Physics, and Optics 199
  • Biomedical Engineering 228
Replace D. Lafond with:
D. Lafond France
G. Audoit France
Paul Ruchhoeft United States
Hiroyuki Miyazoe United States
Yu. Matveyev Germany
Miroslav Kolı́bal Czechia
M. Kaiser Netherlands
Andreas Schulze Belgium
Deborah M. Paskiewicz United States
Xavier Borrisé Spain
V. Delaye relative to D. Lafond France D. Lafond's profile →
Citations per field
00.5×2.8×
D. Lafond · 1×
Citations per year

Countries citing papers authored by V. Delaye

Since Specialization
Citations

This map shows the geographic impact of V. Delaye's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Delaye with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Delaye more than expected).

Fields of papers citing papers by V. Delaye

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by V. Delaye. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Delaye. The network helps show where V. Delaye may publish in the future.

Co-authorship network

The 25 scholars most cited alongside V. Delaye, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with V. Delaye Line = papers co-authored together V. Delaye links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20223
2 20205
3 202011
4 201917
5 20194
6
Nano-characterization of switching mechanism in HfO2-based oxide resistive memories by TEM-EELS-EDS
20161
7 20165
8 201519
9 20158
10 201429
11 201368
12 20134
13 20113
14 200817
15 200815
16 20077
17 200731
18 200723
19 20072
20 20005

About V. Delaye

V. Delaye is a scholar working on Structural Biology, Electrical and Electronic Engineering and Surfaces, Coatings and Films, having authored 70 papers that have together received 1.0k indexed citations. Recurring topics across this work include Semiconductor materials and devices (37 papers), Advancements in Semiconductor Devices and Circuit Design (20 papers), Nanowire Synthesis and Applications (12 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers), Advanced Memory and Neural Computing (8 papers), 3D IC and TSV technologies (8 papers), Semiconductor materials and interfaces (7 papers) and Photonic and Optical Devices (7 papers). The work is most often cited by research in Structural Biology (30 citations), Electrical and Electronic Engineering (885 citations) and Surfaces, Coatings and Films (53 citations). V. Delaye has collaborated with scholars based in France, Japan and Belgium. Frequent co-authors include Jean‐Michel Hartmann, Vincent Reboud, J. Aubin, T. Ernst, D. Lafond, V. Maffini-Alvaro, V. Calvo, Dmitry Aldakov, Valentina Ivanova and C. Vizioz. Their work appears in journals such as IEEE Transactions on Electron Devices, Applied Physics Letters, Solid-State Electronics, Microelectronic Engineering and Semiconductor Science and Technology.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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