P. Scheiblin
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- Semiconductor materials and devices 36
- Advancements in Semiconductor Devices and Circuit Design 25
- Integrated Circuits and Semiconductor Failure Analysis 16
- Silicon and Solar Cell Technologies 11
- Thin-Film Transistor Technologies 8
- Ferroelectric and Negative Capacitance Devices 5
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- Semiconductor materials and interfaces 6
- Computational Mechanics top 10%
- Ion-surface interactions and analysis 10
P. Scheiblin
49 papers receiving 775 citations
Peers
Comparison fields: 5 of 30
- Electrical and Electronic Engineering 764
- Atomic and Molecular Physics, and Optics 159
- Computational Mechanics 95
- Biomedical Engineering 114
- Materials Chemistry 107
Countries citing papers authored by P. Scheiblin
This map shows the geographic impact of P. Scheiblin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Scheiblin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Scheiblin more than expected).
Fields of papers citing papers by P. Scheiblin
This network shows the impact of papers produced by P. Scheiblin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Scheiblin. The network helps show where P. Scheiblin may publish in the future.
Co-authorship network
The 25 scholars most cited alongside P. Scheiblin, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2019 | 3 | |
| 2 | 2017 | 6 | |
| 3 | 2013 | 0 | |
| 4 | 2011 | 137 | |
| 5 | 2011 | 11 | |
| 6 | 2011 | 35 | |
| 7 | Improved DIBL in Ultra Thin Body SOI MOSFETs with Ultra Thin Buried Oxide and inverted substrate | 2010 | 2 |
| 8 | 2009 | 33 | |
| 9 | 2009 | 22 | |
| 10 | 2009 | 32 | |
| 11 | 2008 | 3 | |
| 12 | 2008 | 12 | |
| 13 | 2008 | 3 | |
| 14 | 2007 | 1 | |
| 15 | 2006 | 17 | |
| 16 | 2005 | 1 | |
| 17 | 2002 | 3 | |
| 18 | 1990 | 16 | |
| 19 | 1990 | 2 | |
| 20 | 1989 | 15 |
About P. Scheiblin
P. Scheiblin is a scholar working on Electrical and Electronic Engineering, Computational Mechanics and Atomic and Molecular Physics, and Optics, having authored 51 papers that have together received 793 indexed citations. Recurring topics across this work include Semiconductor materials and devices (36 papers), Advancements in Semiconductor Devices and Circuit Design (25 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers), Silicon and Solar Cell Technologies (11 papers), Ion-surface interactions and analysis (10 papers), Thin-Film Transistor Technologies (8 papers), Semiconductor materials and interfaces (6 papers) and Ferroelectric and Negative Capacitance Devices (5 papers). The work is most often cited by research in Electrical and Electronic Engineering (764 citations), Atomic and Molecular Physics, and Optics (159 citations) and Computational Mechanics (95 citations). P. Scheiblin has collaborated with scholars based in France, Italy and Germany. Frequent co-authors include S. Koffel, A. Claverie, G. Benassayag, O. Weber, C. Fenouillet-Béranger, O. Rozeau, F. Bœuf, O. Faynot, Olivier Thomas and François Andrieu. Their work appears in journals such as Thin Solid Films, Journal of Applied Physics, IEEE Transactions on Electron Devices, Solid-State Electronics and Applied Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.