E. Nowak

8.9k total citations · 2 hit papers
176 papers, 5.8k citations indexed

About

E. Nowak is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, E. Nowak has authored 176 papers receiving a total of 5.8k indexed citations (citations by other indexed papers that have themselves been cited), including 166 papers in Electrical and Electronic Engineering, 55 papers in Materials Chemistry and 20 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in E. Nowak's work include Semiconductor materials and devices (106 papers), Advancements in Semiconductor Devices and Circuit Design (71 papers) and Advanced Memory and Neural Computing (63 papers). E. Nowak is often cited by papers focused on Semiconductor materials and devices (106 papers), Advancements in Semiconductor Devices and Circuit Design (71 papers) and Advanced Memory and Neural Computing (63 papers). E. Nowak collaborates with scholars based in France, United States and Germany. E. Nowak's co-authors include D.J. Frank, H.‐S. Philip Wong, R.H. Dennard, P. M. Solomon, Yuan Taur, Wilfried Haensch, K. Bernstein, Ernest Y. Wu, H. Neumann and G. Molas and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Proceedings of the IEEE.

In The Last Decade

E. Nowak

169 papers receiving 5.4k citations

Hit Papers

Device scaling limits of ... 2001 2026 2009 2017 2001 2006 250 500 750 1000

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author Last Decade Papers Cites
E. Nowak 5.5k 922 658 465 452 176 5.8k
Vijay Narayanan 5.4k 1.0× 1.6k 1.7× 653 1.0× 842 1.8× 696 1.5× 232 6.3k
Paolo Pavan 3.5k 0.6× 682 0.7× 267 0.4× 276 0.6× 160 0.4× 217 3.9k
Max M. Shulaker 2.8k 0.5× 1.9k 2.1× 1.1k 1.7× 373 0.8× 172 0.4× 68 4.0k
Ya‐Chin King 3.1k 0.6× 516 0.6× 257 0.4× 210 0.5× 265 0.6× 230 3.3k
Asen Asenov 6.0k 1.1× 750 0.8× 890 1.4× 929 2.0× 408 0.9× 418 6.6k
B. Kaczer 10.0k 1.8× 1.2k 1.3× 348 0.5× 544 1.2× 423 0.9× 541 10.3k
Wilfried Haensch 6.3k 1.1× 2.9k 3.1× 2.0k 3.0× 897 1.9× 595 1.3× 147 8.1k
Chenming Hu 4.8k 0.9× 624 0.7× 797 1.2× 441 0.9× 168 0.4× 103 5.1k
Yuan Taur 9.5k 1.7× 1.1k 1.2× 1.5k 2.3× 1.1k 2.4× 224 0.5× 169 10.0k
Shinobu Fujita 1.8k 0.3× 570 0.6× 297 0.5× 688 1.5× 271 0.6× 121 2.3k

Countries citing papers authored by E. Nowak

Since Specialization
Citations

This map shows the geographic impact of E. Nowak's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Nowak with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Nowak more than expected).

Fields of papers citing papers by E. Nowak

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. Nowak. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Nowak. The network helps show where E. Nowak may publish in the future.

Co-authorship network of co-authors of E. Nowak

This figure shows the co-authorship network connecting the top 25 collaborators of E. Nowak. A scholar is included among the top collaborators of E. Nowak based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with E. Nowak. E. Nowak is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Laviéville, Romain, et al.. (2023). Reliability of GaN MOSc-HEMTs: From TDDB to Threshold Voltage Instabilities (Invited). SPIRE - Sciences Po Institutional REpository. 1–8. 5 indexed citations
2.
Paz, Bruna Cardoso, Bernard M. Diaz, Benoît Bertrand, et al.. (2022). Methodology for an efficient characterization flow of industrial grade Si-based qubit devices. 2022 International Electron Devices Meeting (IEDM). 9. 22.1.1–22.1.4. 2 indexed citations
3.
Vogel, Tobias, Nico Kaiser, Stefan Petzold, et al.. (2021). Defect-Induced Phase Transition in Hafnium Oxide Thin Films: Comparing Heavy Ion Irradiation and Oxygen-Engineering Effects. IEEE Transactions on Nuclear Science. 68(8). 1542–1547. 17 indexed citations
5.
Petzold, Stefan, Nico Kaiser, G. Bourgeois, et al.. (2020). Heavy Ions Radiation Effects on 4kb Phase-Change Memory. 1–4.
6.
Levisse, Alexandre, Mathieu Moreau, E. Nowak, et al.. (2019). Switching Event Detection and Self-Termination Programming Circuit for Energy Efficient ReRAM Memory Arrays. IEEE Transactions on Circuits & Systems II Express Briefs. 66(5). 748–752. 10 indexed citations
7.
Cueto, O., N. Castellani, G. Bourgeois, et al.. (2019). Outstanding Improvement in 4Kb Phase-Change Memory of Programming and Retention Performances by Enhanced Thermal Confinement. SPIRE - Sciences Po Institutional REpository. 1–4. 7 indexed citations
8.
Molas, G., Gilbert Sassine, C. Cagli, et al.. (2018). (Invited) Resistive Memories (RRAM) Variability: Challenges and Solutions. ECS Transactions. 86(3). 35–47. 27 indexed citations
9.
Giraud, Bastien, Alessandro Grossi, N. Castellani, et al.. (2018). In-depth Characterization of Resistive Memory-Based Ternary Content Addressable Memories. HAL (Le Centre pour la Communication Scientifique Directe). 20.3.1–20.3.4. 17 indexed citations
10.
Vianello, Elisa, Olivier Bichler, Alessandro Grossi, et al.. (2016). Experimental demonstration of short and long term synaptic plasticity using OxRAM multi k-bit arrays for reliable detection in highly noisy input data. IEEE Conference Proceedings. 2016. 4. 1 indexed citations
11.
Wachnik, R., L. Wagner, J. Johnson, et al.. (2013). Experimental analysis and modeling of self heating effect in dielectric isolated planar and fin devices. Symposium on VLSI Technology. 30 indexed citations
12.
Hanson, Scott, Bin Zhai, K. Bernstein, et al.. (2006). Ultralow-voltage, minimum-energy CMOS. IBM Journal of Research and Development. 50(4.5). 469–490. 155 indexed citations
13.
Clark, William F., et al.. (2004). Predicting the SOI History Effect Using Compact Models. TechConnect Briefs. 2(2004). 183–186. 3 indexed citations
14.
Nowak, E., et al.. (2003). The effective drive current in CMOS inverters. 121–124. 198 indexed citations
15.
Nowak, E., et al.. (1999). Pozyskiwanie metanu metodami wiertniczymi z wyrobisk podziemnych i z powierzchni w kopalniach Jastrzębskiej Spółki Węglowej SA. Wiadomości Górnicze. 80–85.
16.
Hook, Terence B., et al.. (1995). A CMOS Technology for a Sub-5-ns 3.3-V LVTTL 1-Mbit SRAM. European Solid-State Device Research Conference. 9 indexed citations
17.
Nowak, E., H. Neumann, & M. S. Omar. (1988). Heat capacity of Ag6Ge10p12 from 180 to 550 K. Crystal Research and Technology. 23(1). 103–106. 2 indexed citations
18.
Nowak, E., et al.. (1987). Analysis and Solution of a Yield-Limiting Patterned-Fail Mechanism in a 1 Mbit DRAM. Symposium on VLSI Technology. 29–30. 4 indexed citations
19.
Neumann, H. & E. Nowak. (1983). Influence of substrate orientation on the electrical properties of CuInSe2 epitaxial layers on GaAs substrates. Crystal Research and Technology. 18(6). 779–785. 3 indexed citations
20.
Neumann, H., E. Nowak, & G. Kühn. (1981). Impurity States in CuInSe2. Kristall und Technik. 16(12). 1369–1376. 72 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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