E. Nowak

8.9k total citations · 2 hit papers
176 papers, 5.8k citations indexed

About

E. Nowak is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, E. Nowak has authored 176 papers receiving a total of 5.8k indexed citations (citations by other indexed papers that have themselves been cited), including 166 papers in Electrical and Electronic Engineering, 55 papers in Materials Chemistry and 20 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in E. Nowak's work include Semiconductor materials and devices (106 papers), Advancements in Semiconductor Devices and Circuit Design (71 papers) and Advanced Memory and Neural Computing (63 papers). E. Nowak is often cited by papers focused on Semiconductor materials and devices (106 papers), Advancements in Semiconductor Devices and Circuit Design (71 papers) and Advanced Memory and Neural Computing (63 papers). E. Nowak collaborates with scholars based in France, United States and Germany. E. Nowak's co-authors include D.J. Frank, H.‐S. Philip Wong, P. M. Solomon, R.H. Dennard, Yuan Taur, Wilfried Haensch, Ernest Y. Wu, K. Bernstein, H. Neumann and G. Molas and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Proceedings of the IEEE.

In The Last Decade

E. Nowak

169 papers receiving 5.4k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Device scaling limits of Si MOSFETs and their application dependencies

2001 1.1k citations E. Nowak et al. profile →
High-performance CMOS variability in the 65-nm regime and beyond

2006 390 citations Wilfried Haensch, E. Nowak et al. profile →

Peers

Countries citing papers authored by E. Nowak

Since Specialization

Citations

This map shows the geographic impact of E. Nowak's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Nowak with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Nowak more than expected).

Fields of papers citing papers by E. Nowak

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. Nowak. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Nowak. The network helps show where E. Nowak may publish in the future.

Co-authorship network of co-authors of E. Nowak

This figure shows the co-authorship network connecting the top 25 collaborators of E. Nowak. A scholar is included among the top collaborators of E. Nowak based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with E. Nowak. E. Nowak is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work	Indexed citations
1	Reliability of GaN MOSc-HEMTs: From TDDB to Threshold Voltage Instabilities (Invited) 2023 ·SPIRE - Sciences Po Institutional REpository ·(unknown), (unknown), Romain Laviéville, (unknown), (unknown), R. Gwoziecki, (unknown), E. Nowak, A. Constant, F. Iucolano	5
2	Methodology for an efficient characterization flow of industrial grade Si-based qubit devices 2022 ·2022 International Electron Devices Meeting (IEDM) ·(unknown), Bruna Cardoso Paz, Bernard M. Diaz, Benoît Bertrand, Heimanu Niebojewski, (unknown), (unknown), (unknown), M. Cassé, E. Nowak, Yann‐Michel Niquet, F. Gaillard, Tristan Meunier, Pierre-André Mortemousque, M. Vinet	2
3	Defect-Induced Phase Transition in Hafnium Oxide Thin Films: Comparing Heavy Ion Irradiation and Oxygen-Engineering Effects 2021 ·IEEE Transactions on Nuclear Science ·Tobias Vogel, Nico Kaiser, Stefan Petzold, Eszter Piros, (unknown), (unknown), (unknown), Sylvain David, C. Vallée, E. Nowak, C. Trautmann, Lambert Alff	17
4	Functional, neuroplastic and biomechanical changes induced by early Hand-Arm Bimanual Intensive Therapy Including Lower Extremities (e-HABIT-ILE) in pre-school children with unilateral cerebral palsy: study protocol of a randomized control trial 2020 ·BMC Neurology ·(unknown), Rodrigo Araneda, Stéphane Sizonenko, Christopher J. Newman, M. Dinomais, Grégoire Le Gal, E. Nowak, Andrea Guzzetta, Inmaculada Riquelme, Sylvain Brochard, Yannick Bleyenheuft	10
5	Heavy Ions Radiation Effects on 4kb Phase-Change Memory 2020 ·(unknown), (unknown), (unknown), Stefan Petzold, Nico Kaiser, G. Bourgeois, M. C. Cyrille, Lambert Alff, C. Trautmann, C. Vallée, (unknown), (unknown), G. Navarro, E. Nowak	0
6	Liquid Silicon: A Nonvolatile Fully Programmable Processing-in-Memory Processor With Monolithically Integrated ReRAM 2020 ·IEEE Journal of Solid-State Circuits ·(unknown), E. Nowak, Jing Li	22
7	Switching Event Detection and Self-Termination Programming Circuit for Energy Efficient ReRAM Memory Arrays 2019 ·IEEE Transactions on Circuits & Systems II Express Briefs ·(unknown), (unknown), Alexandre Levisse, (unknown), Mathieu Moreau, E. Nowak, G. Molas, Elisa Vianello, Jean‐Michel Portal	10
8	In-depth Characterization of Resistive Memory-Based Ternary Content Addressable Memories 2018 ·HAL (Le Centre pour la Communication Scientifique Directe) ·(unknown), Bastien Giraud, (unknown), Alessandro Grossi, N. Castellani, Gilbert Sassine, J. F. Nodin, G. Molas, C. Fenouillet-Béranger, Giacomo Indiveri, E. Nowak, Elisa Vianello	17
9	Experimental demonstration of short and long term synaptic plasticity using OxRAM multi k-bit arrays for reliable detection in highly noisy input data 2016 ·IEEE Conference Proceedings ·(unknown), Elisa Vianello, Olivier Bichler, Alessandro Grossi, E. Nowak, (unknown), Blaise Yvert, B. DeSalvo, L. Perniola	1
10	Experimental analysis and modeling of self heating effect in dielectric isolated planar and fin devices 2013 ·Symposium on VLSI Technology ·(unknown), R. Wachnik, (unknown), L. Wagner, J. Johnson, A. Chou, Arvind Kumar, Tosihide H. YOSIDA, T. Standaert, B. Greene, T. Yamashita, Karthik Balakrishnan, H. Bu, S. Springer, G. Freeman, W.K. Henson, E. Nowak	30
11	Predicting the SOI History Effect Using Compact Models 2004 ·TechConnect Briefs ·William F. Clark, (unknown), E. Nowak, Josef Watts, (unknown)	3
12	The effective drive current in CMOS inverters 2003 ·(unknown), E. Nowak, Wilfried Haensch, J. Cai	198
13	Critical reliability challenges in scaling SiO2-based dielectric to its limit 2003 ·Microelectronics Reliability ·Ernest Y. Wu, J. Suñé, W. Lai, A. Vayshenker, E. Nowak, D. Harmon	25
14	Pozyskiwanie metanu metodami wiertniczymi z wyrobisk podziemnych i z powierzchni w kopalniach Jastrzębskiej Spółki Węglowej SA 1999 ·Wiadomości Górnicze ·(unknown), E. Nowak	0
15	A CMOS Technology for a Sub-5-ns 3.3-V LVTTL 1-Mbit SRAM 1995 ·European Solid-State Device Research Conference ·Terence B. Hook, (unknown), K. Watson, E. Nowak	9
16	Heat capacity of Ag₆Ge₁₀p₁₂ from 180 to 550 K 1988 ·Crystal Research and Technology ·E. Nowak, H. Neumann, M. S. Omar	2
17	Analysis and Solution of a Yield-Limiting Patterned-Fail Mechanism in a 1 Mbit DRAM 1987 ·Symposium on VLSI Technology ·E. Nowak, (unknown)	4
18	Influence of substrate orientation on the electrical properties of CuInSe₂ epitaxial layers on GaAs substrates 1983 ·Crystal Research and Technology ·H. Neumann, E. Nowak	3
19	Impurity States in CuInSe₂ 1981 ·Kristall und Technik ·H. Neumann, E. Nowak, G. Kühn	72
20	Structural and electrical properties of CuInSe2 epitaxial layers prepared by single-source evaporation 1980 ·Thin Solid Films ·H. Neumann, E. Nowak, B. Schümann, G. Kühn	33

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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