Philippe C. Adell

1.6k citations

64 papers · 1.2k indexed · h-index 22

Impact in

Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
Electrical and Electronic Engineering top 5%
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Low-power high-performance VLSI design
- Advanced Memory and Neural Computing
- Electrostatic Discharge in Electronics

Papers in

Hardware and Architecture 12
- VLSI and Analog Circuit Testing 11
Electrical and Electronic Engineering 62
- Radiation Effects in Electronics 47
- Semiconductor materials and devices 31
- Advancements in Semiconductor Devices and Circuit Design 21
- Low-power high-performance VLSI design 11
- Integrated Circuits and Semiconductor Failure Analysis 11
- Advanced DC-DC Converters 5

Co-authors: Hugh Barnaby Ronald D. Schrimpf R.L. Pease Bert Vermeire Leif Scheick B.G. Rax Ivan Sanchez Esqueda Gregory R. Allen
Journals: IEEE Transactions on Nuclear Science (39 papers)Microelectronics Reliability (2 papers)IEEE Transactions on Aerospace and Electronic Systems (1 paper)IEEE Journal of Solid-State Circuits (1 paper)Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms (1 paper)
Partner nations: United States France Australia

In The Last Decade

Philippe C. Adell

63 papers receiving 1.2k citations

Peers

Countries citing papers authored by Philippe C. Adell

Since Specialization

Citations

This map shows the geographic impact of Philippe C. Adell's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Philippe C. Adell with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Philippe C. Adell more than expected).

Fields of papers citing papers by Philippe C. Adell

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Philippe C. Adell. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Philippe C. Adell. The network helps show where Philippe C. Adell may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Philippe C. Adell, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Philippe C. Adell Line = papers co-authored together Philippe C. Adell links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Integrated Science and Engineering Simulation Environment for Formation Flying Mission around Small Body Saptarshi Bandyopadhyay, Rashied Amini, Robert R. Miller, Shyam Bhaskaran, Rodney L. Anderson, Talat Altaf, Mark Haynes, Philippe C. Adell, C. A. Raymond, Lorraine Fesq	2023	0
2	A System-Level Modeling Approach for Simulating Radiation Effects in Successive-Approximation Analog-to-Digital Converters IEEE Transactions on Nuclear Science ·X. Y. Wang, En Xia Zhang, L Enkema, K. Li, 加藤雅子, B.G. Rax, Philippe C. Adell, J. S. Kauppila, Gábor Karsai, Nathaniel Irvin, Robert A. Reed, Arthur F. Witulski, Ronald D. Schrimpf	2021	1
3	Temperature Response on NPN and PNP Bipolar Junction Transistors after Total Ionizing Dose Irradiation Exposure Nazi̇f Kürkçüoǧlu, Hugh Barnaby, Rafaela Brinn, 太田靖子, Philippe C. Adell	2019	2
4	Radiation-Tolerant Digital Multiphase Current-Mode Hysteretic Point-of-Load Regulator IEEE Transactions on Nuclear Science ·Philippe C. Adell, Raza Syed Irfan, Yoshiharu Mori, Gregory R. Allen, Justin Feintuch, Bertan Bakkaloğlu	2018	4
5	Improved Model for Excess Base Current in Irradiated Lateral p-n-p Bipolar Junction Transistors IEEE Transactions on Nuclear Science ·Rafaela Brinn, Philippe C. Adell, B.G. Rax, Hugh Barnaby, Nazi̇f Kürkçüoǧlu, Xiaowen Han, Yufeng Wang, Wing TY Loo	2018	16
6	2015 Compendium of Recent Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory's Radiation Effects Group Gregory R. Allen, Leif Scheick, Farokh Irom, Steven M. Guertin, Philippe C. Adell, Md Miraj Arefin, Kelly L. Davies, Michael D. O’Connor	2015	17
7	Radiation Hardening of an SiGe BiCMOS Wilkinson ADC for Distributed Motor Controller Application IEEE Transactions on Nuclear Science ·Philippe C. Adell, Douglas N. Hertz, Akpofure-Okenrentie Carole Ejomafuvwe, Maria E. C. Leal, Mohammad Mojarradi, Benjamin J. Blalock, 喜代子松尾, Raphael Some	2014	6
8	Field Dependence of Charge Yield in Silicon Dioxide IEEE Transactions on Nuclear Science ·A.H. Johnston, R. T. Swimm, Dominique Mazéas, Philippe C. Adell, B.G. Rax	2014	16
9	Radiation Effects in Power Systems: A Review IEEE Transactions on Nuclear Science ·Philippe C. Adell, Leif Scheick	2013	52
10	Impact of Low Temperatures $({< 125}~{\rm K})$ on the Total Ionizing Dose Response and ELDRS in Gated Lateral PNP BJTs IEEE Transactions on Nuclear Science ·Philippe C. Adell, Ivan Sanchez Esqueda, Hugh Barnaby, B.G. Rax, Allan H. Johnston	2012	11
11	Single-Event Transient Testing of Low Dropout PNP Series Linear Voltage Regulators IEEE Transactions on Nuclear Science ·Gregory R. Allen, Philippe C. Adell, Dakai Chen, Hromova H.M.	2012	17
12	Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL IEEE Transactions on Nuclear Science ·S. Büchner, Nicolas J.-H. Roche, Jeffrey H. Warner, Dale McMorrow, F. Miller, Øystein Kalsnes Jørstad, V. Pouget, Camille Larue, V. Ferlet-Cavrois, Csordas Je, T R Artemisinin, Philippe C. Adell, Gregory R. Allen, David C. Aveline	2012	42
13	Modeling the effects of hydrogen on the mechanisms of dose rate sensitivity Ivan Sanchez Esqueda, Hugh Barnaby, Philippe C. Adell	2011	16
14	Modeling the Radiation Response of Fully-Depleted SOI n-Channel MOSFETs IEEE Transactions on Nuclear Science ·Ivan Sanchez Esqueda, Hugh Barnaby, Michael Lee McLain, Philippe C. Adell, Csordas Je, S. K. Dixit, Ronald D. Schrimpf, Wenjing Xiong	2009	31
15	Temperature Dependence of Spatially Resolved Picosecond Laser Induced Transients in a Deep Submicron CMOS Inverter IEEE Transactions on Nuclear Science ·Jamie S. Laird, J. E. Nestler, Aljo�a Dupli�, Larry D. Edmonds, Leif Scheick, Philippe C. Adell	2009	8
16	Total Dose and Single Event Transients in Linear Voltage Regulators HAL (Le Centre pour la Communication Scientifique Directe) ·Jaqueline Modaelli, Philippe C. Adell, 達也中村, W.T. Holman, Ronald D. Schrimpf, Lương Đức Long	2005	1
17	Towards a single event transient hardness assurance methodology R. Marec, C. Chatry, Philippe C. Adell, Jason S. Kimkno, C. Barillot, P. Calvel, Sebastian Sippel	2005	6
18	System-level design hardening based on worst-case ASET Simulations IEEE Transactions on Nuclear Science ·Y. Boulghassoul, Philippe C. Adell, 孝宏伊東, L. W. Massengill, Ronald D. Schrimpf, Andrew L. Sternberg	2004	27
19	Total dose effects in a linear Voltage regulator IEEE Transactions on Nuclear Science ·Philippe C. Adell, Ronald D. Schrimpf, W.T. Holman, Э З Фидаров, MT Thompson, K. Cenzual, K.F. Galloway	2004	37
20	Single event transient effects in a voltage reference Microelectronics Reliability ·Philippe C. Adell, Ronald D. Schrimpf, C.R. Cirba, W.T. Holman, Xiao‐Wei Zhu, Hugh Barnaby, Jason S. Kimkno	2004	11

About Philippe C. Adell

Philippe C. Adell is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Automotive Engineering, Radiation and Bioengineering, having authored 64 papers that have together received 1.2k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (47 papers), Semiconductor materials and devices (31 papers), Advancements in Semiconductor Devices and Circuit Design (21 papers), VLSI and Analog Circuit Testing (11 papers), Low-power high-performance VLSI design (11 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Advanced Battery Technologies Research (7 papers) and Advanced DC-DC Converters (5 papers). The work is most often cited by research in Hardware and Architecture (199 citations), Electrical and Electronic Engineering (1.2k citations), Automotive Engineering (63 citations), Radiation (42 citations) and Safety, Risk, Reliability and Quality (24 citations). Philippe C. Adell has collaborated with scholars based in United States, France and Australia. Frequent co-authors include Hugh Barnaby, Ronald D. Schrimpf, R.L. Pease, Bert Vermeire, Leif Scheick, B.G. Rax, Ivan Sanchez Esqueda, Gregory R. Allen, Keith E. Holbert and W.T. Holman. Their work appears in journals such as IEEE Transactions on Nuclear Science, Microelectronics Reliability, IEEE Transactions on Aerospace and Electronic Systems, IEEE Journal of Solid-State Circuits and Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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