M. Raine

5.5k total citations
71 papers, 1.2k citations indexed

About

M. Raine is a scholar working on Electrical and Electronic Engineering, Radiation and Surfaces, Coatings and Films. According to data from OpenAlex, M. Raine has authored 71 papers receiving a total of 1.2k indexed citations (citations by other indexed papers that have themselves been cited), including 58 papers in Electrical and Electronic Engineering, 16 papers in Radiation and 14 papers in Surfaces, Coatings and Films. Recurrent topics in M. Raine's work include Semiconductor materials and devices (32 papers), Radiation Effects in Electronics (31 papers) and Advancements in Semiconductor Devices and Circuit Design (21 papers). M. Raine is often cited by papers focused on Semiconductor materials and devices (32 papers), Radiation Effects in Electronics (31 papers) and Advancements in Semiconductor Devices and Circuit Design (21 papers). M. Raine collaborates with scholars based in France, United States and Slovenia. M. Raine's co-authors include Marc Gaillardin, Philippe Paillet, N. Richard, Olivier Duhamel, A. Valentin, Sylvain Girard, Vincent Goiffon, M. Martinez, G. Hubert and L. Artola and has published in prestigious journals such as Journal of Applied Physics, Optics Express and Applied Surface Science.

In The Last Decade

M. Raine

69 papers receiving 1.1k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. Raine France 22 1.0k 172 115 100 82 71 1.2k
F.J. Zutavern United States 18 851 0.8× 58 0.3× 24 0.2× 76 0.8× 60 0.7× 104 1.1k
Marco Van Uffelen Belgium 15 889 0.9× 77 0.4× 5 0.0× 8 0.1× 56 0.7× 84 1.1k
D. J. Bartelink United States 15 594 0.6× 10 0.1× 53 0.5× 30 0.3× 25 0.3× 43 726
J.M. Palau France 24 1.6k 1.6× 99 0.6× 63 0.5× 451 4.5× 72 0.9× 79 1.7k
Paul Denham United States 15 406 0.4× 188 1.1× 209 1.8× 5 0.1× 16 0.2× 46 586
M. Chernyshova Poland 19 321 0.3× 549 3.2× 44 0.4× 58 0.6× 836 10.2× 140 1.2k
Bryan J. Rice United States 15 420 0.4× 49 0.3× 177 1.5× 11 0.1× 166 2.0× 59 701
C. D. Macchietto United States 6 244 0.2× 79 0.5× 21 0.2× 49 0.5× 208 2.5× 9 483
Olivier Duhamel France 18 808 0.8× 153 0.9× 1 0.0× 159 1.6× 31 0.4× 62 945
Stefan Brünner Germany 13 142 0.1× 352 2.0× 8 0.1× 4 0.0× 61 0.7× 36 613

Countries citing papers authored by M. Raine

Since Specialization
Citations

This map shows the geographic impact of M. Raine's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Raine with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Raine more than expected).

Fields of papers citing papers by M. Raine

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Raine. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Raine. The network helps show where M. Raine may publish in the future.

Co-authorship network of co-authors of M. Raine

This figure shows the co-authorship network connecting the top 25 collaborators of M. Raine. A scholar is included among the top collaborators of M. Raine based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Raine. M. Raine is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Inguimbert, C., et al.. (2023). Experimental and Monte-Carlo study of double-hump electron emission yield curves of SiO2 thin films. Journal of Applied Physics. 133(13). 1 indexed citations
2.
Lambert, Damien, N. Richard, M. Raine, et al.. (2023). Neutron Displacement Damage Cross Section in GaN: Numerical Evaluations and Differences With Si. IEEE Transactions on Nuclear Science. 70(8). 1870–1877. 5 indexed citations
3.
Giacomazzi, Luigi, A. Alessi, Layla Martin‐Samos, et al.. (2022). O2 Loaded Germanosilicate Optical Fibers: Experimental In Situ Investigation and Ab Initio Simulation Study of GLPC Evolution under Irradiation. Applied Sciences. 12(8). 3916–3916. 1 indexed citations
4.
5.
Reghioua, I., Mattia Fanetti, Sylvain Girard, et al.. (2019). Study of silica-based intrinsically emitting nanoparticles produced by an excimer laser. Beilstein Journal of Nanotechnology. 10. 211–221. 2 indexed citations
6.
Gaillardin, Marc, M. Raine, M. Martinez, et al.. (2019). Analysis of Nanowire Field-Effect Transistors SET Response: Geometrical Considerations. IEEE Transactions on Nuclear Science. 66(7). 1410–1417. 3 indexed citations
7.
Inguimbert, C., et al.. (2018). Effect of rectangular grooves and checkerboard patterns on the electron emission yield. Journal of Applied Physics. 124(9). 9 indexed citations
8.
Inguimbert, C., et al.. (2017). Ionizing Doses Calculations for Low Energy Electrons in Silicon and Aluminum. IEEE Transactions on Nuclear Science. 1–1. 5 indexed citations
9.
Inguimbert, C., et al.. (2017). Electron emission yield for low energy electrons: Monte Carlo simulation and experimental comparison for Al, Ag, and Si. Journal of Applied Physics. 121(21). 24 indexed citations
10.
Gaillardin, Marc, C. Marcandella, M. Martinez, et al.. (2017). Total ionizing dose effects in multiple-gate field-effect transistor. Semiconductor Science and Technology. 32(8). 83003–83003. 14 indexed citations
11.
Raine, M., et al.. (2017). Estimation of the Single-Event Upset Sensitivity of Advanced SOI SRAMs. IEEE Transactions on Nuclear Science. 65(1). 339–345. 16 indexed citations
12.
Goiffon, Vincent, Cédric Virmontois, Philippe Paillet, et al.. (2016). Dark Current Spectroscopy in Neutron, Proton and Ion Irradiated CMOS Image Sensors: From Point Defects to Clusters. IEEE Transactions on Nuclear Science. 64(1). 27–37. 24 indexed citations
13.
Reghioua, I., Sylvain Girard, M. Raine, et al.. (2016). Cathodoluminescence Characterization of Point Defects in Optical Fibers. IEEE Transactions on Nuclear Science. 1–1. 12 indexed citations
14.
Gaillardin, Marc, M. Martinez, Philippe Paillet, et al.. (2014). Total Ionizing Dose Effects Mitigation Strategy for Nanoscaled FDSOI Technologies. IEEE Transactions on Nuclear Science. 61(6). 3023–3029. 35 indexed citations
15.
Raine, M., Marc Gaillardin, Philippe Paillet, & Olivier Duhamel. (2014). Towards a Generic Representation of Heavy Ion Tracks to be Used in Engineering SEE Simulation Tools. IEEE Transactions on Nuclear Science. 61(4). 1791–1798. 8 indexed citations
16.
Rousseau, Antoine, Philippe Paillet, Stéphane Girard, et al.. (2013). Nuclear background effects on plasma diagnostics for megajoule class laser facility. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8850. 885004–885004. 3 indexed citations
17.
Valentin, A., M. Raine, Marc Gaillardin, & Philippe Paillet. (2012). Geant4 physics processes for microdosimetry simulation: Very low energy electromagnetic models for protons and heavy ions in silicon. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 287. 124–129. 33 indexed citations
18.
Valentin, A., M. Raine, J. E. Sauvestre, Marc Gaillardin, & Philippe Paillet. (2012). Geant4 physics processes for microdosimetry simulation: Very low energy electromagnetic models for electrons in silicon. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 288. 66–73. 42 indexed citations
19.
Raine, M., G. Hubert, Marc Gaillardin, et al.. (2011). Impact of the Radial Ionization Profile on SEE Prediction for SOI Transistors and SRAMs Beyond the 32-nm Technological Node. IEEE Transactions on Nuclear Science. 58(3). 840–847. 79 indexed citations
20.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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