M. Raine

5.5k citations
71 papers · 1.2k indexed · h-index 22

M. Raine

69 papers receiving 1.1k citations

Peers

M. Raine
Comparison fields: 5 of 46
  • Radiation 172
  • Electrical and Electronic Engineering 1.0k
  • Instrumentation 58
  • Surfaces, Coatings and Films 115
  • Hardware and Architecture 100
Replace F.J. Zutavern with:
F.J. Zutavern United States
Marco Van Uffelen Belgium
Olivier Duhamel France
D. J. Bartelink United States
Stefan Brünner Germany
Paul Denham United States
M. Ghigo Italy
Daniele Spiga Italy
O. Citterio Italy
Yurii P. Pershin Ukraine
M. Raine relative to F.J. Zutavern United States F.J. Zutavern's profile →
Citations per field
00.5×5.5×
F.J. Zutavern · 1×
Citations per year

Countries citing papers authored by M. Raine

Since Specialization
Citations

This map shows the geographic impact of M. Raine's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Raine with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Raine more than expected).

Fields of papers citing papers by M. Raine

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Raine. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Raine. The network helps show where M. Raine may publish in the future.

Co-authorship network

The 25 scholars most cited alongside M. Raine, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with M. Raine Line = papers co-authored together M. Raine links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20231
2 20235
3 20221
4 202010
5 20192
6 20193
7 20189
8 20175
9 201724
10 201714
11 201716
12 201624
13 201612
14 201435
15 20148
16 20133
17 201233
18 201242
19 201179
20 20092

About M. Raine

M. Raine is a scholar working on Surfaces, Coatings and Films, Radiation, Electrical and Electronic Engineering, Ceramics and Composites and Nuclear and High Energy Physics, having authored 71 papers that have together received 1.2k indexed citations. Recurring topics across this work include Semiconductor materials and devices (32 papers), Radiation Effects in Electronics (31 papers), Advancements in Semiconductor Devices and Circuit Design (21 papers), Integrated Circuits and Semiconductor Failure Analysis (18 papers), Electron and X-Ray Spectroscopy Techniques (14 papers), CCD and CMOS Imaging Sensors (9 papers), Radiation Detection and Scintillator Technologies (8 papers) and Ion-surface interactions and analysis (7 papers). The work is most often cited by research in Radiation (172 citations), Electrical and Electronic Engineering (1.0k citations), Instrumentation (58 citations), Surfaces, Coatings and Films (115 citations) and Hardware and Architecture (100 citations). M. Raine has collaborated with scholars based in France, United States and Slovenia. Frequent co-authors include Marc Gaillardin, Philippe Paillet, N. Richard, Olivier Duhamel, A. Valentin, Sylvain Girard, Vincent Goiffon, M. Martinez, G. Hubert and L. Artola. Their work appears in journals such as IEEE Transactions on Nuclear Science, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Journal of Applied Physics, Applied Surface Science and Optics Express.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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