F. Balestra
About
In The Last Decade
F. Balestra
196 papers receiving 3.5k citations
Hit Papers
Peers
Comparison fields: 5 of 63
- Electrical and Electronic Engineering 3.5k
- Biomedical Engineering 489
- Atomic and Molecular Physics, and Optics 384
- Materials Chemistry 366
- Polymers and Plastics 260
Countries citing papers authored by F. Balestra
This map shows the geographic impact of F. Balestra's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Balestra with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Balestra more than expected).
Fields of papers citing papers by F. Balestra
This network shows the impact of papers produced by F. Balestra. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Balestra. The network helps show where F. Balestra may publish in the future.
Co-authorship network of co-authors of F. Balestra
This figure shows the co-authorship network connecting the top 25 collaborators of F. Balestra. A scholar is included among the top collaborators of F. Balestra based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. Balestra. F. Balestra is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 1 | |
| 3 | 1 | |
| 4 | 2 | |
| 5 | 1 | |
| 6 | 16 | |
| 7 | 53 | |
| 8 | Low frequency noise and hot-carrier reliability in advanced SOI MOSFETs | 12 |
| 9 | 9 | |
| 10 | 16 | |
| 11 | New Lifetime Prediction Method Based on the Control of the Secondary Impact Ionization with the Substrate Bias | 4 |
| 12 | 0 | |
| 13 | 5 | |
| 14 | 1 | |
| 15 | 2 | |
| 16 | Hot-Carrier Effects in Single- and Double-Gate Thin-Film SOI MOSFETs | 1 |
| 17 | 3 | |
| 18 | Low-Frequency Noise Sources in Polysilicon Emiter Bipolar Transistors: Influence of Hot-Electron-Induced Degradation and Post-Stress Recovery | 2 |
| 19 | Low-Frequency Noise in SOI MOSFETs from Room to Liquid Helium Temperature: Experimental and Numerical Simulation Results | 2 |
| 20 | Volume Inversion in SOI MOSFETs with Double Gate Control: A New Transistor Operation with Greatly Enhanced Performance | 1 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.