F. Monsieur

1.9k citations
56 papers · 936 indexed · 1 hit paper · h-index 12

F. Monsieur

51 papers receiving 897 citations

Hit Papers

Review on high-k dielectrics reliability issues4162005202620122019100200300400

Peers

F. Monsieur
Comparison fields: 5 of 38
  • Electrical and Electronic Engineering 906
  • Electronic, Optical and Magnetic Materials 51
  • Materials Chemistry 113
  • Hardware and Architecture 16
  • Atomic and Molecular Physics, and Optics 67
Replace M. Aoulaiche with:
M. Aoulaiche Belgium
J.-L. Ogier France
M. Denais France
T. Nigam United States
Ben Kaczer Belgium
Jeff J. Peterson United States
F. Arnaud France
I.C. Chen United States
M. Togo Japan
E. Dentoni Litta Belgium
F. Monsieur relative to M. Aoulaiche Belgium M. Aoulaiche's profile →
Citations per field
00.5×1.6×
M. Aoulaiche · 1×
Citations per year

Countries citing papers authored by F. Monsieur

Since Specialization
Citations

This map shows the geographic impact of F. Monsieur's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Monsieur with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Monsieur more than expected).

Fields of papers citing papers by F. Monsieur

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. Monsieur. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Monsieur. The network helps show where F. Monsieur may publish in the future.

Co-authorship network

The 25 scholars most cited alongside F. Monsieur, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with F. Monsieur Line = papers co-authored together F. Monsieur links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20181
2 20164
3 20140
4 20141
5
First demonstration of a full 28nm high-k/metal gate circuit transfer from Bulk to UTBB FDSOI technology through hybrid integration
201322
6 20112
7 20105
8 200919
9 20081
10 20081
11 20080
12 20040
13 20044
14 20038
15 20031
16 20032
17 20022
18 200110
19 20017
20 200015

About F. Monsieur

F. Monsieur is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Atomic and Molecular Physics, and Optics, having authored 56 papers that have together received 936 indexed citations. Recurring topics across this work include Semiconductor materials and devices (48 papers), Advancements in Semiconductor Devices and Circuit Design (42 papers), Integrated Circuits and Semiconductor Failure Analysis (20 papers), Ferroelectric and Negative Capacitance Devices (7 papers), Silicon Carbide Semiconductor Technologies (7 papers), Electrostatic Discharge in Electronics (6 papers), Advanced Memory and Neural Computing (5 papers) and Thin-Film Transistor Technologies (5 papers). The work is most often cited by research in Electrical and Electronic Engineering (906 citations), Electronic, Optical and Magnetic Materials (51 citations) and Materials Chemistry (113 citations). F. Monsieur has collaborated with scholars based in France, Switzerland and United States. Frequent co-authors include S. Bruyère, G. Ribes, G. Ghibaudo, Emmanuel Vincent, M. Denais, C. Parthasarathy, Jérôme Mitard, D. Roy, V. Huard and G. Pananakakis. Their work appears in journals such as Physical Review Letters, IEEE Transactions on Electron Devices and IEEE Electron Device Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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