M. Rafik
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- Semiconductor materials and devices 52
- Advancements in Semiconductor Devices and Circuit Design 44
- Integrated Circuits and Semiconductor Failure Analysis 32
- Ferroelectric and Negative Capacitance Devices 5
- Silicon Carbide Semiconductor Technologies 4
- Electrostatic Discharge in Electronics 3
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- VLSI and Analog Circuit Testing 2
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- Copper Interconnects and Reliability 4
- Cited by
- Electrical and Electronic EngineeringHardware and ArchitectureElectronic, Optical and Magnetic Materials
- Journals
- Microelectronics Reliability (5 papers)Microelectronic Engineering (4 papers)IEEE Transactions on Device and Materials Reliability (3 papers)
- Partner nations
- FranceSwitzerlandIndia
In The Last Decade
M. Rafik
49 papers receiving 334 citations
Peers
Comparison fields: 5 of 18
- Electrical and Electronic Engineering 345
- Hardware and Architecture 14
- Electronic, Optical and Magnetic Materials 21
- Instrumentation 3
- Atomic and Molecular Physics, and Optics 16
Countries citing papers authored by M. Rafik
This map shows the geographic impact of M. Rafik's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Rafik with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Rafik more than expected).
Fields of papers citing papers by M. Rafik
This network shows the impact of papers produced by M. Rafik. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Rafik. The network helps show where M. Rafik may publish in the future.
Co-authorship network
The 25 scholars most cited alongside M. Rafik, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2022 | 6 | |
| 2 | 2019 | 11 | |
| 3 | 2019 | 1 | |
| 4 | 2019 | 2 | |
| 5 | 2018 | 9 | |
| 6 | 2018 | 17 | |
| 7 | 2018 | 1 | |
| 8 | 2018 | 2 | |
| 9 | 2016 | 12 | |
| 10 | 2016 | 0 | |
| 11 | 2014 | 0 | |
| 12 | 2013 | 11 | |
| 13 | 2011 | 8 | |
| 14 | 2010 | 21 | |
| 15 | 2009 | 8 | |
| 16 | 2009 | 13 | |
| 17 | 2008 | 3 | |
| 18 | 2008 | 4 | |
| 19 | 2007 | 16 | |
| 20 | 2007 | 15 |
About M. Rafik
M. Rafik is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Electronic, Optical and Magnetic Materials, Mechanics of Materials and Materials Chemistry, having authored 52 papers that have together received 347 indexed citations. Recurring topics across this work include Semiconductor materials and devices (52 papers), Advancements in Semiconductor Devices and Circuit Design (44 papers), Integrated Circuits and Semiconductor Failure Analysis (32 papers), Ferroelectric and Negative Capacitance Devices (5 papers), Copper Interconnects and Reliability (4 papers), Silicon Carbide Semiconductor Technologies (4 papers), Electrostatic Discharge in Electronics (3 papers) and VLSI and Analog Circuit Testing (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (345 citations), Hardware and Architecture (14 citations), Electronic, Optical and Magnetic Materials (21 citations), Instrumentation (3 citations) and Atomic and Molecular Physics, and Optics (16 citations). M. Rafik has collaborated with scholars based in France, Switzerland and India. Frequent co-authors include D. Roy, X. Federspiel, G. Ribes, X. Garros, V. Huard, F. Cacho, A. Bravaix, G. Ghibaudo, G. Reimbold and D. Rideau. Their work appears in journals such as Microelectronics Reliability, Microelectronic Engineering, IEEE Transactions on Device and Materials Reliability, IEEE Electron Device Letters and ECS Transactions.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.