G. Ribes
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- Semiconductor materials and devices 48
- Advancements in Semiconductor Devices and Circuit Design 37
- Integrated Circuits and Semiconductor Failure Analysis 26
- Ferroelectric and Negative Capacitance Devices 3
- Advanced Memory and Neural Computing 3
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- Copper Interconnects and Reliability 7
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- Electronic and Structural Properties of Oxides 6
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- Semiconductor materials and interfaces 3
- Co-authors
- M. DenaisS. BruyèreC. ParthasarathyF. MonsieurG. GhibaudoEmmanuel VincentV. HuardJérôme Mitard
- Cited by
- Electrical and Electronic EngineeringHardware and ArchitectureElectronic, Optical and Magnetic Materials
- Journals
- Microelectronics Reliability (3 papers)IEEE Transactions on Device and Materials Reliability (3 papers)Microelectronic Engineering (2 papers)
- Partner nations
- FranceIndiaUnited States
In The Last Decade
G. Ribes
46 papers receiving 887 citations
Hit Papers
Peers
Comparison fields: 5 of 33
- Electrical and Electronic Engineering 924
- Hardware and Architecture 22
- Electronic, Optical and Magnetic Materials 55
- Materials Chemistry 121
- Atomic and Molecular Physics, and Optics 54
Countries citing papers authored by G. Ribes
This map shows the geographic impact of G. Ribes's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. Ribes with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. Ribes more than expected).
Fields of papers citing papers by G. Ribes
This network shows the impact of papers produced by G. Ribes. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. Ribes. The network helps show where G. Ribes may publish in the future.
Co-authorship network
The 25 scholars most cited alongside G. Ribes, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2009 | 13 | |
| 2 | 2008 | 3 | |
| 3 | 2008 | 4 | |
| 4 | 2007 | 16 | |
| 5 | 2007 | 15 | |
| 6 | 2007 | 9 | |
| 7 | 2006 | 22 | |
| 8 | 2006 | 0 | |
| 9 | 2006 | 6 | |
| 10 | 2005 | 15 | |
| 11 | 2005 | 7 | |
| 12 | 2005 | 7 | |
| 13 | 2005 | 9 | |
| 14 | 2005 | 6 | |
| 15 | 2005 | 0 | |
| 16 | 2004 | 4 | |
| 17 | 2004 | 9 | |
| 18 | 2004 | 10 | |
| 19 | 2003 | 8 | |
| 20 | 2003 | 1 |
About G. Ribes
G. Ribes is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Materials Chemistry and Mechanics of Materials, having authored 49 papers that have together received 940 indexed citations. Recurring topics across this work include Semiconductor materials and devices (48 papers), Advancements in Semiconductor Devices and Circuit Design (37 papers), Integrated Circuits and Semiconductor Failure Analysis (26 papers), Copper Interconnects and Reliability (7 papers), Electronic and Structural Properties of Oxides (6 papers), Semiconductor materials and interfaces (3 papers), Ferroelectric and Negative Capacitance Devices (3 papers) and Advanced Memory and Neural Computing (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (924 citations), Hardware and Architecture (22 citations), Electronic, Optical and Magnetic Materials (55 citations), Materials Chemistry (121 citations) and Atomic and Molecular Physics, and Optics (54 citations). G. Ribes has collaborated with scholars based in France, India and United States. Frequent co-authors include M. Denais, S. Bruyère, C. Parthasarathy, F. Monsieur, G. Ghibaudo, Emmanuel Vincent, V. Huard, Jérôme Mitard, A. Bravaix and F. Perrier. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability, Microelectronic Engineering and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.