E. Cartier

12.1k total citations · 3 hit papers
194 papers, 9.5k citations indexed

About

E. Cartier is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Surfaces, Coatings and Films. According to data from OpenAlex, E. Cartier has authored 194 papers receiving a total of 9.5k indexed citations (citations by other indexed papers that have themselves been cited), including 182 papers in Electrical and Electronic Engineering, 32 papers in Materials Chemistry and 23 papers in Surfaces, Coatings and Films. Recurrent topics in E. Cartier's work include Semiconductor materials and devices (171 papers), Advancements in Semiconductor Devices and Circuit Design (107 papers) and Integrated Circuits and Semiconductor Failure Analysis (72 papers). E. Cartier is often cited by papers focused on Semiconductor materials and devices (171 papers), Advancements in Semiconductor Devices and Circuit Design (107 papers) and Integrated Circuits and Semiconductor Failure Analysis (72 papers). E. Cartier collaborates with scholars based in United States, Belgium and Switzerland. E. Cartier's co-authors include D. J. DiMaria, D. Arnold, A. Kerber, J. H. Stathis, D. A. Buchanan, M. Copel, Massimo V. Fischetti, M. Gribelyuk, D. Neumayer and Deborah A. Neumayer and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

E. Cartier

193 papers receiving 9.1k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Impact ionization, trap creation, degradation, and breakdown in silicon dioxide films on silicon

1993 589 citations E. Cartier et al. profile →
Effective electron mobility in Si inversion layers in metal–oxide–semiconductor systems with a high-κ insulator: The role of remote phonon scattering

2001 574 citations Massimo V. Fischetti, E. Cartier et al. profile →
Mechanism for stress-induced leakage currents in thin silicon dioxide films

1995 445 citations E. Cartier et al. profile →

Peers

Countries citing papers authored by E. Cartier

Since Specialization

Citations

This map shows the geographic impact of E. Cartier's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Cartier with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Cartier more than expected).

Fields of papers citing papers by E. Cartier

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. Cartier. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Cartier. The network helps show where E. Cartier may publish in the future.

Co-authorship network of co-authors of E. Cartier

This figure shows the co-authorship network connecting the top 25 collaborators of E. Cartier. A scholar is included among the top collaborators of E. Cartier based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with E. Cartier. E. Cartier is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work	Indexed citations
1	Crystallization of hafnium-oxide-based ferroelectrics for BEOL integration 2022 ·Martin M. Frank, E. Cartier, C. Lavoie, Adra Carr, Jean Jordan‐Sweet, P. Jamison, Oleg Gluschenkov, John Rozen, Vijay Narayanan	3
2	Identification of structural phases in ferroelectric hafnium zirconium oxide by density-functional-theory-assisted EXAFS analysis 2021 ·Applied Physics Letters ·(unknown), (unknown), (unknown), (unknown), Stephen P. Kelty, Bruce Ravel, J. C. Woicik, (unknown), Kristin Schmidt, E. Cartier, Jean Jordan‐Sweet, C. Lavoie, Martin M. Frank	10
3	Process-Induced ReRAM Performance Improvement of Atomic Layer Deposited HfO₂ for Analog In-Memory Computing Applications 2021 ·ECS Transactions ·Steven Consiglio, Hisashi Higuchi, Takashi Ando, P. Jamison, Soon‐Cheon Seo, Dexin Kong, Young‐Seok Kim, Kandabara Tapily, Robert D. Clark, Marinus Hopstaken, E. Cartier, Takaaki Tsunomura, Cory S. Wajda, (unknown), Vijay Narayanan, Gert J. Leusink	2
4	Resistive Random Access Memory Filament Visualization and Characterization Using Photon Emission Microscopy 2021 ·IEEE Electron Device Letters ·Franco Stellari, Ernest Y. Wu, Takashi Ando, E. Cartier, Martin M. Frank, C. Cabral, Peilin Song, Dirk Pfeiffer	5
5	A maximum extreme-value distribution model for switching conductance of oxide-RRAM in memory applications 2020 ·Applied Physics Letters ·Ernest Y. Wu, Takashi Ando, Young‐Seok Kim, R. Muralidhar, E. Cartier, P. Jamison, Miaomiao Wang, Vijay Narayanan	4
6	Reliability Challenges with Materials for Analog Computing 2019 ·E. Cartier, Wanki Kim, Nanbo Gong, Tayfun Gokmen, Martin M. Frank, Douglas M. Bishop, Young‐Seok Kim, Seyoung Kim, Takashi Ando, Ernest Y. Wu, Praneet Adusumilli, John Rozen, P. M. Solomon, Wilfried Haensch, M. BrightSky, Abu Sebastian, Geoffrey W. Burr, Vijay Narayanan	11
7	PBTI in InGaAs MOS capacitors with Al<inf>2</inf>O<inf>3</inf>/HfO<inf>2</inf>/TiN gate stacks: Interface-state generation 2018 ·E. Cartier, Martin M. Frank, Takashi Ando, John Rozen, Vijay Narayanan	1
8	High Mobility High-Ge-Content SiGe PMOSFETs Using Al₂O₃/HfO₂ Stacks With <italic>In-Situ</italic> O₃ Treatment 2017 ·IEEE Electron Device Letters ·Takashi Ando, Pouya Hashemi, J. Bruley, John Rozen, (unknown), Siyuranga O. Koswatta, K. Chan, E. Cartier, (unknown), Vijay Narayanan	34
9	Electron mobility in thin In0.53Ga0.47As channel. 2017 ·European Solid-State Device Research Conference ·E. Cartier, A. Majumdar, (unknown), Takashi Ando, Martin M. Frank, John Rozen, K.A. Jenkins, (unknown), Chiyu Cheng, J. Bruley, Marinus Hopstaken, (unknown), Jeng-Bang Yau, (unknown), R. Mo, Chun-Chen Yeh, E. Leobandung, Vijay Narayanan	2
10	Characterization and optimization of charge trapping in high-k dielectrics 2013 ·E. Cartier, Takashi Ando, M. Hopstaken, Vijay Narayanan, R. Krishnan, J. Shepard, (unknown), Siddarth Krishnan, M. Chudzik, Sandip De, R. K. Pandey, Mohit Bajaj, K. V. R. M. Murali, A. Kerber	9
11	Switching of ferroelectric polarization in epitaxial BaTiO3 films on silicon without a conducting bottom electrode 2013 ·Nature Nanotechnology ·Catherine Dubourdieu, J. Bruley, Thomas M. Arruda, Agham Posadas, Jean Jordan‐Sweet, Martin M. Frank, E. Cartier, D.J. Frank, Sergei V. Kalinin, Alexander A. Demkov, Vijay Narayanan	224
12	Analysis of recoverable and non-recoverable NBTI and PBTI using AC and DC stresses 2011 ·F. Monsieur, E. Cartier, J. H. Stathis	2
13	Oxygen Transport in High-k Metal Gate Stacks and Physical Characterization by SIMS Using Isotopic Labeled Oxygen 2010 ·ECS Transactions ·Marinus Hopstaken, J. Bruley, Dirk Pfeiffer, M. Copel, Martin M. Frank, E. Cartier, Takashi Ando, Vijay Narayanan	6
14	Charge Trapping and Dielectric Reliability of SiO2/Al2O3 Gate Stacks with TiN Electrodes 2003 ·Microelectronic Engineering ·A. Kerber, E. Cartier, R. Degraeve, Philippe Roussel, L. Pantisano, T. Kauerauf, G. Groeseneken, H.E. Maes, Udo Schwalke	46
15	Interface studies of tungsten gate metal–oxide–silicon capacitors 2001 ·Applied Physics Letters ·Huiling Shang, Marvin H. White, K.W. Guarini, P. M. Solomon, E. Cartier, (unknown), J. Yurkas, Wen‐Chin Lee	21
16	Interface State Capture Cross Section Measurements on Vacuum Annealed and Radiation Damaged Si : SiO2 Surfaces 1998 ·Journal of The Electrochemical Society ·Michael J. Uren, (unknown), Kevin M. Brunson, (unknown), J. H. Stathis, E. Cartier	11
17	Atomic hydrogen-induced interface degradation of reoxidized-nitrided silicon dioxide on silicon 1994 ·Applied Physics Letters ·E. Cartier, D. A. Buchanan, G.J. Dunn	63
18	<title>Monte Carlo calculations of laser-induced free-electron heating in SiO<formula><inf><roman>2</roman></inf></formula></title> 1991 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), E. Cartier, Massimo V. Fischetti	1
19	Variable-energy positron studies of metallic glasses 1984 ·Physical review. B, Condensed matter ·A. Vehanen, K. G. Lynn, Peter J. Schultz, E. Cartier, H.‐J. Güntherodt, D.M. Parkin	41
20	Positron Annihilation in Graphite Intercalation Compounds 1981 ·Physical Review Letters ·E. Cartier, F. Heinrich, P. Pfluger, H.‐J. Güntherodt	36

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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