Gilles Gasiot
- Electrical and Electronic Engineering top 2%
- Hardware and Architecture top 1%
- Radiation top 5%
- Nuclear and High Energy Physics
- Computer Networks and Communications
- Co-authors
- P. RochePhilippe RochéD. GiotJean‐Luc AutranSławosz UznańskiDaniela MunteanuR. Harboe-SørensenSylvain Clerc
- Topics
- Radiation Effects in Electronics (75 papers)Integrated Circuits and Semiconductor Failure Analysis (44 papers)VLSI and Analog Circuit Testing (39 papers)
- Journals
- IEEE Transactions on Nuclear ScienceSemiconductor Science and TechnologyMicroelectronics Reliability
- Partner nations
- FranceNetherlandsSwitzerland
In The Last Decade
Gilles Gasiot
88 papers receiving 1.6k citations
Peers
Comparison fields: 5 of 35
- Electrical and Electronic Engineering 1.7k
- Hardware and Architecture 726
- Radiation 134
- Nuclear and High Energy Physics 68
- Computer Networks and Communications 54
Countries citing papers authored by Gilles Gasiot
This map shows the geographic impact of Gilles Gasiot's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Gilles Gasiot with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Gilles Gasiot more than expected).
Fields of papers citing papers by Gilles Gasiot
This network shows the impact of papers produced by Gilles Gasiot. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Gilles Gasiot. The network helps show where Gilles Gasiot may publish in the future.
Co-authorship network of co-authors of Gilles Gasiot
This figure shows the co-authorship network connecting the top 25 collaborators of Gilles Gasiot. A scholar is included among the top collaborators of Gilles Gasiot based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Gilles Gasiot. Gilles Gasiot is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 3 | |
| 3 | 9 | |
| 4 | 1 | |
| 5 | 0 | |
| 6 | 5 | |
| 7 | 7 | |
| 8 | 14 | |
| 9 | 3 | |
| 10 | 6 | |
| 11 | 7 | |
| 12 | 1 | |
| 13 | 2 | |
| 14 | 8 | |
| 15 | Heavy ions test result on a 65nm sparc-v8 radiation-hard microprocessor | 1 |
| 16 | 6 | |
| 17 | 5 | |
| 18 | 7 | |
| 19 | 21 | |
| 20 | 14 MeV Neutron-Induced SEU in SRAM Devices | 1 |
About Gilles Gasiot
Gilles Gasiot is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Instrumentation, having authored 89 papers that have together received 1.7k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (75 papers), Integrated Circuits and Semiconductor Failure Analysis (44 papers) and VLSI and Analog Circuit Testing (39 papers). The work is most often cited by research in Hardware and Architecture (726 citations), Electrical and Electronic Engineering (1.7k citations) and Radiation (134 citations). Gilles Gasiot has collaborated with scholars based in France, Netherlands and Switzerland. Frequent co-authors include P. Roche, Philippe Roché, D. Giot, Jean‐Luc Autran, Sławosz Uznański, Daniela Munteanu, R. Harboe-Sørensen, Sylvain Clerc, Ph. Roche and Maximilien Glorieux. Their work appears in journals such as IEEE Transactions on Nuclear Science, Semiconductor Science and Technology and Microelectronics Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.