P. Roche

1.7k citations

38 papers · 1.1k indexed · h-index 20

Impact in

Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
Electrical and Electronic Engineering top 5%
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Low-power high-performance VLSI design
- Advancements in Semiconductor Devices and Circuit Design

Papers in

Hardware and Architecture 14
- VLSI and Analog Circuit Testing 14
Electrical and Electronic Engineering 35
- Radiation Effects in Electronics 31
- Integrated Circuits and Semiconductor Failure Analysis 21
- Semiconductor materials and devices 15
- Advancements in Semiconductor Devices and Circuit Design 5
- Low-power high-performance VLSI design 3

Co-authors: Gilles Gasiot D. Giot Robbert Dijkgraaf Vincent Pasquier Tino Heijmen Daniela Munteanu Karim Noui Jean‐Luc Autran
Journals: IEEE Transactions on Nuclear Science (18 papers)Microelectronics Reliability (6 papers)Classical and Quantum Gravity (2 papers)IEEE Electron Device Letters (1 paper)Semiconductor Science and Technology (1 paper)
Partner nations: France India United States

In The Last Decade

P. Roche

38 papers receiving 1.0k citations

Peers

Countries citing papers authored by P. Roche

Since Specialization

Citations

This map shows the geographic impact of P. Roche's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Roche with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Roche more than expected).

Fields of papers citing papers by P. Roche

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. Roche. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Roche. The network helps show where P. Roche may publish in the future.

Co-authorship network

The 25 scholars most cited alongside P. Roche, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with P. Roche Line = papers co-authored together P. Roche links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Fusion Neutron-Induced Soft Errors During Long Pulse D–D Plasma Discharges in the WEST Tokamak IEEE Transactions on Nuclear Science ·Kevin Bloch, Daniela Munteanu, Jean‐Luc Autran, M. Dentan, P. Moreau, Jaime Ricardo Jimenez Salazar, Catherine Taussig, 裕千葉, D. Syamala Devi, Javier Gutiérrez González, Gilles Gasiot, P. Roche, Matteo Cecchetto, Rubén García Alía	2024	1
2	Real-Time Characterization of Neutron-Induced SEUs in Fusion Experiments at WEST Tokamak During D-D Plasma Operation IEEE Transactions on Nuclear Science ·Jean‐Luc Autran, Kevin Bloch, Daniela Munteanu, M. Dentan, P. Moreau, Francois Simenel, J. Bucalossi, A Djeha, D. Syamala Devi, Javier Gutiérrez González, Gilles Gasiot, P. Roche	2022	5
3	Analysis and Modeling of the Charge Collection Mechanism in 28-nm FD-SOI IEEE Transactions on Nuclear Science ·Guillaume Toucas, F. Vukovic Filip, Lisa-Ann Quandt, F. Monsieur, Gilles Gasiot, Dan Alexandrescu, P. Roche, Klara-Luisa Budau	2018	1
4	Multi-Poisson process analysis of real-time soft-error rate measurements in bulk 65 nm and 40 nm SRAMs Microelectronics Reliability ·Kevin Bloch, Jean‐Luc Autran, Daniela Munteanu, Gilles Gasiot, P. Roche	2017	2
5	Real-time soft error rate measurements on bulk 40 nm SRAM memories: a five-year dual-site experiment Semiconductor Science and Technology ·J.L. Autran, Daniela Munteanu, Kevin Bloch, И. К. Томилова, Gilles Gasiot, P. Roche	2016	2
6	ASTEP (2005–2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure Microelectronics Reliability ·Jean‐Luc Autran, Daniela Munteanu, Kevin Bloch, И. К. Томилова, E.A Alvarenga, Gilles Gasiot, P. Roche	2015	8
7	Design and performance parameters of an ultra-low voltage, single supply 32bit processor implemented in 28nm FDSOI technology HAL (Le Centre pour la Communication Scientifique Directe) ·Sylvain Clerc, Fady Abouzeid, Chih-Hao Tseng, C. Wang, R. W. Shorrock, L. Ciampolini, Jeanine Kippers, Daniel Meyer, Robin Wilson, P. Roche, S. Naudet, A. Virazel, Alberto Bosio, Patrick Girard	2015	5
8	Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits Microelectronics Reliability ·Jean‐Luc Autran, Maximilien Glorieux, Daniela Munteanu, Sylvain Clerc, Gilles Gasiot, P. Roche	2014	6
9	Geant4 Analysis of n-Si Nuclear Reactions From Different Sources of Neutrons and Its Implication on Soft-Error Rate IEEE Transactions on Nuclear Science ·کیومرٍث شهبازی, S. S. Semikh, Sławosz Uznański, Jean‐Luc Autran, Daniela Munteanu, Gilles Gasiot, P. Roche	2012	26
10	Process Variability Effect on Soft Error Rate by Characterization of Large Number of Samples IEEE Transactions on Nuclear Science ·Gilles Gasiot, Jay Litt, Maximilien Glorieux, Fady Abouzeid, Sylvain Clerc, P. Roche	2012	10
11	Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level Microelectronics Reliability ·Jean‐Luc Autran, Daniela Munteanu, P. Roche, Gilles Gasiot, S. Martinie, Sławosz Uznański, E.A Alvarenga, S. S. Semikh, E. Yakushev, S. Rozov, P. Loaiza, G. Warot, M. Zampaolo	2010	31
12	Can Atmospheric Neutrons Induce Soft Errors in nand Floating Gate Memories? IEEE Electron Device Letters ·G. Cellere, Simone Gerardin, Marta Bagatin, A. Paccagnella, A. Visconti, M. Bonanomi, Silvia Beltrami, R. Harboe-Sørensen, A. Virtanen, P. Roche	2009	7
13	Altitude and Underground Real-Time SER Characterization of CMOS 65 nm SRAM IEEE Transactions on Nuclear Science ·Jean‐Luc Autran, P. Roche, E.A Alvarenga, Gilles Gasiot, Daniela Munteanu, P. Loaiza, M. Zampaolo, R X Zeng	2009	47
14	Altitude and underground real-time SER characterization of CMOS 65nm SRAM J.L. Autran, P. Roche, E.A Alvarenga, Gilles Gasiot, Daniela Munteanu, P. Loaiza, M. Zampaolo, R X Zeng	2008	1
15	Multiple Cell Upsets as the Key Contribution to the Total SER of 65 nm CMOS SRAMs and Its Dependence on Well Engineering IEEE Transactions on Nuclear Science ·Gilles Gasiot, D. Giot, P. Roche	2007	117
16	Alpha-Induced Multiple Cell Upsets in Standard and Radiation Hardened SRAMs Manufactured in a 65 nm CMOS Technology IEEE Transactions on Nuclear Science ·Gilles Gasiot, D. Giot, P. Roche	2006	51
17	Factors That Impact the Critical Charge of Memory Elements Tino Heijmen, D. Giot, P. Roche	2006	110
18	Comparison of the sensitivity to heavy ions of 0.25-/spl mu/m bulk and SOI technologies IEEE Transactions on Nuclear Science ·Gilles Gasiot, V. Ferlet-Cavrois, P. Roche, Philippe Flatresse, Кациоппе Рон, O. Musseau, Juan Antonio Moliner	2002	30
19	Enhanced total dose damage in junction field effect transistors and related linear integrated circuits IEEE Transactions on Nuclear Science ·O. Flament, Jean‐Luc Autran, P. Roche, J.L. Leray, O. Musseau, R. Truche, I Balazsi	1996	18
20	A GaAs MESFET 16*16 crosspoint switch at 1700 Mbits/sec C.J. Anderson, J. H. Magerlein, Samuel E. Hall‐Sanchez, Stuart Bermon, Agnese Callegari, J. Feder, J. H. Greiner, Maurice M Patterson, H.J. Hovel, Andrew Pomerene, P. Roche, Merlin C. Thomas	1988	5

About P. Roche

P. Roche is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Radiation, Software and Geometry and Topology, having authored 38 papers that have together received 1.1k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (31 papers), Integrated Circuits and Semiconductor Failure Analysis (21 papers), Semiconductor materials and devices (15 papers), VLSI and Analog Circuit Testing (14 papers), Advancements in Semiconductor Devices and Circuit Design (5 papers), Radiation Detection and Scintillator Technologies (4 papers), Low-power high-performance VLSI design (3 papers) and Ion-surface interactions and analysis (2 papers). The work is most often cited by research in Hardware and Architecture (411 citations), Electrical and Electronic Engineering (863 citations), Geometry and Topology (106 citations), Algebra and Number Theory (55 citations) and Nuclear and High Energy Physics (129 citations). P. Roche has collaborated with scholars based in France, India and United States. Frequent co-authors include Gilles Gasiot, D. Giot, Robbert Dijkgraaf, Vincent Pasquier, Tino Heijmen, Daniela Munteanu, Karim Noui, Jean‐Luc Autran, J.M. Palau and B. Sagnes. Their work appears in journals such as IEEE Transactions on Nuclear Science, Microelectronics Reliability, Classical and Quantum Gravity, IEEE Electron Device Letters and Semiconductor Science and Technology.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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